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Polymer surfaces, interfaces and thin films

Abstract

Neutron reflectometry can be used in various ways to investigate surfaces, interfaces and thin films of polymers. Its potential comes mostly from the possibilities offered by selective deuteration, where a particular component can be made visible with respect to its activity at the interface. In addition the depth resolution is much better than with most other direct techniques, and details of the profiles may be resolved. Several examples will be discussed including the segment diffusion at the interface between two polymer films, the determination of the narrow interfaces between incompatible polymer blends and the development of order in thin diblock copolymer films. (author) 10 figs., 2 tabs., 38 refs.
Authors:
Stamm, M [1] 
  1. Max-Planck-Institut fuer Polymerforschung, Mainz (Germany)
Publication Date:
Nov 01, 1996
Product Type:
Miscellaneous
Report Number:
PSI-PROC-96-02; CONF-9608191-
Reference Number:
SCA: 665100; PA: AIX-28:024565; EDB-97:076557; SN: 97001789424
Resource Relation:
Conference: 4. summer school on neutron scattering, Zuoz (Switzerland), 18-24 Aug 1996; Other Information: PBD: Nov 1996; Related Information: Is Part Of New instruments and science around SINQ. Lecture notes of the 4. summer school on neutron scattering; Furrer, A. [ed.]; PB: 454 p.; PSI-Proceedings 96-02
Subject:
66 PHYSICS; NEUTRONS; REFLECTION; ORGANIC POLYMERS; DEUTERATION; EXPERIMENTAL DATA; INTERFACES; SURFACES; THIN FILMS
OSTI ID:
475558
Country of Origin:
Switzerland
Language:
English
Other Identifying Numbers:
Journal ID: ISSN 1019-6447; Other: ON: DE97623521; TRN: CH9700057024565
Availability:
OSTI as DE97623521
Submitting Site:
CHN
Size:
pp. 413-426
Announcement Date:

Citation Formats

Stamm, M. Polymer surfaces, interfaces and thin films. Switzerland: N. p., 1996. Web.
Stamm, M. Polymer surfaces, interfaces and thin films. Switzerland.
Stamm, M. 1996. "Polymer surfaces, interfaces and thin films." Switzerland.
@misc{etde_475558,
title = {Polymer surfaces, interfaces and thin films}
author = {Stamm, M}
abstractNote = {Neutron reflectometry can be used in various ways to investigate surfaces, interfaces and thin films of polymers. Its potential comes mostly from the possibilities offered by selective deuteration, where a particular component can be made visible with respect to its activity at the interface. In addition the depth resolution is much better than with most other direct techniques, and details of the profiles may be resolved. Several examples will be discussed including the segment diffusion at the interface between two polymer films, the determination of the narrow interfaces between incompatible polymer blends and the development of order in thin diblock copolymer films. (author) 10 figs., 2 tabs., 38 refs.}
place = {Switzerland}
year = {1996}
month = {Nov}
}