You need JavaScript to view this
ETDEWEB   /       /    Single ion counting with a MCP (microchannel plate) detector

Single ion counting with a MCP (microchannel plate) detector

Conference:

SAVE / SHARE

XML RIS EndNote CSV/Excel JSON

Abstract

In this study, a single-ion-counting method using alpha-particle-impact ionization of Ar atoms is demonstrated and the preliminary {epsilon}{sub mcp} for Ar ions with incident energies of 3 to 4.7 keV is determined. The single-ion counting by the MCP is aimed to be performed under experimental conditions as follows: (1) A signal from the MCP is reasonably identified as incidence of single Ar-ion. (2) The counting rate of Ar ions is less than 1 s{sup -1}. (3) The incident Ar ions are not focused on a small part of an active area of the MCP, namely, {epsilon}{sub mcp} is determined with respect to the whole active area of the MCP. So far, any absolute detection efficiency has not been reported under these conditions. (J.P.N.)
Authors:
Tawara, Hiroko; Sasaki, Shinichi; Miyajima, Mitsuhiro; [1]  Shibamura, Eido
  1. National Lab. for High Energy Physics, Tsukuba, Ibaraki (Japan)
Publication Date:
Jul 01, 1996
Product Type:
Conference
Report Number:
KEK-PROC-96-4; CONF-9601112-
Reference Number:
SCA: 440101; PA: JPN-97:004269; EDB-97:075106; SN: 97001784868
Resource Relation:
Conference: Workshop on radiation detector and its application, Tsukuba (Japan), 23-25 Jan 1996; Other Information: PBD: Jul 1996; Related Information: Is Part Of Radiation detectors and their uses. Proceedings; Miyajima, Mitsuhiro; Sasaki, Shinichi; Iguchi, Tetsuo; Nakazawa, Masaharu [eds.]; PB: 273 p.
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; ION DETECTION; TIME-OF-FLIGHT MASS SPECTROMETERS; HALF-LIFE; XENON 136 REACTIONS; BARIUM 136; DOUBLE BETA DECAY; COUNTING RATES; ARGON IONS; ALPHA PARTICLES
OSTI ID:
473903
Research Organizations:
National Lab. for High Energy Physics, Tsukuba, Ibaraki (Japan)
Country of Origin:
Japan
Language:
English
Other Identifying Numbers:
Other: ON: DE97729553; TRN: JP9704269
Availability:
OSTI as DE97729553
Submitting Site:
JPN
Size:
pp. 17-30
Announcement Date:
Jun 04, 1997

Conference:

SAVE / SHARE

XML RIS EndNote CSV/Excel JSON

Citation Formats

Tawara, Hiroko, Sasaki, Shinichi, Miyajima, Mitsuhiro, and Shibamura, Eido. Single ion counting with a MCP (microchannel plate) detector. Japan: N. p., 1996. Web.
Tawara, Hiroko, Sasaki, Shinichi, Miyajima, Mitsuhiro, & Shibamura, Eido. Single ion counting with a MCP (microchannel plate) detector. Japan.
Tawara, Hiroko, Sasaki, Shinichi, Miyajima, Mitsuhiro, and Shibamura, Eido. 1996. "Single ion counting with a MCP (microchannel plate) detector." Japan.
@misc{etde_473903,
title = {Single ion counting with a MCP (microchannel plate) detector}
 author = {Tawara, Hiroko, Sasaki, Shinichi, Miyajima, Mitsuhiro, and Shibamura, Eido}
 abstractNote = {In this study, a single-ion-counting method using alpha-particle-impact ionization of Ar atoms is demonstrated and the preliminary {epsilon}{sub mcp} for Ar ions with incident energies of 3 to 4.7 keV is determined. The single-ion counting by the MCP is aimed to be performed under experimental conditions as follows: (1) A signal from the MCP is reasonably identified as incidence of single Ar-ion. (2) The counting rate of Ar ions is less than 1 s{sup -1}. (3) The incident Ar ions are not focused on a small part of an active area of the MCP, namely, {epsilon}{sub mcp} is determined with respect to the whole active area of the MCP. So far, any absolute detection efficiency has not been reported under these conditions. (J.P.N.)}
 place = {Japan}
 year = {1996}
 month = {Jul}
 }