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Changes of the temperature coefficients of the characteristics which accompany degradation and recovery of a-Si solar cells; A-Si taiyo denchi no hikari (denryu) rekka oyobi kaifuku ni tomonau tokusei ondo keisu no henka

Abstract

Pursuant to the measuring of temperature dependency of the characteristics such as conversion efficiency, during the process of degradation in a-Si solar cells due to light and electric current and the process of recovery by annealing, this paper describes changes in temperature coefficients, correlation between the characteristic parameters and the degradation, and the results of the examination of their characteristics. The conversion efficiency {mu} degraded approximately by 45% of the initial value each by the irradiation under a light intensity with 3 SUN accelerated and by the infusion of current at 20mA/cm{sup 2}; and then, the efficiency recovered to 70-75% of the degradation by subsequent annealing. In addition, in the temperature dependency at 80{degree}C against at 20{degree}C, Isc slightly increased while Vcc greatly decreased. This slight increase in Isc was mainly due to the decrease in the width of the forbidden band, while the decrease in Vcc was due to the increase in the reverse saturation current. The temperature dependency of {mu}N was negative, becoming small in accordance with the degradation. The temperature dependency of FF/FFO was negative initially both in light and current, but it decreased with the degradation and turned to positive. The temperature coefficients of I-V parameters  More>>
Authors:
Yanagisawa, T; Koyanagi, T; Nakamura, K; Takahisa, K; Kojima, T [1] 
  1. electrotechnical Laboratory, Tsukuba (Japan)
Publication Date:
Oct 27, 1996
Product Type:
Conference
Report Number:
CONF-9610295-
Reference Number:
SCA: 140600; PA: NEDO-96:915441; EDB-97:071960; SN: 97001782984
Resource Relation:
Conference: JSES/JWEA joint conference (1996), 1996 nendo nihon taiyo energy gakkai nihon furyoku energy kyokai godo kenkyu happyokai, Yamagata (Japan), 31 Oct - 1 Nov 1996; Other Information: PBD: 27 Oct 1996; Related Information: Is Part Of Proceedings of JSES/JWEA Joint Conference (1996); PB: 406 p.; Taiyo/furyoku energy koen ronbunshu (1996)
Subject:
14 SOLAR ENERGY; SILICON; AMORPHOUS STATE; SOLAR CELLS; DECOMPOSITION; REGENERATION; TEMPERATURE COEFFICIENT; ANNEALING; PARAMETRIC ANALYSIS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL
OSTI ID:
472734
Research Organizations:
Japan Solar Energy Society, Tokyo (Japan)
Country of Origin:
Japan
Language:
Japanese
Other Identifying Numbers:
Other: ON: DE97744185; TRN: 96:915441
Availability:
Available from Japan Solar Energy Society, 44-14, Yoyogi 2-chome, Shibuya-ku, Tokyo, Japan; OSTI as DE97744185
Submitting Site:
NEDO
Size:
pp. 53-56
Announcement Date:
Jun 03, 1997

Citation Formats

Yanagisawa, T, Koyanagi, T, Nakamura, K, Takahisa, K, and Kojima, T. Changes of the temperature coefficients of the characteristics which accompany degradation and recovery of a-Si solar cells; A-Si taiyo denchi no hikari (denryu) rekka oyobi kaifuku ni tomonau tokusei ondo keisu no henka. Japan: N. p., 1996. Web.
Yanagisawa, T, Koyanagi, T, Nakamura, K, Takahisa, K, & Kojima, T. Changes of the temperature coefficients of the characteristics which accompany degradation and recovery of a-Si solar cells; A-Si taiyo denchi no hikari (denryu) rekka oyobi kaifuku ni tomonau tokusei ondo keisu no henka. Japan.
Yanagisawa, T, Koyanagi, T, Nakamura, K, Takahisa, K, and Kojima, T. 1996. "Changes of the temperature coefficients of the characteristics which accompany degradation and recovery of a-Si solar cells; A-Si taiyo denchi no hikari (denryu) rekka oyobi kaifuku ni tomonau tokusei ondo keisu no henka." Japan.
@misc{etde_472734,
title = {Changes of the temperature coefficients of the characteristics which accompany degradation and recovery of a-Si solar cells; A-Si taiyo denchi no hikari (denryu) rekka oyobi kaifuku ni tomonau tokusei ondo keisu no henka}
author = {Yanagisawa, T, Koyanagi, T, Nakamura, K, Takahisa, K, and Kojima, T}
abstractNote = {Pursuant to the measuring of temperature dependency of the characteristics such as conversion efficiency, during the process of degradation in a-Si solar cells due to light and electric current and the process of recovery by annealing, this paper describes changes in temperature coefficients, correlation between the characteristic parameters and the degradation, and the results of the examination of their characteristics. The conversion efficiency {mu} degraded approximately by 45% of the initial value each by the irradiation under a light intensity with 3 SUN accelerated and by the infusion of current at 20mA/cm{sup 2}; and then, the efficiency recovered to 70-75% of the degradation by subsequent annealing. In addition, in the temperature dependency at 80{degree}C against at 20{degree}C, Isc slightly increased while Vcc greatly decreased. This slight increase in Isc was mainly due to the decrease in the width of the forbidden band, while the decrease in Vcc was due to the increase in the reverse saturation current. The temperature dependency of {mu}N was negative, becoming small in accordance with the degradation. The temperature dependency of FF/FFO was negative initially both in light and current, but it decreased with the degradation and turned to positive. The temperature coefficients of I-V parameters reversibly changed corresponding to the degradation and recovery of these parameters and stayed in a good correlation. 7 refs., 8 figs., 1 tab.}
place = {Japan}
year = {1996}
month = {Oct}
}