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Thin film surface reconstruction analysis

Abstract

The study of the atomic structure of surfaces and interfaces is a fundamental step in the knowledge and the development of new materials. Among the several surface-sensitive techniques employed to characterise the atomic arrangements, grazing incidence x-ray diffraction (GIXD) is one of the most powerful. With a simple data treatment, based on the kinematical theory, and using the classical methods of x-ray bulk structure determination, it gives the atomic positions of atoms at a surface or an interface and the atomic displacements of subsurface layers for a complete determination of the structure. In this paper the main features of the technique will be briefly reviewed and selected of application to semiconductor and metal surfaces will be discussed.
Authors:
Imperatori, P [1] 
  1. CNR, Monterotondo Stazione, Rome (Italy). Istituto di Chimica dei materiali
Publication Date:
Sep 01, 1996
Product Type:
Conference
Report Number:
LNF-IR-96/049; CONF-9610291-
Reference Number:
SCA: 665200; PA: ITA-97:000428; EDB-97:064255; SN: 97001773813
Resource Relation:
Conference: 5. school on X-ray diffraction from polycrystalline materials, Frascati (Italy), 2-5 Oct 1996; Other Information: PBD: Sep 1996; Related Information: Is Part Of Thin film characterisation by advanced X-ray diffraction techniques; Cappuccio, G.; Terranova, M.L. [eds.] [INFN, Laboratori Nazionali di Frascati, Rome (Italy)]; PB: 388 p.
Subject:
66 PHYSICS; X-RAY DIFFRACTION; THIN FILMS; BRAGG REFLECTION; CRYSTAL GROWTH; BULK SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES
OSTI ID:
465294
Research Organizations:
Istituto Nazionale di Fisica Nucleare, Frascati (Italy). Lab. Nazionale di Frascati
Country of Origin:
Italy
Language:
English
Other Identifying Numbers:
Other: ON: DE97740684; TRN: IT9700428
Availability:
OSTI as DE97740684
Submitting Site:
ITA
Size:
pp. 245-258
Announcement Date:

Citation Formats

Imperatori, P. Thin film surface reconstruction analysis. Italy: N. p., 1996. Web.
Imperatori, P. Thin film surface reconstruction analysis. Italy.
Imperatori, P. 1996. "Thin film surface reconstruction analysis." Italy.
@misc{etde_465294,
title = {Thin film surface reconstruction analysis}
author = {Imperatori, P}
abstractNote = {The study of the atomic structure of surfaces and interfaces is a fundamental step in the knowledge and the development of new materials. Among the several surface-sensitive techniques employed to characterise the atomic arrangements, grazing incidence x-ray diffraction (GIXD) is one of the most powerful. With a simple data treatment, based on the kinematical theory, and using the classical methods of x-ray bulk structure determination, it gives the atomic positions of atoms at a surface or an interface and the atomic displacements of subsurface layers for a complete determination of the structure. In this paper the main features of the technique will be briefly reviewed and selected of application to semiconductor and metal surfaces will be discussed.}
place = {Italy}
year = {1996}
month = {Sep}
}