You need JavaScript to view this

Glancing angle synchrotron X-ray diffraction

Abstract

This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the X-ray region and cover reflectivity, diffraction form polycrystalline films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed in detail. Two examples of the reflectivity from multilayers and the diffraction from iron oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the experimental geometries that can be employed are described i detail. A brief bibliography is provided at the end to accompany this part of the 1996 Frascati school.
Authors:
Cernik, R J [1] 
  1. Daresbury Lab., Warrington, WA (United States)
Publication Date:
Sep 01, 1996
Product Type:
Conference
Report Number:
LNF-IR-96/049; CONF-9610291-
Reference Number:
SCA: 665300; PA: ITA-97:000426; EDB-97:064263; SN: 97001773809
Resource Relation:
Conference: 5. school on X-ray diffraction from polycrystalline materials, Frascati (Italy), 2-5 Oct 1996; Other Information: PBD: Sep 1996; Related Information: Is Part Of Thin film characterisation by advanced X-ray diffraction techniques; Cappuccio, G.; Terranova, M.L. [eds.] [INFN, Laboratori Nazionali di Frascati, Rome (Italy)]; PB: 388 p.
Subject:
66 PHYSICS; SYNCHROTRONS; X-RAY DIFFRACTION; THIN FILMS; REFLECTIVITY; TEXTURE; SCATTERING; IRON OXIDES
OSTI ID:
465292
Research Organizations:
Istituto Nazionale di Fisica Nucleare, Frascati (Italy). Lab. Nazionale di Frascati
Country of Origin:
Italy
Language:
English
Other Identifying Numbers:
Other: ON: DE97740684; TRN: IT9700426
Availability:
OSTI as DE97740684
Submitting Site:
ITA
Size:
pp. 205-224
Announcement Date:

Citation Formats

Cernik, R J. Glancing angle synchrotron X-ray diffraction. Italy: N. p., 1996. Web.
Cernik, R J. Glancing angle synchrotron X-ray diffraction. Italy.
Cernik, R J. 1996. "Glancing angle synchrotron X-ray diffraction." Italy.
@misc{etde_465292,
title = {Glancing angle synchrotron X-ray diffraction}
author = {Cernik, R J}
abstractNote = {This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the X-ray region and cover reflectivity, diffraction form polycrystalline films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed in detail. Two examples of the reflectivity from multilayers and the diffraction from iron oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the experimental geometries that can be employed are described i detail. A brief bibliography is provided at the end to accompany this part of the 1996 Frascati school.}
place = {Italy}
year = {1996}
month = {Sep}
}