Statistical process control(SPC) allows for the identification of problems in alpha spectroscopy processes before they occur, unlike standard laboratory Q C which only identifies problems after a process fails. SPC tools that are directly applicable to alpha spectroscopy include individual X-charts and X-bar charts, process capability plots, and scatter plots. Most scientists are familiar with the concepts the and methods employed by SPC. These tools allow analysis of process bias, precision, accuracy and reproducibility as well as process capability. Parameters affecting instrument performance are monitored and analyzed using SPC methods. These instrument parameters can also be compared to sampling, preparation, measurement, and analysis Q C parameters permitting the evaluation of cause effect relationships. Three examples of SPC, as applied to alpha spectroscopy , are presented. The first example investigates background contamination using averaging to show trends quickly. A second example demonstrates how SPC can identify sample processing problems, analyzing both how and why this problem occurred. A third example illustrates how SPC can predict when an alpha spectroscopy process is going to fail. This allows for an orderly and timely shutdown of the process to perform preventative maintenance, avoiding the need to repeat costly sample analyses. 7 figs., 2 tabs.