Abstract
The ion beam induced charge (IBIC) technique has been used for a wide variety of analytical applications in the study of semiconductor materials. This paper briefly reviews these uses and identifies those areas which require further development in order to facilitate the more widespread use of the IBIC method. Progress towards implementing these improvements is discussed. 14 refs., 1 fig.
Breese, M B.H.;
Laird, J S;
Jamieson, D N
[1]
- Melbourne Univ., Parkville, VIC (Australia). School of Physics
Citation Formats
Breese, M B.H., Laird, J S, and Jamieson, D N.
Advances of the IBIC technique.
Australia: N. p.,
1993.
Web.
Breese, M B.H., Laird, J S, & Jamieson, D N.
Advances of the IBIC technique.
Australia.
Breese, M B.H., Laird, J S, and Jamieson, D N.
1993.
"Advances of the IBIC technique."
Australia.
@misc{etde_446203,
title = {Advances of the IBIC technique}
author = {Breese, M B.H., Laird, J S, and Jamieson, D N}
abstractNote = {The ion beam induced charge (IBIC) technique has been used for a wide variety of analytical applications in the study of semiconductor materials. This paper briefly reviews these uses and identifies those areas which require further development in order to facilitate the more widespread use of the IBIC method. Progress towards implementing these improvements is discussed. 14 refs., 1 fig.}
place = {Australia}
year = {1993}
month = {Dec}
}
title = {Advances of the IBIC technique}
author = {Breese, M B.H., Laird, J S, and Jamieson, D N}
abstractNote = {The ion beam induced charge (IBIC) technique has been used for a wide variety of analytical applications in the study of semiconductor materials. This paper briefly reviews these uses and identifies those areas which require further development in order to facilitate the more widespread use of the IBIC method. Progress towards implementing these improvements is discussed. 14 refs., 1 fig.}
place = {Australia}
year = {1993}
month = {Dec}
}