Abstract
The technique of Nuclear Microscopy, utilizing a focused ion probe of typically MeV H{sup +} or He{sup +} ions, can produce images where the contrast depends on typical Ion Beam Analysis (lBA) processes. The probe forming lens system usually utilizes strong focusing, precision magnetic quadrupole lenses and the probe is scanned over the target to produce images. Originally, this imaging technique was developed to utilize backscattered particles with incident beam currents typically of a few nA, and the technique became known as Channeling Contrast Microscopy (CCM). Recently, the technique has been developed further to utilize the forward scattering of ions incident along a major crystal axis in thin crystals. This technique is known as Channeling Scanning Transmission Ion Microscopy (CSTIM). Since nearly all incident ions are detected, CSTIM is highly efficient and very low beam currents are sufficient for imaging, typically as low as a few fA. This allows probes as small as 50 nm to be used. In this paper we briefly review the recent applications of these emerging techniques to a variety of single crystal materials (authors). 13 refs., 5 figs.
Jamieson, D N;
Breese, M B.H.;
Prawer, S;
Dooley, S P;
Allen, M G;
Bettiol, A A;
Saint, A;
[1]
Ryan, C G
[2]
- Melbourne Univ., Parkville, VIC (Australia). School of Physics
- Commonwealth Scientific and Industrial Research Organisation (CSIRO), North Ryde, NSW (Australia). Div. of Exploration Geoscience
Citation Formats
Jamieson, D N, Breese, M B.H., Prawer, S, Dooley, S P, Allen, M G, Bettiol, A A, Saint, A, and Ryan, C G.
Applications of focused MeV light ion beams for high resolution channeling contrast imaging.
Australia: N. p.,
1993.
Web.
Jamieson, D N, Breese, M B.H., Prawer, S, Dooley, S P, Allen, M G, Bettiol, A A, Saint, A, & Ryan, C G.
Applications of focused MeV light ion beams for high resolution channeling contrast imaging.
Australia.
Jamieson, D N, Breese, M B.H., Prawer, S, Dooley, S P, Allen, M G, Bettiol, A A, Saint, A, and Ryan, C G.
1993.
"Applications of focused MeV light ion beams for high resolution channeling contrast imaging."
Australia.
@misc{etde_445949,
title = {Applications of focused MeV light ion beams for high resolution channeling contrast imaging}
author = {Jamieson, D N, Breese, M B.H., Prawer, S, Dooley, S P, Allen, M G, Bettiol, A A, Saint, A, and Ryan, C G}
abstractNote = {The technique of Nuclear Microscopy, utilizing a focused ion probe of typically MeV H{sup +} or He{sup +} ions, can produce images where the contrast depends on typical Ion Beam Analysis (lBA) processes. The probe forming lens system usually utilizes strong focusing, precision magnetic quadrupole lenses and the probe is scanned over the target to produce images. Originally, this imaging technique was developed to utilize backscattered particles with incident beam currents typically of a few nA, and the technique became known as Channeling Contrast Microscopy (CCM). Recently, the technique has been developed further to utilize the forward scattering of ions incident along a major crystal axis in thin crystals. This technique is known as Channeling Scanning Transmission Ion Microscopy (CSTIM). Since nearly all incident ions are detected, CSTIM is highly efficient and very low beam currents are sufficient for imaging, typically as low as a few fA. This allows probes as small as 50 nm to be used. In this paper we briefly review the recent applications of these emerging techniques to a variety of single crystal materials (authors). 13 refs., 5 figs.}
place = {Australia}
year = {1993}
month = {Dec}
}
title = {Applications of focused MeV light ion beams for high resolution channeling contrast imaging}
author = {Jamieson, D N, Breese, M B.H., Prawer, S, Dooley, S P, Allen, M G, Bettiol, A A, Saint, A, and Ryan, C G}
abstractNote = {The technique of Nuclear Microscopy, utilizing a focused ion probe of typically MeV H{sup +} or He{sup +} ions, can produce images where the contrast depends on typical Ion Beam Analysis (lBA) processes. The probe forming lens system usually utilizes strong focusing, precision magnetic quadrupole lenses and the probe is scanned over the target to produce images. Originally, this imaging technique was developed to utilize backscattered particles with incident beam currents typically of a few nA, and the technique became known as Channeling Contrast Microscopy (CCM). Recently, the technique has been developed further to utilize the forward scattering of ions incident along a major crystal axis in thin crystals. This technique is known as Channeling Scanning Transmission Ion Microscopy (CSTIM). Since nearly all incident ions are detected, CSTIM is highly efficient and very low beam currents are sufficient for imaging, typically as low as a few fA. This allows probes as small as 50 nm to be used. In this paper we briefly review the recent applications of these emerging techniques to a variety of single crystal materials (authors). 13 refs., 5 figs.}
place = {Australia}
year = {1993}
month = {Dec}
}