You need JavaScript to view this

Chemical analysis of surfaces by resonance ionization mass spectroscopy associated to ionic pulverization; Analyse chimique de surfaces par spectrometrie d`ionisation resonante associee a la pulverisation ionique

Abstract

This work shows that if resonance ionization mass spectroscopy was first applied in isotopic separation, it`s also an analyzing method adapted to the study of semi-conductor materials and thin foils. We have improved this technic: a neodymium laser coupled with a dye laser, a new argon ions gun, a gallium ions gun and a new collection optic for the secondary ions quadrupole spectrometer to allow quantitative and selective measurements. (S.G.). 84 refs.
Authors:
Publication Date:
Dec 19, 1995
Product Type:
Thesis/Dissertation
Report Number:
CNRS-PHASE-96-02
Reference Number:
SCA: 665300; PA: AIX-28:020512; EDB-97:031104; NTS-97:007579; SN: 97001737077
Resource Relation:
Other Information: TH: These (D. es Sc.).; PBD: 19 Dec 1995
Subject:
66 PHYSICS; ARGON IONS; SPUTTERING; RESONANCE IONIZATION MASS SPECTROSCOPY; CHEMICAL ANALYSIS; SURFACES; ACCURACY; ARSENIC; CHROMIUM; DEPTH; DYE LASERS; GALLIUM IONS; ION EMISSION; IRON; MASS SPECTROMETERS; NEODYMIUM LASERS; NEUTRON EMISSION; NICKEL; PHOTOIONIZATION; RESOLUTION; SATURATION; SENSITIVITY; TITANIUM
OSTI ID:
431543
Research Organizations:
Centre National de la Recherche Scientifique (CNRS), 67 - Strasbourg (France); Strasbourg-1 Univ., 67 (France)
Country of Origin:
France
Language:
French
Other Identifying Numbers:
Other: ON: DE97615329; TRN: FR9603305020512
Availability:
INIS; OSTI as DE97615329
Submitting Site:
FRN
Size:
136 p.
Announcement Date:

Citation Formats

Kern, P. Chemical analysis of surfaces by resonance ionization mass spectroscopy associated to ionic pulverization; Analyse chimique de surfaces par spectrometrie d`ionisation resonante associee a la pulverisation ionique. France: N. p., 1995. Web.
Kern, P. Chemical analysis of surfaces by resonance ionization mass spectroscopy associated to ionic pulverization; Analyse chimique de surfaces par spectrometrie d`ionisation resonante associee a la pulverisation ionique. France.
Kern, P. 1995. "Chemical analysis of surfaces by resonance ionization mass spectroscopy associated to ionic pulverization; Analyse chimique de surfaces par spectrometrie d`ionisation resonante associee a la pulverisation ionique." France.
@misc{etde_431543,
title = {Chemical analysis of surfaces by resonance ionization mass spectroscopy associated to ionic pulverization; Analyse chimique de surfaces par spectrometrie d`ionisation resonante associee a la pulverisation ionique}
author = {Kern, P}
abstractNote = {This work shows that if resonance ionization mass spectroscopy was first applied in isotopic separation, it`s also an analyzing method adapted to the study of semi-conductor materials and thin foils. We have improved this technic: a neodymium laser coupled with a dye laser, a new argon ions gun, a gallium ions gun and a new collection optic for the secondary ions quadrupole spectrometer to allow quantitative and selective measurements. (S.G.). 84 refs.}
place = {France}
year = {1995}
month = {Dec}
}