You need JavaScript to view this

Atomic mixing of metallic bilayers Ni/Ti irradiated with high energy heavy ions; Etude du melange ionique de bicouches metalliques Ni/Ti irradiees avec des ions lourds de haute energie

Abstract

We have studied the ionic mixing of Nl(105 angstrom) bilayers irradiated, at 80 and 300 K. with GeV heavy ions. In this energy range, the energy transfer from the incident ions to the target occurs mainly through electronic excitations. We have shown that this energy transfer induces a strong ionic mixing at the Nl/Ti interface. The thickness of the mixed interlayer increases with the fluence. At low fluences (10{sup 12} ions/cm{sup 2}), the Nl/Ti interface is rough ; at higher fluences (10{sup 13} ions/cm{sup 2}) a homogeneous mixed interlayer appears ; and at even higher fluences (some 10{sup 13} ions/cm{sup 2}) a preferential diffusion of Ni into Ti is clearly seen. The characterization techniques used are: (1) electrical resistivity measurements which allow to follow in situ the damage kinetic. (II) neutron and X-ray reflectometry. (III) elaboration of transverse cuts on which was performed energy loss spectroscopy. (II) and (III) allow the determination of the concentration profiles of the different species present in the sample. (IV) transmission electron microscopy on the transverse cuts which gives a direct image of the different layers. (author). 11 refs., 103 figs., 23 tabs., 2 appends.
Authors:
Publication Date:
Sep 26, 1994
Product Type:
Thesis/Dissertation
Report Number:
CEA-R-5687
Reference Number:
SCA: 360106; PA: AIX-28:007192; EDB-97:007792; NTS-97:005754; SN: 97001715300
Resource Relation:
Other Information: TH: These (D. es Sc.).; PBD: 26 Sep 1994
Subject:
36 MATERIALS SCIENCE; LAYERS; GEV RANGE; HEAVY IONS; IRRADIATION; COATINGS; MIXING; NICKEL; THIN FILMS; TITANIUM
OSTI ID:
411264
Research Organizations:
CEA Centre d`Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France). Direction des Technologies Avancees; Paris-11 Univ., 91 - Orsay (France)
Country of Origin:
France
Language:
French
Other Identifying Numbers:
Other: ON: DE97610179; TRN: FR9603133007192
Availability:
INIS; OSTI as DE97610179
Submitting Site:
FRN
Size:
233 p.
Announcement Date:

Citation Formats

Leguay, R. Atomic mixing of metallic bilayers Ni/Ti irradiated with high energy heavy ions; Etude du melange ionique de bicouches metalliques Ni/Ti irradiees avec des ions lourds de haute energie. France: N. p., 1994. Web.
Leguay, R. Atomic mixing of metallic bilayers Ni/Ti irradiated with high energy heavy ions; Etude du melange ionique de bicouches metalliques Ni/Ti irradiees avec des ions lourds de haute energie. France.
Leguay, R. 1994. "Atomic mixing of metallic bilayers Ni/Ti irradiated with high energy heavy ions; Etude du melange ionique de bicouches metalliques Ni/Ti irradiees avec des ions lourds de haute energie." France.
@misc{etde_411264,
title = {Atomic mixing of metallic bilayers Ni/Ti irradiated with high energy heavy ions; Etude du melange ionique de bicouches metalliques Ni/Ti irradiees avec des ions lourds de haute energie}
author = {Leguay, R}
abstractNote = {We have studied the ionic mixing of Nl(105 angstrom) bilayers irradiated, at 80 and 300 K. with GeV heavy ions. In this energy range, the energy transfer from the incident ions to the target occurs mainly through electronic excitations. We have shown that this energy transfer induces a strong ionic mixing at the Nl/Ti interface. The thickness of the mixed interlayer increases with the fluence. At low fluences (10{sup 12} ions/cm{sup 2}), the Nl/Ti interface is rough ; at higher fluences (10{sup 13} ions/cm{sup 2}) a homogeneous mixed interlayer appears ; and at even higher fluences (some 10{sup 13} ions/cm{sup 2}) a preferential diffusion of Ni into Ti is clearly seen. The characterization techniques used are: (1) electrical resistivity measurements which allow to follow in situ the damage kinetic. (II) neutron and X-ray reflectometry. (III) elaboration of transverse cuts on which was performed energy loss spectroscopy. (II) and (III) allow the determination of the concentration profiles of the different species present in the sample. (IV) transmission electron microscopy on the transverse cuts which gives a direct image of the different layers. (author). 11 refs., 103 figs., 23 tabs., 2 appends.}
place = {France}
year = {1994}
month = {Sep}
}