Abstract
For the purpose of measuring in-situ resistivity without contact with the rock, a study was made about a measuring device using electromagnetic induction. This measuring device has two concentric transmission loops and a receiving point at the center of the loops, and performs focusing by canceling the primary magnetic field at the receiving point. Using this device, a trial was made to eliminate the influence of surface undulation. In the model calculation, response was calculated after the structure with a heavily undulated ground surface was replaced by a two-layer structure with the first layer provided with a higher resistivity. In the model, the first layer had a resistivity of 10000 Ohm m, and the second layer 1000 Ohm m. Using the ratio between the transmission loop radii as a parameter, relationship with the thickness of the first layer was studied, and it was found that the sensitivity to the second layer resistivity increases when the inner and outer loops are nearer to each other in terms of radius and that this eliminates the influence near the surface layer. A decision needs to fall within a scope assuring good reception because response intensity decreases as the ratio between the transmission loop
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Noguchi, K;
Aoki, H;
[1]
Saito, A
[2]
- Waseda University, Tokyo (Japan). School of Science and Engineering
- Mitsui Mineral Development Engineering Co. Ltd., Tokyo (Japan)
Citation Formats
Noguchi, K, Aoki, H, and Saito, A.
Fundamental principles of a new EM tool for in-situ resistivity measurement; Denji yudoho ni yoru den`ichi hiteiko sokutei sochi no kento.
Japan: N. p.,
1996.
Web.
Noguchi, K, Aoki, H, & Saito, A.
Fundamental principles of a new EM tool for in-situ resistivity measurement; Denji yudoho ni yoru den`ichi hiteiko sokutei sochi no kento.
Japan.
Noguchi, K, Aoki, H, and Saito, A.
1996.
"Fundamental principles of a new EM tool for in-situ resistivity measurement; Denji yudoho ni yoru den`ichi hiteiko sokutei sochi no kento."
Japan.
@misc{etde_395520,
title = {Fundamental principles of a new EM tool for in-situ resistivity measurement; Denji yudoho ni yoru den`ichi hiteiko sokutei sochi no kento}
author = {Noguchi, K, Aoki, H, and Saito, A}
abstractNote = {For the purpose of measuring in-situ resistivity without contact with the rock, a study was made about a measuring device using electromagnetic induction. This measuring device has two concentric transmission loops and a receiving point at the center of the loops, and performs focusing by canceling the primary magnetic field at the receiving point. Using this device, a trial was made to eliminate the influence of surface undulation. In the model calculation, response was calculated after the structure with a heavily undulated ground surface was replaced by a two-layer structure with the first layer provided with a higher resistivity. In the model, the first layer had a resistivity of 10000 Ohm m, and the second layer 1000 Ohm m. Using the ratio between the transmission loop radii as a parameter, relationship with the thickness of the first layer was studied, and it was found that the sensitivity to the second layer resistivity increases when the inner and outer loops are nearer to each other in terms of radius and that this eliminates the influence near the surface layer. A decision needs to fall within a scope assuring good reception because response intensity decreases as the ratio between the transmission loop radii approaches 1. 3 refs., 11 figs.}
place = {Japan}
year = {1996}
month = {May}
}
title = {Fundamental principles of a new EM tool for in-situ resistivity measurement; Denji yudoho ni yoru den`ichi hiteiko sokutei sochi no kento}
author = {Noguchi, K, Aoki, H, and Saito, A}
abstractNote = {For the purpose of measuring in-situ resistivity without contact with the rock, a study was made about a measuring device using electromagnetic induction. This measuring device has two concentric transmission loops and a receiving point at the center of the loops, and performs focusing by canceling the primary magnetic field at the receiving point. Using this device, a trial was made to eliminate the influence of surface undulation. In the model calculation, response was calculated after the structure with a heavily undulated ground surface was replaced by a two-layer structure with the first layer provided with a higher resistivity. In the model, the first layer had a resistivity of 10000 Ohm m, and the second layer 1000 Ohm m. Using the ratio between the transmission loop radii as a parameter, relationship with the thickness of the first layer was studied, and it was found that the sensitivity to the second layer resistivity increases when the inner and outer loops are nearer to each other in terms of radius and that this eliminates the influence near the surface layer. A decision needs to fall within a scope assuring good reception because response intensity decreases as the ratio between the transmission loop radii approaches 1. 3 refs., 11 figs.}
place = {Japan}
year = {1996}
month = {May}
}