Abstract
Investigations were given on how the equivalent circuit constants change when efficiency of amorphous silicon solar cells changes with time in light degradation and temperature recovery. In the experiment, light irradiation tests under a constant temperature and light intensity condition, followed by recovery tests under a constant temperature and constant weak light intensity or constant temperature condition were repeated continuously. According to the result of an experiment on single layer type cells, the change in each equivalent circuit constant in association with degradation in efficiency and file factor and variation in recovery is reversible mostly. However, a slightly irreversible component was recognized only in the initial degradation process in series resistance and diode factor values. With regard to stacked cells, it was suggested that the main players to determine cell characteristics during the processes of deterioration and recovery take turns among the three layers as follows: the shape of the time-based change in the efficiency comes different and is not saturating; as the efficiency decreases, the extent of the change increases in the diode factor and series resistance; and the path the deterioration takes differs from that the recovery takes. 2 refs., 12 figs.
Takahisa, K;
Kojima, T;
Nakamura, K;
Koyanagi, T;
Yanagisawa, T
[1]
- Electrotechnical Laboratory, Tsukuba (Japan)
Citation Formats
Takahisa, K, Kojima, T, Nakamura, K, Koyanagi, T, and Yanagisawa, T.
Change of the equivalent circuit constants accompanied by the degradation and recovery of efficiency on a-Si solar cells; A-Si taiyo denchi no koritsu no rekka to kaifuku ni tomonau toka kairo teisu no henka.
Japan: N. p.,
1997.
Web.
Takahisa, K, Kojima, T, Nakamura, K, Koyanagi, T, & Yanagisawa, T.
Change of the equivalent circuit constants accompanied by the degradation and recovery of efficiency on a-Si solar cells; A-Si taiyo denchi no koritsu no rekka to kaifuku ni tomonau toka kairo teisu no henka.
Japan.
Takahisa, K, Kojima, T, Nakamura, K, Koyanagi, T, and Yanagisawa, T.
1997.
"Change of the equivalent circuit constants accompanied by the degradation and recovery of efficiency on a-Si solar cells; A-Si taiyo denchi no koritsu no rekka to kaifuku ni tomonau toka kairo teisu no henka."
Japan.
@misc{etde_366087,
title = {Change of the equivalent circuit constants accompanied by the degradation and recovery of efficiency on a-Si solar cells; A-Si taiyo denchi no koritsu no rekka to kaifuku ni tomonau toka kairo teisu no henka}
author = {Takahisa, K, Kojima, T, Nakamura, K, Koyanagi, T, and Yanagisawa, T}
abstractNote = {Investigations were given on how the equivalent circuit constants change when efficiency of amorphous silicon solar cells changes with time in light degradation and temperature recovery. In the experiment, light irradiation tests under a constant temperature and light intensity condition, followed by recovery tests under a constant temperature and constant weak light intensity or constant temperature condition were repeated continuously. According to the result of an experiment on single layer type cells, the change in each equivalent circuit constant in association with degradation in efficiency and file factor and variation in recovery is reversible mostly. However, a slightly irreversible component was recognized only in the initial degradation process in series resistance and diode factor values. With regard to stacked cells, it was suggested that the main players to determine cell characteristics during the processes of deterioration and recovery take turns among the three layers as follows: the shape of the time-based change in the efficiency comes different and is not saturating; as the efficiency decreases, the extent of the change increases in the diode factor and series resistance; and the path the deterioration takes differs from that the recovery takes. 2 refs., 12 figs.}
place = {Japan}
year = {1997}
month = {Nov}
}
title = {Change of the equivalent circuit constants accompanied by the degradation and recovery of efficiency on a-Si solar cells; A-Si taiyo denchi no koritsu no rekka to kaifuku ni tomonau toka kairo teisu no henka}
author = {Takahisa, K, Kojima, T, Nakamura, K, Koyanagi, T, and Yanagisawa, T}
abstractNote = {Investigations were given on how the equivalent circuit constants change when efficiency of amorphous silicon solar cells changes with time in light degradation and temperature recovery. In the experiment, light irradiation tests under a constant temperature and light intensity condition, followed by recovery tests under a constant temperature and constant weak light intensity or constant temperature condition were repeated continuously. According to the result of an experiment on single layer type cells, the change in each equivalent circuit constant in association with degradation in efficiency and file factor and variation in recovery is reversible mostly. However, a slightly irreversible component was recognized only in the initial degradation process in series resistance and diode factor values. With regard to stacked cells, it was suggested that the main players to determine cell characteristics during the processes of deterioration and recovery take turns among the three layers as follows: the shape of the time-based change in the efficiency comes different and is not saturating; as the efficiency decreases, the extent of the change increases in the diode factor and series resistance; and the path the deterioration takes differs from that the recovery takes. 2 refs., 12 figs.}
place = {Japan}
year = {1997}
month = {Nov}
}