You need JavaScript to view this

Stress measurement by x-ray diffractometry

Abstract

This invention relates to x-ray diffractometry and more particularly to apparatus and methods for the measurement of residual stress in polycrystalline, e.g. metallic, specimens. The procedure is based on measurement of the lattice strain of crystals by x-ray diffraction, in which change in the interplanar spacing of a set of crystal lattice planes due to strain causes a change in the diffraction angle of the scattered x-ray beam, from which latter change the magnitude of the strain can be determined. In a polycrystalline specimen, from well know relations for elastic behaviour in isotropic materials, the stress on a plane normal to a given direction in the surface has a component in the given direction which can be calculated from measurement of lattice strain in two directions in a plane containing the given direction and the normal to the specimen surface. In general three such stress components in three directions in the surface are required to determine the principal stresses and thus express the state of stress in the surface. (author). 2 tabs., 9 figs.
Authors:
Publication Date:
Oct 22, 1985
Product Type:
Patent
Report Number:
CA 1195786/A/
Reference Number:
SCA: 360103; 440101; PA: AIX-27:050330; EDB-96:106403; SN: 96001617307
Resource Relation:
Other Information: PBD: 22 Oct 1985
Subject:
36 MATERIALS SCIENCE; 44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; CRYSTAL LATTICES; RESIDUAL STRESSES; X-RAY DIFFRACTION; POLYCRYSTALS; STRESS ANALYSIS; X-RAY DIFFRACTOMETERS
OSTI ID:
256769
Research Organizations:
Department of Energy, Mines and Resources, Ottawa, ON (Canada)
Country of Origin:
Canada
Language:
English
Other Identifying Numbers:
Other: PAN: CA patent application 434049; TRN: CA9600132050330
Availability:
INIS
Submitting Site:
INIS
Size:
45 p.
Announcement Date:
Jul 31, 1996

Citation Formats

Mitchell, C M. Stress measurement by x-ray diffractometry. Canada: N. p., 1985. Web.
Mitchell, C M. Stress measurement by x-ray diffractometry. Canada.
Mitchell, C M. 1985. "Stress measurement by x-ray diffractometry." Canada.
@misc{etde_256769,
title = {Stress measurement by x-ray diffractometry}
author = {Mitchell, C M}
abstractNote = {This invention relates to x-ray diffractometry and more particularly to apparatus and methods for the measurement of residual stress in polycrystalline, e.g. metallic, specimens. The procedure is based on measurement of the lattice strain of crystals by x-ray diffraction, in which change in the interplanar spacing of a set of crystal lattice planes due to strain causes a change in the diffraction angle of the scattered x-ray beam, from which latter change the magnitude of the strain can be determined. In a polycrystalline specimen, from well know relations for elastic behaviour in isotropic materials, the stress on a plane normal to a given direction in the surface has a component in the given direction which can be calculated from measurement of lattice strain in two directions in a plane containing the given direction and the normal to the specimen surface. In general three such stress components in three directions in the surface are required to determine the principal stresses and thus express the state of stress in the surface. (author). 2 tabs., 9 figs.}
place = {Canada}
year = {1985}
month = {Oct}
}