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Elemental analysis of soil samples using thick target-particle induced X-ray emission (Tt-PIXE) technique

Abstract

In this work thick target-proton induced X-ray emission (TT-PIXE) technique has been employed for the elemental analysis of soil samples collected from Budha nullah region of Ludhiana city, Punjab. TT-PIXE analysis of samples has been carried out using 3 MeV proton beam from 3 UD pelletron (9SDH2 from NEC, USA) facility at the Institute of Physics (IOP), Bhubaneswar, Orissa. The emitted X-rays were detected using Si(Li) detector (CANBERRA US, FWHM = 180 eV at 5.9 keV) positioned at 90° to the beam line and using suitable electronics. The trace elements {sub 15}P, {sub 16}S, {sub 19}K, {sub 20}Ca, {sub 22}Ti, {sub 24}Cr, {sub 25}Mn, {sub 26}Fe, {sub 29}Cu, {sub 30}Zn, {sub 33}As, {sub 37}Rb, {sub 38}Sr, and {sub 82}Pb were quantified in the soil samples. The quantitative estimation of PIXE spectrum of the soil samples was performed using GUPIX computer code. The presence of {sub 24}Cr, {sub 33}As, and {sub 82}Pb toxic elements in soils is likely to be due to the pollution caused by seepage of the water at the breached locations of nullah. The present study brings to focus the need to improve the effluent treatment of the industrial wastes and repair of the breached Budha nullah. In  More>>
Authors:
Kumar, Sunil; Mehta, D., E-mail: sudridhsunil@gmail.com [1] 
  1. Department of Physics, Panjab University, Chandigarh (India)
Publication Date:
Feb 15, 2014
Product Type:
Journal Article
Resource Relation:
Journal Name: Journal of Nuclear Physics, Material Sciences, Radiation and Applications; Journal Volume: 1; Journal Issue: 2; Other Information: 21 refs., 6 figs., 2 tabs.
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; MULTI-ELEMENT ANALYSIS; PHOSPHORUS; PIXE ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; RUBIDIUM; STRONTIUM
OSTI ID:
22778578
Country of Origin:
India
Language:
English
Other Identifying Numbers:
Journal ID: ISSN 2321-9289; TRN: IN1900975021832
Availability:
Available from https://doi.org/10.15415/jnp.2014.11018
Submitting Site:
INIS
Size:
page(s) 225-237
Announcement Date:
Jul 07, 2020

Citation Formats

Kumar, Sunil, and Mehta, D., E-mail: sudridhsunil@gmail.com. Elemental analysis of soil samples using thick target-particle induced X-ray emission (Tt-PIXE) technique. India: N. p., 2014. Web. doi:10.15415/JNP.2014.12018.
Kumar, Sunil, & Mehta, D., E-mail: sudridhsunil@gmail.com. Elemental analysis of soil samples using thick target-particle induced X-ray emission (Tt-PIXE) technique. India. doi:10.15415/JNP.2014.12018.
Kumar, Sunil, and Mehta, D., E-mail: sudridhsunil@gmail.com. 2014. "Elemental analysis of soil samples using thick target-particle induced X-ray emission (Tt-PIXE) technique." India. doi:10.15415/JNP.2014.12018. https://www.osti.gov/servlets/purl/10.15415/JNP.2014.12018.
@misc{etde_22778578,
title = {Elemental analysis of soil samples using thick target-particle induced X-ray emission (Tt-PIXE) technique}
author = {Kumar, Sunil, and Mehta, D., E-mail: sudridhsunil@gmail.com}
abstractNote = {In this work thick target-proton induced X-ray emission (TT-PIXE) technique has been employed for the elemental analysis of soil samples collected from Budha nullah region of Ludhiana city, Punjab. TT-PIXE analysis of samples has been carried out using 3 MeV proton beam from 3 UD pelletron (9SDH2 from NEC, USA) facility at the Institute of Physics (IOP), Bhubaneswar, Orissa. The emitted X-rays were detected using Si(Li) detector (CANBERRA US, FWHM = 180 eV at 5.9 keV) positioned at 90° to the beam line and using suitable electronics. The trace elements {sub 15}P, {sub 16}S, {sub 19}K, {sub 20}Ca, {sub 22}Ti, {sub 24}Cr, {sub 25}Mn, {sub 26}Fe, {sub 29}Cu, {sub 30}Zn, {sub 33}As, {sub 37}Rb, {sub 38}Sr, and {sub 82}Pb were quantified in the soil samples. The quantitative estimation of PIXE spectrum of the soil samples was performed using GUPIX computer code. The presence of {sub 24}Cr, {sub 33}As, and {sub 82}Pb toxic elements in soils is likely to be due to the pollution caused by seepage of the water at the breached locations of nullah. The present study brings to focus the need to improve the effluent treatment of the industrial wastes and repair of the breached Budha nullah. In comparison to other analytical techniques for elemental analysis, PIXE is sensitive and its multi-elemental character brings advantage to investigators for the determination of minor and trace elements in a variety of soil samples. (author)}
doi = {10.15415/JNP.2014.12018}
journal = {Journal of Nuclear Physics, Material Sciences, Radiation and Applications}
issue = {2}
volume = {1}
journal type = {AC}
place = {India}
year = {2014}
month = {Feb}
}