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Controlled synthesis of hydroxyapatite-based coatings for biomedical application

Abstract

Here we report the controlled synthesis of hydroxyapatite (HAP) HAP/Ti-alloy composite thin films using pulsed laser deposition (PLD) technique. A KrF excimer laser (wavelength 248 nm, 25 ns pulse duration, 2-3 J/cm{sup 2}) was used to grow thin films at a base vacuum of {approx} 10{sup -6} mbar, and substrate temperatures ranging from room temperature to 500 deg. C. Films were deposited on Si (100) and Sapphire (0001) single crystal substrates. Selected films were annealed in air at 400 deg. C, or nitrogen/water vapor at 550 deg. C to study crystallization properties. Fourier transform infrared ipectroscopy (FTIR), x-ray diffraction (XRD), energy dispersive x-ray spectroscopy (EDS), and atomic force microscopy (AFM) characterization techniques were employed in the study of the films after deposition and after annealing. All as-deposited thin films were amorphous as seen by XRD and FTIR. AFM showed all films contained micron sized particles embedded into them. Density distribution and size of embedded particles was found to be much less for HAP/Ti-alloy composite thin films compared to pure HAP Films. In between the embedded particles the films were quite smooth. Root mean squared (RMS) roughness of pure HAP films was {approx} 100 nm and decreased to {approx} 50 nm  More>>
Authors:
Sygnatowicz, Michael; [1]  Tiwari, Ashutosh [1] 
  1. Nanostructured Materials Research Laboratory, Department of Materials Science and Engineering, University of Utah, Salt Lake City, Utah 84112-0560 (United States)
Publication Date:
Apr 30, 2009
Product Type:
Journal Article
Resource Relation:
Journal Name: Materials Science and Engineering. C, Biomimetic Materials, Sensors and Systems; Journal Volume: 29; Journal Issue: 3; Other Information: Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Subject:
36 MATERIALS SCIENCE; ANNEALING; APATITES; ATOMIC FORCE MICROSCOPY; COATINGS; COMPOSITE MATERIALS; CRYSTALLIZATION; ENERGY BEAM DEPOSITION; FOURIER TRANSFORMATION; INFRARED SPECTRA; KRYPTON FLUORIDE LASERS; LASER RADIATION; MONOCRYSTALS; PULSED IRRADIATION; SAPPHIRE; SYNTHESIS; THIN FILMS; TITANIUM ALLOYS; WATER VAPOR; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
OSTI ID:
22049645
Country of Origin:
Netherlands
Language:
English
Other Identifying Numbers:
Journal ID: ISSN 0928-4931; Other: PII: S0928-4931(08)00214-2; TRN: NL09S2560009640
Availability:
Available from http://dx.doi.org/10.1016/j.msec.2008.08.036
Submitting Site:
NLN
Size:
page(s) 1071-1076
Announcement Date:
Feb 14, 2013

Citation Formats

Sygnatowicz, Michael, and Tiwari, Ashutosh. Controlled synthesis of hydroxyapatite-based coatings for biomedical application. Netherlands: N. p., 2009. Web. doi:10.1016/J.MSEC.2008.08.036.
Sygnatowicz, Michael, & Tiwari, Ashutosh. Controlled synthesis of hydroxyapatite-based coatings for biomedical application. Netherlands. https://doi.org/10.1016/J.MSEC.2008.08.036
Sygnatowicz, Michael, and Tiwari, Ashutosh. 2009. "Controlled synthesis of hydroxyapatite-based coatings for biomedical application." Netherlands. https://doi.org/10.1016/J.MSEC.2008.08.036.
@misc{etde_22049645,
title = {Controlled synthesis of hydroxyapatite-based coatings for biomedical application}
author = {Sygnatowicz, Michael, and Tiwari, Ashutosh}
abstractNote = {Here we report the controlled synthesis of hydroxyapatite (HAP) HAP/Ti-alloy composite thin films using pulsed laser deposition (PLD) technique. A KrF excimer laser (wavelength 248 nm, 25 ns pulse duration, 2-3 J/cm{sup 2}) was used to grow thin films at a base vacuum of {approx} 10{sup -6} mbar, and substrate temperatures ranging from room temperature to 500 deg. C. Films were deposited on Si (100) and Sapphire (0001) single crystal substrates. Selected films were annealed in air at 400 deg. C, or nitrogen/water vapor at 550 deg. C to study crystallization properties. Fourier transform infrared ipectroscopy (FTIR), x-ray diffraction (XRD), energy dispersive x-ray spectroscopy (EDS), and atomic force microscopy (AFM) characterization techniques were employed in the study of the films after deposition and after annealing. All as-deposited thin films were amorphous as seen by XRD and FTIR. AFM showed all films contained micron sized particles embedded into them. Density distribution and size of embedded particles was found to be much less for HAP/Ti-alloy composite thin films compared to pure HAP Films. In between the embedded particles the films were quite smooth. Root mean squared (RMS) roughness of pure HAP films was {approx} 100 nm and decreased to {approx} 50 nm as Ti-alloy content increased. Film roughness in between particles remained smooth to within 1 nm. Annealing of thin films on Si (100) at 400 deg. C in air resulted in very limited crystallization. However, annealing of thin films on sapphire at 550 deg. C in nitrogen/water vapor resulted in significant crystallization as seen in both XRD and FTIR with the added features of probable texturing resulting in the prominent presence of (002), and (112) diffraction peaks.}
doi = {10.1016/J.MSEC.2008.08.036}
journal = []
issue = {3}
volume = {29}
journal type = {AC}
place = {Netherlands}
year = {2009}
month = {Apr}
}