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Bandgap engineering by substitution of S by Se in nanostructured ZnS{sub 1-x}Se{sub x} thin films grown by soft chemical route for nontoxic optoelectronic device applications

Abstract

Highlights: > ZnS{sub 1-x}Se{sub x} (x = 0 to 1) thin films are successfully deposited on glass substrates by soft chemical route. > Structural, optical and electrical properties are studied. > Change in band gap, crystallite size and resistivity is noted with change in S:Se ratio. > Wide band gap material (ZnS{sub 1-x}Se{sub x}) is useful for photosensor and solar cell applications. > It utilizes whole visible light spectrum and is a best alternative to conventionally used toxic CdS. - Abstract: Thin films of nanostructured ZnS{sub 1-x}Se{sub x} with optimized growth parameters were prepared by soft chemical route on glass substrates. Ammonia free precursors were used at 80 deg. C constant bath temperature. The ratio of sulphur to selenium was changed continuously by changing the composition x (0-1), while atomic concentration of zinc was kept constant. Structure, composition and surface morphology of as-deposited films were characterized by X-ray diffraction (XRD), energy dispersive X-ray analysis (EDAX) and scanning electron microscopy (SEM), atomic force microscopy (AFM) respectively. XRD studies revealed that as-deposited films were nanostructured in nature with cubic zinc blended structure. It was further observed that the preferred orientations are along (1 1 1) plane and crystallite size decreased with increase  More>>
Authors:
Sadekar, Harishchandra K; [1]  Department of Physics, Arts, Commerce and Science College, Sonai 414105, Maharashtra (India)]; Ghule, Anil Vithal; [2]  Sharma, Ramphal [1] 
  1. Thin Film and Nanotechnology Laboratory, Department of Physics, Dr. Babasaheb Ambedkar Marathwada University, Aurangabad 431004, Maharashtra (India)
  2. Department of Nanotechnology, Dr. Babasaheb Ambedkar Marathwada University, Aurangabad 431004, Maharashtra (India)
Publication Date:
May 05, 2011
Product Type:
Journal Article
Resource Relation:
Journal Name: Journal of Alloys and Compounds; Journal Volume: 509; Journal Issue: 18; Other Information: DOI: 10.1016/j.jallcom.2011.02.089; PII: S0925-8388(11)00423-3; Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.
Subject:
36 MATERIALS SCIENCE; AMMONIA; ATOMIC FORCE MICROSCOPY; CADMIUM SULFIDES; CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; GLASS; GRAIN ORIENTATION; NANOSTRUCTURES; PHOTOSENSITIVITY; SCANNING ELECTRON MICROSCOPY; SELENIUM; SOLAR CELLS; SUBSTRATES; THIN FILMS; TOXIC MATERIALS; X RADIATION; X-RAY DIFFRACTION; ZINC; CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIRECT ENERGY CONVERTERS; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; EQUIPMENT; FILMS; HAZARDOUS MATERIALS; HYDRIDES; HYDROGEN COMPOUNDS; INORGANIC PHOSPHORS; IONIZING RADIATIONS; MATERIALS; METALS; MICROSCOPY; MICROSTRUCTURE; NITROGEN COMPOUNDS; NITROGEN HYDRIDES; ORIENTATION; PHOSPHORS; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SEMIMETALS; SENSITIVITY; SOLAR EQUIPMENT; SULFIDES; SULFUR COMPOUNDS
OSTI ID:
21531493
Country of Origin:
Netherlands
Language:
English
Other Identifying Numbers:
Journal ID: ISSN 0925-8388; JALCEU; TRN: NL11R1460011011
Availability:
Available from http://dx.doi.org/10.1016/j.jallcom.2011.02.089
Submitting Site:
NLN
Size:
page(s) 5525-5531
Announcement Date:
Mar 19, 2012

Citation Formats

Sadekar, Harishchandra K, Department of Physics, Arts, Commerce and Science College, Sonai 414105, Maharashtra (India)], Ghule, Anil Vithal, and Sharma, Ramphal. Bandgap engineering by substitution of S by Se in nanostructured ZnS{sub 1-x}Se{sub x} thin films grown by soft chemical route for nontoxic optoelectronic device applications. Netherlands: N. p., 2011. Web. doi:10.1016/j.jallcom.2011.02.089.
Sadekar, Harishchandra K, Department of Physics, Arts, Commerce and Science College, Sonai 414105, Maharashtra (India)], Ghule, Anil Vithal, & Sharma, Ramphal. Bandgap engineering by substitution of S by Se in nanostructured ZnS{sub 1-x}Se{sub x} thin films grown by soft chemical route for nontoxic optoelectronic device applications. Netherlands. https://doi.org/10.1016/j.jallcom.2011.02.089
Sadekar, Harishchandra K, Department of Physics, Arts, Commerce and Science College, Sonai 414105, Maharashtra (India)], Ghule, Anil Vithal, and Sharma, Ramphal. 2011. "Bandgap engineering by substitution of S by Se in nanostructured ZnS{sub 1-x}Se{sub x} thin films grown by soft chemical route for nontoxic optoelectronic device applications." Netherlands. https://doi.org/10.1016/j.jallcom.2011.02.089.
@misc{etde_21531493,
title = {Bandgap engineering by substitution of S by Se in nanostructured ZnS{sub 1-x}Se{sub x} thin films grown by soft chemical route for nontoxic optoelectronic device applications}
author = {Sadekar, Harishchandra K, Department of Physics, Arts, Commerce and Science College, Sonai 414105, Maharashtra (India)], Ghule, Anil Vithal, and Sharma, Ramphal}
abstractNote = {Highlights: > ZnS{sub 1-x}Se{sub x} (x = 0 to 1) thin films are successfully deposited on glass substrates by soft chemical route. > Structural, optical and electrical properties are studied. > Change in band gap, crystallite size and resistivity is noted with change in S:Se ratio. > Wide band gap material (ZnS{sub 1-x}Se{sub x}) is useful for photosensor and solar cell applications. > It utilizes whole visible light spectrum and is a best alternative to conventionally used toxic CdS. - Abstract: Thin films of nanostructured ZnS{sub 1-x}Se{sub x} with optimized growth parameters were prepared by soft chemical route on glass substrates. Ammonia free precursors were used at 80 deg. C constant bath temperature. The ratio of sulphur to selenium was changed continuously by changing the composition x (0-1), while atomic concentration of zinc was kept constant. Structure, composition and surface morphology of as-deposited films were characterized by X-ray diffraction (XRD), energy dispersive X-ray analysis (EDAX) and scanning electron microscopy (SEM), atomic force microscopy (AFM) respectively. XRD studies revealed that as-deposited films were nanostructured in nature with cubic zinc blended structure. It was further observed that the preferred orientations are along (1 1 1) plane and crystallite size decreased with increase in the value of x. SEM and AFM images revealed that films were uniform and pinhole free. The optical band gap (E{sub g}) was calculated from the observed transmittance spectra by Urbach method. It was found that the band gap varied linearly from 3.71 to 2.70 eV, as composition x varies 0-1. The electrical properties' study revealed that the decrease in resistivity and increase in photosensitivity, as composition x varied 0-1. The observed interesting properties of ZnS{sub 1-x}Se{sub x} thin films justified their significance in optoelectronic device fabrication and applications, and as an environment friendly alternative to the commonly used toxic material such as CdS.}
doi = {10.1016/j.jallcom.2011.02.089}
journal = []
issue = {18}
volume = {509}
place = {Netherlands}
year = {2011}
month = {May}
}