Abstract
This document gathers the resumes of some of the presentations made at this conference whose aim was to present the last developments and achievements of the 3 complementary microscopies: optical microscopy, electron microscopy and X-ray microscopy. The contributions have been organized around the following 12 topics: 1) new technical developments, 2) 3-dimensional imaging, 3) quantitative microscopy, 4) technical progress in photon microscopy, 5) synchrotron radiation, 6) measurements of patterns, deformations and strains, 7) materials for energy and transports, 8) nano-structures, 9) virus: structure and infection mechanisms, 10) 3-dimensional imaging for molecules, cells and cellular tissues, 11) nano-particles and colloids, and 12) liquid crystals.
Thibault-Penisson, J;
Cremer, Ch;
Susini, J;
Kirklanda, A I;
Rigneault, H;
Renault, O;
Bailly, A;
Zagonel, L F;
Barrett, N;
Bogner, A;
Gauthier, C;
Jouneau, P H;
Thollet, G;
Fuchs, G;
Basset, D;
Deconihout, B;
Vurpillot, F;
Vella, A;
Matthieu, G;
Cadel, E;
Bostel, A;
Blavette, D;
Baumeister, W;
Usson, Y;
Zaefferer, St;
Laffont, L;
Weyland, M;
Thomas, J M;
Midgley, P;
Benlekbir, S;
Epicier, Th;
Diop, B N;
Roux, St;
Ou, M;
Perriat, P;
Bausach, M;
Aouine, M;
Berhault, G;
Idrissi, H;
Cottevieille, M;
Jonic, S;
Larquet, E;
Svergun, D;
Vannoni, M A;
Boisset, N;
Ersena, O;
Werckmann, J;
Ulhaq, C;
Hirlimann, Ch;
Tihay, F;
Cuong, Pham-Huu;
Crucifix, C;
Schultz, P;
Jornsanoha, P;
Thollet, G;
Masenelli-Varlot, K;
Gauthier, C;
Ludwig, W;
King, A;
Johnson, G;
Gonzalves-Hoennicke, M;
Reischig, P;
Messaoudi, C;
Ibrahim, R;
Marco, S;
Klie, R F;
Zhao, Y;
Yang, G;
Zhu, Y;
Hue, F;
Hytch, M;
Hartmann, J M;
Bogumilowicz, Y;
Claverie, A;
Klein, H;
Alloyeau, D;
Ricolleau, C;
Langlois, C;
Le Bouar, Y;
Loiseau, A;
Colliex, C;
Stephan, O;
Kociak, M;
Tence, M;
Gloter, A;
Imhoff, D;
Walls, M;
Nelayah, J;
March, K;
Couillard, M;
Ailliot, C;
Bertin, F;
Cooper, D;
Rivallin, P;
Dumelie, N;
Benhayoune, H;
Balossier, G;
Cheynet, M;
Pokrant, S;
Tichelaar, F;
Rouviere, J L;
Cooper, D;
Truche, R;
Chabli, A;
Debili, M Y;
Houdellier, F;
Warot-Fonrose, B;
Hytch, M J;
Snoeck, E;
Calmels, L;
Serin, V;
Schattschneider, P;
Jacob, D;
Cordier, P
Citation Formats
Thibault-Penisson, J, Cremer, Ch, Susini, J, Kirklanda, A I, Rigneault, H, Renault, O, Bailly, A, Zagonel, L F, Barrett, N, Bogner, A, Gauthier, C, Jouneau, P H, Thollet, G, Fuchs, G, Basset, D, Deconihout, B, Vurpillot, F, Vella, A, Matthieu, G, Cadel, E, Bostel, A, Blavette, D, Baumeister, W, Usson, Y, Zaefferer, St, Laffont, L, Weyland, M, Thomas, J M, Midgley, P, Benlekbir, S, Epicier, Th, Diop, B N, Roux, St, Ou, M, Perriat, P, Bausach, M, Aouine, M, Berhault, G, Idrissi, H, Cottevieille, M, Jonic, S, Larquet, E, Svergun, D, Vannoni, M A, Boisset, N, Ersena, O, Werckmann, J, Ulhaq, C, Hirlimann, Ch, Tihay, F, Cuong, Pham-Huu, Crucifix, C, Schultz, P, Jornsanoha, P, Thollet, G, Masenelli-Varlot, K, Gauthier, C, Ludwig, W, King, A, Johnson, G, Gonzalves-Hoennicke, M, Reischig, P, Messaoudi, C, Ibrahim, R, Marco, S, Klie, R F, Zhao, Y, Yang, G, Zhu, Y, Hue, F, Hytch, M, Hartmann, J M, Bogumilowicz, Y, Claverie, A, Klein, H, Alloyeau, D, Ricolleau, C, Langlois, C, Le Bouar, Y, Loiseau, A, Colliex, C, Stephan, O, Kociak, M, Tence, M, Gloter, A, Imhoff, D, Walls, M, Nelayah, J, March, K, Couillard, M, Ailliot, C, Bertin, F, Cooper, D, Rivallin, P, Dumelie, N, Benhayoune, H, Balossier, G, Cheynet, M, Pokrant, S, Tichelaar, F, Rouviere, J L, Cooper, D, Truche, R, Chabli, A, Debili, M Y, Houdellier, F, Warot-Fonrose, B, Hytch, M J, Snoeck, E, Calmels, L, Serin, V, Schattschneider, P, Jacob, D, and Cordier, P.
French Society of Microscopy, 10. conference; Societe Francaise des Microscopies, 10. colloque.
France: N. p.,
2007.
Web.
Thibault-Penisson, J, Cremer, Ch, Susini, J, Kirklanda, A I, Rigneault, H, Renault, O, Bailly, A, Zagonel, L F, Barrett, N, Bogner, A, Gauthier, C, Jouneau, P H, Thollet, G, Fuchs, G, Basset, D, Deconihout, B, Vurpillot, F, Vella, A, Matthieu, G, Cadel, E, Bostel, A, Blavette, D, Baumeister, W, Usson, Y, Zaefferer, St, Laffont, L, Weyland, M, Thomas, J M, Midgley, P, Benlekbir, S, Epicier, Th, Diop, B N, Roux, St, Ou, M, Perriat, P, Bausach, M, Aouine, M, Berhault, G, Idrissi, H, Cottevieille, M, Jonic, S, Larquet, E, Svergun, D, Vannoni, M A, Boisset, N, Ersena, O, Werckmann, J, Ulhaq, C, Hirlimann, Ch, Tihay, F, Cuong, Pham-Huu, Crucifix, C, Schultz, P, Jornsanoha, P, Thollet, G, Masenelli-Varlot, K, Gauthier, C, Ludwig, W, King, A, Johnson, G, Gonzalves-Hoennicke, M, Reischig, P, Messaoudi, C, Ibrahim, R, Marco, S, Klie, R F, Zhao, Y, Yang, G, Zhu, Y, Hue, F, Hytch, M, Hartmann, J M, Bogumilowicz, Y, Claverie, A, Klein, H, Alloyeau, D, Ricolleau, C, Langlois, C, Le Bouar, Y, Loiseau, A, Colliex, C, Stephan, O, Kociak, M, Tence, M, Gloter, A, Imhoff, D, Walls, M, Nelayah, J, March, K, Couillard, M, Ailliot, C, Bertin, F, Cooper, D, Rivallin, P, Dumelie, N, Benhayoune, H, Balossier, G, Cheynet, M, Pokrant, S, Tichelaar, F, Rouviere, J L, Cooper, D, Truche, R, Chabli, A, Debili, M Y, Houdellier, F, Warot-Fonrose, B, Hytch, M J, Snoeck, E, Calmels, L, Serin, V, Schattschneider, P, Jacob, D, & Cordier, P.
French Society of Microscopy, 10. conference; Societe Francaise des Microscopies, 10. colloque.
France.
Thibault-Penisson, J, Cremer, Ch, Susini, J, Kirklanda, A I, Rigneault, H, Renault, O, Bailly, A, Zagonel, L F, Barrett, N, Bogner, A, Gauthier, C, Jouneau, P H, Thollet, G, Fuchs, G, Basset, D, Deconihout, B, Vurpillot, F, Vella, A, Matthieu, G, Cadel, E, Bostel, A, Blavette, D, Baumeister, W, Usson, Y, Zaefferer, St, Laffont, L, Weyland, M, Thomas, J M, Midgley, P, Benlekbir, S, Epicier, Th, Diop, B N, Roux, St, Ou, M, Perriat, P, Bausach, M, Aouine, M, Berhault, G, Idrissi, H, Cottevieille, M, Jonic, S, Larquet, E, Svergun, D, Vannoni, M A, Boisset, N, Ersena, O, Werckmann, J, Ulhaq, C, Hirlimann, Ch, Tihay, F, Cuong, Pham-Huu, Crucifix, C, Schultz, P, Jornsanoha, P, Thollet, G, Masenelli-Varlot, K, Gauthier, C, Ludwig, W, King, A, Johnson, G, Gonzalves-Hoennicke, M, Reischig, P, Messaoudi, C, Ibrahim, R, Marco, S, Klie, R F, Zhao, Y, Yang, G, Zhu, Y, Hue, F, Hytch, M, Hartmann, J M, Bogumilowicz, Y, Claverie, A, Klein, H, Alloyeau, D, Ricolleau, C, Langlois, C, Le Bouar, Y, Loiseau, A, Colliex, C, Stephan, O, Kociak, M, Tence, M, Gloter, A, Imhoff, D, Walls, M, Nelayah, J, March, K, Couillard, M, Ailliot, C, Bertin, F, Cooper, D, Rivallin, P, Dumelie, N, Benhayoune, H, Balossier, G, Cheynet, M, Pokrant, S, Tichelaar, F, Rouviere, J L, Cooper, D, Truche, R, Chabli, A, Debili, M Y, Houdellier, F, Warot-Fonrose, B, Hytch, M J, Snoeck, E, Calmels, L, Serin, V, Schattschneider, P, Jacob, D, and Cordier, P.
2007.
"French Society of Microscopy, 10. conference; Societe Francaise des Microscopies, 10. colloque."
France.
@misc{etde_21100399,
title = {French Society of Microscopy, 10. conference; Societe Francaise des Microscopies, 10. colloque}
author = {Thibault-Penisson, J, Cremer, Ch, Susini, J, Kirklanda, A I, Rigneault, H, Renault, O, Bailly, A, Zagonel, L F, Barrett, N, Bogner, A, Gauthier, C, Jouneau, P H, Thollet, G, Fuchs, G, Basset, D, Deconihout, B, Vurpillot, F, Vella, A, Matthieu, G, Cadel, E, Bostel, A, Blavette, D, Baumeister, W, Usson, Y, Zaefferer, St, Laffont, L, Weyland, M, Thomas, J M, Midgley, P, Benlekbir, S, Epicier, Th, Diop, B N, Roux, St, Ou, M, Perriat, P, Bausach, M, Aouine, M, Berhault, G, Idrissi, H, Cottevieille, M, Jonic, S, Larquet, E, Svergun, D, Vannoni, M A, Boisset, N, Ersena, O, Werckmann, J, Ulhaq, C, Hirlimann, Ch, Tihay, F, Cuong, Pham-Huu, Crucifix, C, Schultz, P, Jornsanoha, P, Thollet, G, Masenelli-Varlot, K, Gauthier, C, Ludwig, W, King, A, Johnson, G, Gonzalves-Hoennicke, M, Reischig, P, Messaoudi, C, Ibrahim, R, Marco, S, Klie, R F, Zhao, Y, Yang, G, Zhu, Y, Hue, F, Hytch, M, Hartmann, J M, Bogumilowicz, Y, Claverie, A, Klein, H, Alloyeau, D, Ricolleau, C, Langlois, C, Le Bouar, Y, Loiseau, A, Colliex, C, Stephan, O, Kociak, M, Tence, M, Gloter, A, Imhoff, D, Walls, M, Nelayah, J, March, K, Couillard, M, Ailliot, C, Bertin, F, Cooper, D, Rivallin, P, Dumelie, N, Benhayoune, H, Balossier, G, Cheynet, M, Pokrant, S, Tichelaar, F, Rouviere, J L, Cooper, D, Truche, R, Chabli, A, Debili, M Y, Houdellier, F, Warot-Fonrose, B, Hytch, M J, Snoeck, E, Calmels, L, Serin, V, Schattschneider, P, Jacob, D, and Cordier, P}
abstractNote = {This document gathers the resumes of some of the presentations made at this conference whose aim was to present the last developments and achievements of the 3 complementary microscopies: optical microscopy, electron microscopy and X-ray microscopy. The contributions have been organized around the following 12 topics: 1) new technical developments, 2) 3-dimensional imaging, 3) quantitative microscopy, 4) technical progress in photon microscopy, 5) synchrotron radiation, 6) measurements of patterns, deformations and strains, 7) materials for energy and transports, 8) nano-structures, 9) virus: structure and infection mechanisms, 10) 3-dimensional imaging for molecules, cells and cellular tissues, 11) nano-particles and colloids, and 12) liquid crystals.}
place = {France}
year = {2007}
month = {Jul}
}
title = {French Society of Microscopy, 10. conference; Societe Francaise des Microscopies, 10. colloque}
author = {Thibault-Penisson, J, Cremer, Ch, Susini, J, Kirklanda, A I, Rigneault, H, Renault, O, Bailly, A, Zagonel, L F, Barrett, N, Bogner, A, Gauthier, C, Jouneau, P H, Thollet, G, Fuchs, G, Basset, D, Deconihout, B, Vurpillot, F, Vella, A, Matthieu, G, Cadel, E, Bostel, A, Blavette, D, Baumeister, W, Usson, Y, Zaefferer, St, Laffont, L, Weyland, M, Thomas, J M, Midgley, P, Benlekbir, S, Epicier, Th, Diop, B N, Roux, St, Ou, M, Perriat, P, Bausach, M, Aouine, M, Berhault, G, Idrissi, H, Cottevieille, M, Jonic, S, Larquet, E, Svergun, D, Vannoni, M A, Boisset, N, Ersena, O, Werckmann, J, Ulhaq, C, Hirlimann, Ch, Tihay, F, Cuong, Pham-Huu, Crucifix, C, Schultz, P, Jornsanoha, P, Thollet, G, Masenelli-Varlot, K, Gauthier, C, Ludwig, W, King, A, Johnson, G, Gonzalves-Hoennicke, M, Reischig, P, Messaoudi, C, Ibrahim, R, Marco, S, Klie, R F, Zhao, Y, Yang, G, Zhu, Y, Hue, F, Hytch, M, Hartmann, J M, Bogumilowicz, Y, Claverie, A, Klein, H, Alloyeau, D, Ricolleau, C, Langlois, C, Le Bouar, Y, Loiseau, A, Colliex, C, Stephan, O, Kociak, M, Tence, M, Gloter, A, Imhoff, D, Walls, M, Nelayah, J, March, K, Couillard, M, Ailliot, C, Bertin, F, Cooper, D, Rivallin, P, Dumelie, N, Benhayoune, H, Balossier, G, Cheynet, M, Pokrant, S, Tichelaar, F, Rouviere, J L, Cooper, D, Truche, R, Chabli, A, Debili, M Y, Houdellier, F, Warot-Fonrose, B, Hytch, M J, Snoeck, E, Calmels, L, Serin, V, Schattschneider, P, Jacob, D, and Cordier, P}
abstractNote = {This document gathers the resumes of some of the presentations made at this conference whose aim was to present the last developments and achievements of the 3 complementary microscopies: optical microscopy, electron microscopy and X-ray microscopy. The contributions have been organized around the following 12 topics: 1) new technical developments, 2) 3-dimensional imaging, 3) quantitative microscopy, 4) technical progress in photon microscopy, 5) synchrotron radiation, 6) measurements of patterns, deformations and strains, 7) materials for energy and transports, 8) nano-structures, 9) virus: structure and infection mechanisms, 10) 3-dimensional imaging for molecules, cells and cellular tissues, 11) nano-particles and colloids, and 12) liquid crystals.}
place = {France}
year = {2007}
month = {Jul}
}