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French Society of Microscopy, 10. conference; Societe Francaise des Microscopies, 10. colloque

Abstract

This document gathers the resumes of some of the presentations made at this conference whose aim was to present the last developments and achievements of the 3 complementary microscopies: optical microscopy, electron microscopy and X-ray microscopy. The contributions have been organized around the following 12 topics: 1) new technical developments, 2) 3-dimensional imaging, 3) quantitative microscopy, 4) technical progress in photon microscopy, 5) synchrotron radiation, 6) measurements of patterns, deformations and strains, 7) materials for energy and transports, 8) nano-structures, 9) virus: structure and infection mechanisms, 10) 3-dimensional imaging for molecules, cells and cellular tissues, 11) nano-particles and colloids, and 12) liquid crystals.
Publication Date:
Jul 01, 2007
Product Type:
Conference
Report Number:
INIS-FR-08-1058
Resource Relation:
Conference: 10. Conference of French Society of Microscopy, 10. colloque Societe Francaise des Microscopies, Grenoble (France), 5-8 Jun 2007
Subject:
36 MATERIALS SCIENCE; DEFORMATION; ELECTRON MICROSCOPY; LIQUID CRYSTALS; MOLECULAR STRUCTURE; NANOSTRUCTURES; OPTICAL MICROSCOPY; STRAINS; STRESSES; SYNCHROTRON RADIATION; TECHNOLOGY ASSESSMENT; USES; X-RAY SPECTROSCOPY
OSTI ID:
21100399
Research Organizations:
Societe Francaise des Microscopies, SFU, 75 - Paris (France)
Country of Origin:
France
Language:
English; French
Other Identifying Numbers:
TRN: FR0800994110493
Availability:
Available from INIS in electronic form
Submitting Site:
FRN
Size:
346 pages
Announcement Date:
Dec 05, 2008

Citation Formats

Thibault-Penisson, J, Cremer, Ch, Susini, J, Kirklanda, A I, Rigneault, H, Renault, O, Bailly, A, Zagonel, L F, Barrett, N, Bogner, A, Gauthier, C, Jouneau, P H, Thollet, G, Fuchs, G, Basset, D, Deconihout, B, Vurpillot, F, Vella, A, Matthieu, G, Cadel, E, Bostel, A, Blavette, D, Baumeister, W, Usson, Y, Zaefferer, St, Laffont, L, Weyland, M, Thomas, J M, Midgley, P, Benlekbir, S, Epicier, Th, Diop, B N, Roux, St, Ou, M, Perriat, P, Bausach, M, Aouine, M, Berhault, G, Idrissi, H, Cottevieille, M, Jonic, S, Larquet, E, Svergun, D, Vannoni, M A, Boisset, N, Ersena, O, Werckmann, J, Ulhaq, C, Hirlimann, Ch, Tihay, F, Cuong, Pham-Huu, Crucifix, C, Schultz, P, Jornsanoha, P, Thollet, G, Masenelli-Varlot, K, Gauthier, C, Ludwig, W, King, A, Johnson, G, Gonzalves-Hoennicke, M, Reischig, P, Messaoudi, C, Ibrahim, R, Marco, S, Klie, R F, Zhao, Y, Yang, G, Zhu, Y, Hue, F, Hytch, M, Hartmann, J M, Bogumilowicz, Y, Claverie, A, Klein, H, Alloyeau, D, Ricolleau, C, Langlois, C, Le Bouar, Y, Loiseau, A, Colliex, C, Stephan, O, Kociak, M, Tence, M, Gloter, A, Imhoff, D, Walls, M, Nelayah, J, March, K, Couillard, M, Ailliot, C, Bertin, F, Cooper, D, Rivallin, P, Dumelie, N, Benhayoune, H, Balossier, G, Cheynet, M, Pokrant, S, Tichelaar, F, Rouviere, J L, Cooper, D, Truche, R, Chabli, A, Debili, M Y, Houdellier, F, Warot-Fonrose, B, Hytch, M J, Snoeck, E, Calmels, L, Serin, V, Schattschneider, P, Jacob, D, and Cordier, P. French Society of Microscopy, 10. conference; Societe Francaise des Microscopies, 10. colloque. France: N. p., 2007. Web.
Thibault-Penisson, J, Cremer, Ch, Susini, J, Kirklanda, A I, Rigneault, H, Renault, O, Bailly, A, Zagonel, L F, Barrett, N, Bogner, A, Gauthier, C, Jouneau, P H, Thollet, G, Fuchs, G, Basset, D, Deconihout, B, Vurpillot, F, Vella, A, Matthieu, G, Cadel, E, Bostel, A, Blavette, D, Baumeister, W, Usson, Y, Zaefferer, St, Laffont, L, Weyland, M, Thomas, J M, Midgley, P, Benlekbir, S, Epicier, Th, Diop, B N, Roux, St, Ou, M, Perriat, P, Bausach, M, Aouine, M, Berhault, G, Idrissi, H, Cottevieille, M, Jonic, S, Larquet, E, Svergun, D, Vannoni, M A, Boisset, N, Ersena, O, Werckmann, J, Ulhaq, C, Hirlimann, Ch, Tihay, F, Cuong, Pham-Huu, Crucifix, C, Schultz, P, Jornsanoha, P, Thollet, G, Masenelli-Varlot, K, Gauthier, C, Ludwig, W, King, A, Johnson, G, Gonzalves-Hoennicke, M, Reischig, P, Messaoudi, C, Ibrahim, R, Marco, S, Klie, R F, Zhao, Y, Yang, G, Zhu, Y, Hue, F, Hytch, M, Hartmann, J M, Bogumilowicz, Y, Claverie, A, Klein, H, Alloyeau, D, Ricolleau, C, Langlois, C, Le Bouar, Y, Loiseau, A, Colliex, C, Stephan, O, Kociak, M, Tence, M, Gloter, A, Imhoff, D, Walls, M, Nelayah, J, March, K, Couillard, M, Ailliot, C, Bertin, F, Cooper, D, Rivallin, P, Dumelie, N, Benhayoune, H, Balossier, G, Cheynet, M, Pokrant, S, Tichelaar, F, Rouviere, J L, Cooper, D, Truche, R, Chabli, A, Debili, M Y, Houdellier, F, Warot-Fonrose, B, Hytch, M J, Snoeck, E, Calmels, L, Serin, V, Schattschneider, P, Jacob, D, & Cordier, P. French Society of Microscopy, 10. conference; Societe Francaise des Microscopies, 10. colloque. France.
Thibault-Penisson, J, Cremer, Ch, Susini, J, Kirklanda, A I, Rigneault, H, Renault, O, Bailly, A, Zagonel, L F, Barrett, N, Bogner, A, Gauthier, C, Jouneau, P H, Thollet, G, Fuchs, G, Basset, D, Deconihout, B, Vurpillot, F, Vella, A, Matthieu, G, Cadel, E, Bostel, A, Blavette, D, Baumeister, W, Usson, Y, Zaefferer, St, Laffont, L, Weyland, M, Thomas, J M, Midgley, P, Benlekbir, S, Epicier, Th, Diop, B N, Roux, St, Ou, M, Perriat, P, Bausach, M, Aouine, M, Berhault, G, Idrissi, H, Cottevieille, M, Jonic, S, Larquet, E, Svergun, D, Vannoni, M A, Boisset, N, Ersena, O, Werckmann, J, Ulhaq, C, Hirlimann, Ch, Tihay, F, Cuong, Pham-Huu, Crucifix, C, Schultz, P, Jornsanoha, P, Thollet, G, Masenelli-Varlot, K, Gauthier, C, Ludwig, W, King, A, Johnson, G, Gonzalves-Hoennicke, M, Reischig, P, Messaoudi, C, Ibrahim, R, Marco, S, Klie, R F, Zhao, Y, Yang, G, Zhu, Y, Hue, F, Hytch, M, Hartmann, J M, Bogumilowicz, Y, Claverie, A, Klein, H, Alloyeau, D, Ricolleau, C, Langlois, C, Le Bouar, Y, Loiseau, A, Colliex, C, Stephan, O, Kociak, M, Tence, M, Gloter, A, Imhoff, D, Walls, M, Nelayah, J, March, K, Couillard, M, Ailliot, C, Bertin, F, Cooper, D, Rivallin, P, Dumelie, N, Benhayoune, H, Balossier, G, Cheynet, M, Pokrant, S, Tichelaar, F, Rouviere, J L, Cooper, D, Truche, R, Chabli, A, Debili, M Y, Houdellier, F, Warot-Fonrose, B, Hytch, M J, Snoeck, E, Calmels, L, Serin, V, Schattschneider, P, Jacob, D, and Cordier, P. 2007. "French Society of Microscopy, 10. conference; Societe Francaise des Microscopies, 10. colloque." France.
@misc{etde_21100399,
title = {French Society of Microscopy, 10. conference; Societe Francaise des Microscopies, 10. colloque}
author = {Thibault-Penisson, J, Cremer, Ch, Susini, J, Kirklanda, A I, Rigneault, H, Renault, O, Bailly, A, Zagonel, L F, Barrett, N, Bogner, A, Gauthier, C, Jouneau, P H, Thollet, G, Fuchs, G, Basset, D, Deconihout, B, Vurpillot, F, Vella, A, Matthieu, G, Cadel, E, Bostel, A, Blavette, D, Baumeister, W, Usson, Y, Zaefferer, St, Laffont, L, Weyland, M, Thomas, J M, Midgley, P, Benlekbir, S, Epicier, Th, Diop, B N, Roux, St, Ou, M, Perriat, P, Bausach, M, Aouine, M, Berhault, G, Idrissi, H, Cottevieille, M, Jonic, S, Larquet, E, Svergun, D, Vannoni, M A, Boisset, N, Ersena, O, Werckmann, J, Ulhaq, C, Hirlimann, Ch, Tihay, F, Cuong, Pham-Huu, Crucifix, C, Schultz, P, Jornsanoha, P, Thollet, G, Masenelli-Varlot, K, Gauthier, C, Ludwig, W, King, A, Johnson, G, Gonzalves-Hoennicke, M, Reischig, P, Messaoudi, C, Ibrahim, R, Marco, S, Klie, R F, Zhao, Y, Yang, G, Zhu, Y, Hue, F, Hytch, M, Hartmann, J M, Bogumilowicz, Y, Claverie, A, Klein, H, Alloyeau, D, Ricolleau, C, Langlois, C, Le Bouar, Y, Loiseau, A, Colliex, C, Stephan, O, Kociak, M, Tence, M, Gloter, A, Imhoff, D, Walls, M, Nelayah, J, March, K, Couillard, M, Ailliot, C, Bertin, F, Cooper, D, Rivallin, P, Dumelie, N, Benhayoune, H, Balossier, G, Cheynet, M, Pokrant, S, Tichelaar, F, Rouviere, J L, Cooper, D, Truche, R, Chabli, A, Debili, M Y, Houdellier, F, Warot-Fonrose, B, Hytch, M J, Snoeck, E, Calmels, L, Serin, V, Schattschneider, P, Jacob, D, and Cordier, P}
abstractNote = {This document gathers the resumes of some of the presentations made at this conference whose aim was to present the last developments and achievements of the 3 complementary microscopies: optical microscopy, electron microscopy and X-ray microscopy. The contributions have been organized around the following 12 topics: 1) new technical developments, 2) 3-dimensional imaging, 3) quantitative microscopy, 4) technical progress in photon microscopy, 5) synchrotron radiation, 6) measurements of patterns, deformations and strains, 7) materials for energy and transports, 8) nano-structures, 9) virus: structure and infection mechanisms, 10) 3-dimensional imaging for molecules, cells and cellular tissues, 11) nano-particles and colloids, and 12) liquid crystals.}
place = {France}
year = {2007}
month = {Jul}
}