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The application of {beta}-ray excitation fluorescence to the measurement of the thickness of deposits and to analysis; Applications de la fluorescence excitee au moyen des rayons {beta} a la mesure des epaisseurs des depots et a l'analyse

Abstract

Principles of the method are first outlined and the instrumentation used is described. The different types of radiation detectors are subject of a detailed study. As a source of {beta}-radiation {sup 90}(Sr + Y) was used as well as {sup 147}Pm. Great care was taken to eliminate back-diffused electrons by deflection by a strong permanent magnet. The method was applied to the measurement of the thickness of deposits of Cr, Zn, Sn, Cd and Cu on iron as well as Zn, Cr, Ag and Au on copper and the results obtained are discussed. An attempt was made, to use {beta}-X-ray fluorescence for the analysis of minerals, iron ore and glass and for routine control of Si-Mn, Si-Ca, Fe-Mn and Fe-W. Finally the method of {beta}-X-ray fluorescence is compared with normal-X-ray fluorescence and possibilities of further development are cited. (author) [French] Les principes de la methode et l'instrumentation utilisee sont presentes. On decrit en particulier les detecteurs de rayonnement utilises. Comme source de rayonnement on utilise {sup 90}(Sr + Y) et {sup 147}Pm. Pour eliminer les electrons retrodiffuses on utilise un aimant permanent place sur le trajet du faisceau. La methode est appliquee a la mesure des epaisseurs des depots metalliques  More>>
Authors:
Martinelli, P; [1]  Seibel, G [2] 
  1. Commissariat a l'Energie Atomique, Saclay (France). Centre d'Etudes Nucleaires
  2. Institut de Recherches de la Siderurgie Francaise (IRSID), 78 - Saint-Germain-en-Laye (France)
Publication Date:
Jul 01, 1961
Product Type:
Technical Report
Report Number:
CEA-R-1945
Resource Relation:
Conference: 8. International Conference of Spectroscopy, Colloquium Spectroscopicum Internationale VIII, Luzern (Switzerland), 14-18 Sep 1959; Other Information: 12 refs
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ACCURACY; BACKSCATTERING; BETA PARTICLES; BETA SOURCES; CALIBRATION; CHEMICAL COMPOSITION; COMPARATIVE EVALUATIONS; DEPOSITS; ELECTRONS; K ABSORPTION; MINERALS; PROMETHIUM 147; PROPORTIONAL COUNTERS; QUANTITATIVE CHEMICAL ANALYSIS; SENSITIVITY; SLOWING-DOWN; THICKNESS GAGES; THIN FILMS; X-RAY DETECTION; X-RAY FLUORESCENCE ANALYSIS
OSTI ID:
20975231
Research Organizations:
CEA Saclay, 91 - Gif-sur-Yvette (France)
Country of Origin:
France
Language:
French
Other Identifying Numbers:
TRN: FR07R1945004781
Availability:
Available from INIS in electronic form
Submitting Site:
FRN
Size:
9 pages
Announcement Date:
Feb 07, 2008

Citation Formats

Martinelli, P, and Seibel, G. The application of {beta}-ray excitation fluorescence to the measurement of the thickness of deposits and to analysis; Applications de la fluorescence excitee au moyen des rayons {beta} a la mesure des epaisseurs des depots et a l'analyse. France: N. p., 1961. Web.
Martinelli, P, & Seibel, G. The application of {beta}-ray excitation fluorescence to the measurement of the thickness of deposits and to analysis; Applications de la fluorescence excitee au moyen des rayons {beta} a la mesure des epaisseurs des depots et a l'analyse. France.
Martinelli, P, and Seibel, G. 1961. "The application of {beta}-ray excitation fluorescence to the measurement of the thickness of deposits and to analysis; Applications de la fluorescence excitee au moyen des rayons {beta} a la mesure des epaisseurs des depots et a l'analyse." France.
@misc{etde_20975231,
title = {The application of {beta}-ray excitation fluorescence to the measurement of the thickness of deposits and to analysis; Applications de la fluorescence excitee au moyen des rayons {beta} a la mesure des epaisseurs des depots et a l'analyse}
author = {Martinelli, P, and Seibel, G}
abstractNote = {Principles of the method are first outlined and the instrumentation used is described. The different types of radiation detectors are subject of a detailed study. As a source of {beta}-radiation {sup 90}(Sr + Y) was used as well as {sup 147}Pm. Great care was taken to eliminate back-diffused electrons by deflection by a strong permanent magnet. The method was applied to the measurement of the thickness of deposits of Cr, Zn, Sn, Cd and Cu on iron as well as Zn, Cr, Ag and Au on copper and the results obtained are discussed. An attempt was made, to use {beta}-X-ray fluorescence for the analysis of minerals, iron ore and glass and for routine control of Si-Mn, Si-Ca, Fe-Mn and Fe-W. Finally the method of {beta}-X-ray fluorescence is compared with normal-X-ray fluorescence and possibilities of further development are cited. (author) [French] Les principes de la methode et l'instrumentation utilisee sont presentes. On decrit en particulier les detecteurs de rayonnement utilises. Comme source de rayonnement on utilise {sup 90}(Sr + Y) et {sup 147}Pm. Pour eliminer les electrons retrodiffuses on utilise un aimant permanent place sur le trajet du faisceau. La methode est appliquee a la mesure des epaisseurs des depots metalliques tels que le Cr, Zn, Sn, Cd et Cu sur fer et le Zn, Cr, Ag et Au sur cuivre. D'autre part, la fluorescence {beta}-X etait utilisee pour l'analyse des minerais et des verres et pour le controle des alliages Fe-Mn, Fe-W, Si-Mn, Si-Ca. Enfin, on passe a une comparaison entre la fluorescence {beta}-X et la fluorescence X normale et on discute les possibilites d'un developpement futur. (auteur)}
place = {France}
year = {1961}
month = {Jul}
}