You need JavaScript to view this

New developments in the analysis and measurement of thicknesses by excitation of the fluorescent lines by means of {beta} particles; Nouveaux developpements de l'analyse et de la mesure des epaisseurs par excitation des raies de fluorescence au moyen de particules {beta}

Abstract

The process for analysing and measuring the thickness of deposits by {beta}-X fluorescence which we have already described has undergone further development. The use of promethium-147 and krypton-85 sources makes it possible to reduce the background noise which is observed with strontium-90. We present the results obtained for various measurements of the thickness of metallic coatings and the continuous measurement of calcium and of iron in ore samples. We describe the tests carried out with a view to analysing the X-rays by means of a crystal. (author) [French] Le procede d'analyse et de mesure des epaisseurs de depots par fluorescence {beta}-X que nous avons precedemment decrit a fait l'objet de nouveaux developpements. L'emploi de sources de prometheum-147 et de krypton-85 permet de reduire le bruit de fond que l'on observe avec le strontium-90. Nous dormons les resultats obtenus pour diverses mesures d'epaisseurs de depots metalliques et la mesure en continu du calcium et du fer dans les carottes de minerais. Nous decrivons les essais effectues en vue d'analyser le rayonnement X au moyen d'un cristal. (auteur)
Authors:
Martinelli, P; [1]  Seibel, G [2] 
  1. Commissariat a l'Energie Atomique, Saclay (France).Centre d'Etudes Nucleaires
  2. Institut de Recherches de la Siderurgie, 78 - Saint-Germain-en-Laye (France)
Publication Date:
Jul 01, 1960
Product Type:
Technical Report
Report Number:
CEA-R-1786
Resource Relation:
Conference: Conference on Radionuclides Uses in Physic Sciences and Industry, Conference sur l'emploi des radioisotopes dans les sciences physiques et dans l'industrie, Copenhague (Denmark), 6-17 Sep 1960; Other Information: 10 refs
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ACCURACY; BACKGROUND NOISE; BACKSCATTERING; BETA SOURCES; CHEMICAL COMPOSITION; COMPARATIVE EVALUATIONS; COUNTING RATES; GEIGER-MUELLER COUNTERS; KRYPTON 85; PERFORMANCE TESTING; PROMETHIUM 147; PROPORTIONAL COUNTERS; RADIOMETRIC GAGES; SLOWING-DOWN; STRONTIUM 90; SURFACE COATING; THICKNESS GAGES; THIN FILMS; X-RAY FLUORESCENCE ANALYSIS
OSTI ID:
20967977
Research Organizations:
CEA Saclay, 91 - Gif-sur-Yvette (France)
Country of Origin:
France
Language:
French
Other Identifying Numbers:
TRN: FR07R1786116762
Availability:
Available from INIS in electronic form
Submitting Site:
FRN
Size:
38 pages
Announcement Date:
Dec 29, 2007

Citation Formats

Martinelli, P, and Seibel, G. New developments in the analysis and measurement of thicknesses by excitation of the fluorescent lines by means of {beta} particles; Nouveaux developpements de l'analyse et de la mesure des epaisseurs par excitation des raies de fluorescence au moyen de particules {beta}. France: N. p., 1960. Web.
Martinelli, P, & Seibel, G. New developments in the analysis and measurement of thicknesses by excitation of the fluorescent lines by means of {beta} particles; Nouveaux developpements de l'analyse et de la mesure des epaisseurs par excitation des raies de fluorescence au moyen de particules {beta}. France.
Martinelli, P, and Seibel, G. 1960. "New developments in the analysis and measurement of thicknesses by excitation of the fluorescent lines by means of {beta} particles; Nouveaux developpements de l'analyse et de la mesure des epaisseurs par excitation des raies de fluorescence au moyen de particules {beta}." France.
@misc{etde_20967977,
title = {New developments in the analysis and measurement of thicknesses by excitation of the fluorescent lines by means of {beta} particles; Nouveaux developpements de l'analyse et de la mesure des epaisseurs par excitation des raies de fluorescence au moyen de particules {beta}}
author = {Martinelli, P, and Seibel, G}
abstractNote = {The process for analysing and measuring the thickness of deposits by {beta}-X fluorescence which we have already described has undergone further development. The use of promethium-147 and krypton-85 sources makes it possible to reduce the background noise which is observed with strontium-90. We present the results obtained for various measurements of the thickness of metallic coatings and the continuous measurement of calcium and of iron in ore samples. We describe the tests carried out with a view to analysing the X-rays by means of a crystal. (author) [French] Le procede d'analyse et de mesure des epaisseurs de depots par fluorescence {beta}-X que nous avons precedemment decrit a fait l'objet de nouveaux developpements. L'emploi de sources de prometheum-147 et de krypton-85 permet de reduire le bruit de fond que l'on observe avec le strontium-90. Nous dormons les resultats obtenus pour diverses mesures d'epaisseurs de depots metalliques et la mesure en continu du calcium et du fer dans les carottes de minerais. Nous decrivons les essais effectues en vue d'analyser le rayonnement X au moyen d'un cristal. (auteur)}
place = {France}
year = {1960}
month = {Jul}
}