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The thin layer technique and its application to electron microscopy; La technique des couches minces et son application a la microscopie electronique

Abstract

This work deals with the technique of thin layers obtained by evaporation under vacuum, in the thickness range extending from a few monoatomic layers to several hundred angstroms. The great theoretical and practical interest of these layers has, it is well known, given rise to many investigations from Faraday onwards. Within the necessarily restricted limits of this study, we shall approach the problem more particularly from the point of view of: - their production; - their use in electron microscopy. A critical appraisal is made, in the light of present-day knowledge, based on our personal experience and on an extensive bibliography which we have collected on the subject. (author) [French] Le present travail concerne la technique des couches minces obtenues par evaporation sous vide, dans le domaine d'epaisseur qui s'etend de quelques couches monoatomiques a plusieurs centaines d'angstroms. L'interet theorique et pratique considerable de ces couches a suscite, comme on sait, de nombreux travaux depuis Faraday. Dans le cadre necessairement restreint de cette these, nous aborderons plus particulierement le point de vue de: - leur obtention; - leur utilisation en microscopie electronique. Il s'agit d'une mise au point critique, a la lumiere des connaissances actuelles, appuyee sur notre experience personnelle  More>>
Authors:
Ranc, G [1] 
  1. Commissariat a l'Energie Atomique, Saclay (France). Centre d'Etudes Nucleaires
Publication Date:
Oct 15, 1957
Product Type:
Thesis/Dissertation
Report Number:
CEA-R-1117
Resource Relation:
Other Information: TH: These sciences; 228 refs
Subject:
36 MATERIALS SCIENCE; ALUMINIUM OXIDES; ATOM-MOLECULE COLLISIONS; BOILING POINTS; COLLISION PROBABILITY METHOD; COMPARATIVE EVALUATIONS; DEGASSING; ELECTRON GUNS; ELECTRON MICROSCOPY; FORMVAR; FURNACES; IMPURITIES; INTERFEROMETRY; ION BEAMS; MEAN FREE PATH; MELTING POINTS; NITROCELLULOSE; PHOTOMETRY; POLARIMETRY; PRESSURE DEPENDENCE; REPLICA TECHNIQUES; SAMPLE PREPARATION; SHADOW EFFECT; SPATIAL DISTRIBUTION; SURFACE CLEANING; THICKNESS; THIN FILMS; VACUUM EVAPORATION; VAPOR DEPOSITED COATINGS; VAPOR PRESSURE
OSTI ID:
20912780
Research Organizations:
CEA Saclay, 91 - Gif-sur-Yvette (France); Faculte des Sciences de l'Universite de Caen, 14 (France)
Country of Origin:
France
Language:
French
Other Identifying Numbers:
TRN: FR07R1117073956
Availability:
Available from INIS in electronic form
Submitting Site:
FRN
Size:
116 pages
Announcement Date:
Sep 22, 2007

Citation Formats

Ranc, G. The thin layer technique and its application to electron microscopy; La technique des couches minces et son application a la microscopie electronique. France: N. p., 1957. Web.
Ranc, G. The thin layer technique and its application to electron microscopy; La technique des couches minces et son application a la microscopie electronique. France.
Ranc, G. 1957. "The thin layer technique and its application to electron microscopy; La technique des couches minces et son application a la microscopie electronique." France.
@misc{etde_20912780,
title = {The thin layer technique and its application to electron microscopy; La technique des couches minces et son application a la microscopie electronique}
author = {Ranc, G}
abstractNote = {This work deals with the technique of thin layers obtained by evaporation under vacuum, in the thickness range extending from a few monoatomic layers to several hundred angstroms. The great theoretical and practical interest of these layers has, it is well known, given rise to many investigations from Faraday onwards. Within the necessarily restricted limits of this study, we shall approach the problem more particularly from the point of view of: - their production; - their use in electron microscopy. A critical appraisal is made, in the light of present-day knowledge, based on our personal experience and on an extensive bibliography which we have collected on the subject. (author) [French] Le present travail concerne la technique des couches minces obtenues par evaporation sous vide, dans le domaine d'epaisseur qui s'etend de quelques couches monoatomiques a plusieurs centaines d'angstroms. L'interet theorique et pratique considerable de ces couches a suscite, comme on sait, de nombreux travaux depuis Faraday. Dans le cadre necessairement restreint de cette these, nous aborderons plus particulierement le point de vue de: - leur obtention; - leur utilisation en microscopie electronique. Il s'agit d'une mise au point critique, a la lumiere des connaissances actuelles, appuyee sur notre experience personnelle et sur une importante bibliographie, qu'il nous a ete donne de reunir a ce sujet. (auteur)}
place = {France}
year = {1957}
month = {Oct}
}