You need JavaScript to view this

X-Ray Powder Diffraction with Guinier - Haegg Focusing Cameras

Abstract

The Guinier - Haegg focusing camera is discussed with reference to its use as an instrument for rapid phase analysis. An actual camera and the alignment procedure employed in its setting up are described. The results obtained with the instrument are compared with those obtained with Debye - Scherrer cameras and powder diffractometers. Exposure times of 15 - 30 minutes with compounds of simple structure are roughly one-sixth of those required for Debye - Scherrer patterns. Coupled with the lower background resulting from the use of a monochromatic X-ray beam, the shorter exposure time gives a ten-fold increase in sensitivity for the detection of minor phases as compared with the Debye - Scherrer camera. Attention is paid to the precautions taken to obtain reliable Bragg angles from Guinier - Haegg film measurements, with particular reference to calibration procedures. The evaluation of unit cell parameters from Guinier - Haegg data is discussed together with the application of tests for the presence of angle-dependent systematic errors. It is concluded that with proper calibration procedures and least squares treatment of the data, accuracies of the order of 0.005% are attainable. A compilation of diffraction data for a number of compounds examined in the  More>>
Authors:
Publication Date:
Dec 15, 1970
Product Type:
Technical Report
Report Number:
AE-409
Resource Relation:
Other Information: 36 refs., 14 figs., 5 tabs.
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS; X-RAY DIFFRACTION; STRUCTURAL CHEMICAL ANALYSIS; CAMERAS; MONOCHROMATIC RADIATION; ACCURACY; EXPERIMENTAL DATA; CRYSTALLOGRAPHY
OSTI ID:
20886596
Research Organizations:
AB Atomenergi, Nykoeping (Sweden)
Country of Origin:
Sweden
Language:
English
Other Identifying Numbers:
TRN: SE0708146
Availability:
Commercial reproduction prohibited; OSTI as DE20886596
Submitting Site:
SWDN
Size:
114 pages
Announcement Date:
Jul 16, 2007

Citation Formats

Brown, Allan. X-Ray Powder Diffraction with Guinier - Haegg Focusing Cameras. Sweden: N. p., 1970. Web.
Brown, Allan. X-Ray Powder Diffraction with Guinier - Haegg Focusing Cameras. Sweden.
Brown, Allan. 1970. "X-Ray Powder Diffraction with Guinier - Haegg Focusing Cameras." Sweden.
@misc{etde_20886596,
title = {X-Ray Powder Diffraction with Guinier - Haegg Focusing Cameras}
author = {Brown, Allan}
abstractNote = {The Guinier - Haegg focusing camera is discussed with reference to its use as an instrument for rapid phase analysis. An actual camera and the alignment procedure employed in its setting up are described. The results obtained with the instrument are compared with those obtained with Debye - Scherrer cameras and powder diffractometers. Exposure times of 15 - 30 minutes with compounds of simple structure are roughly one-sixth of those required for Debye - Scherrer patterns. Coupled with the lower background resulting from the use of a monochromatic X-ray beam, the shorter exposure time gives a ten-fold increase in sensitivity for the detection of minor phases as compared with the Debye - Scherrer camera. Attention is paid to the precautions taken to obtain reliable Bragg angles from Guinier - Haegg film measurements, with particular reference to calibration procedures. The evaluation of unit cell parameters from Guinier - Haegg data is discussed together with the application of tests for the presence of angle-dependent systematic errors. It is concluded that with proper calibration procedures and least squares treatment of the data, accuracies of the order of 0.005% are attainable. A compilation of diffraction data for a number of compounds examined in the Active Central Laboratory at Studsvik is presented to exemplify the scope of this type of powder camera.}
place = {Sweden}
year = {1970}
month = {Dec}
}