You need JavaScript to view this

Contribution to the study of defect quenching in gold; Contribution a l'etude de la trempe des lacunes dans l'or

Abstract

We have studied by resistivity measurements at low temperatures the influence of quenching conditions on the behaviour of defects in gold. We have quenched from a high temperature and in various liquids gold wires of 0.3 and 0.5 mm diameter having a purity of 99.999 per cent. For cooling rates of 25,000 deg C/second and above all the defects in equilibrium at high temperature are retained by quenching. The annealing of the defects thus obtained occurs in two stages, the first below 150 deg C and the second between 450 and 650 deg C. The mobility energy of the defects which are annealed during the first stage is 0.70 {+-} 0.06 eV, The annealing kinetics depend on the initial concentration of the defects and of the diameter of the sample. The second stage corresponds to disappearance of the stacking fault tetrahedra which are formed from defect packets during annealing. The formation energy of the defects measured on the 0. 5 mm samples is 0.94 eV. The values obtained with 0,3 mm diameter samples, much lower than 0.94 eV, can be explained by assuming that packets of defects occur at the end of the annealing of the samples. Electron microscope observations  More>>
Authors:
Hillairet, J; Delaplace, J; Mairy, C; Adda, Y [1] 
  1. Commissariat a l'Energie Atomique, Saclay (France). Centre d'Etudes Nucleaires
Publication Date:
Jul 01, 1964
Product Type:
Technical Report
Report Number:
CEA-R-2593
Resource Relation:
Other Information: 9 refs
Subject:
36 MATERIALS SCIENCE; ANNEALING; ELECTRIC CONDUCTIVITY; GOLD; KINETICS; QUENCHING; TEMPERATURE DEPENDENCE; VACANCIES; VOIDS
OSTI ID:
20795951
Research Organizations:
CEA Saclay, 91 - Gif-sur-Yvette (France)
Country of Origin:
France
Language:
French
Other Identifying Numbers:
TRN: FR06R2593097988
Availability:
Available from INIS in electronic form
Submitting Site:
FRN
Size:
49 pages
Announcement Date:
Dec 19, 2006

Citation Formats

Hillairet, J, Delaplace, J, Mairy, C, and Adda, Y. Contribution to the study of defect quenching in gold; Contribution a l'etude de la trempe des lacunes dans l'or. France: N. p., 1964. Web.
Hillairet, J, Delaplace, J, Mairy, C, & Adda, Y. Contribution to the study of defect quenching in gold; Contribution a l'etude de la trempe des lacunes dans l'or. France.
Hillairet, J, Delaplace, J, Mairy, C, and Adda, Y. 1964. "Contribution to the study of defect quenching in gold; Contribution a l'etude de la trempe des lacunes dans l'or." France.
@misc{etde_20795951,
title = {Contribution to the study of defect quenching in gold; Contribution a l'etude de la trempe des lacunes dans l'or}
author = {Hillairet, J, Delaplace, J, Mairy, C, and Adda, Y}
abstractNote = {We have studied by resistivity measurements at low temperatures the influence of quenching conditions on the behaviour of defects in gold. We have quenched from a high temperature and in various liquids gold wires of 0.3 and 0.5 mm diameter having a purity of 99.999 per cent. For cooling rates of 25,000 deg C/second and above all the defects in equilibrium at high temperature are retained by quenching. The annealing of the defects thus obtained occurs in two stages, the first below 150 deg C and the second between 450 and 650 deg C. The mobility energy of the defects which are annealed during the first stage is 0.70 {+-} 0.06 eV, The annealing kinetics depend on the initial concentration of the defects and of the diameter of the sample. The second stage corresponds to disappearance of the stacking fault tetrahedra which are formed from defect packets during annealing. The formation energy of the defects measured on the 0. 5 mm samples is 0.94 eV. The values obtained with 0,3 mm diameter samples, much lower than 0.94 eV, can be explained by assuming that packets of defects occur at the end of the annealing of the samples. Electron microscope observations have been carried out on strips of annealed gold. (authors) [French] Nous avons etudie par des mesures de resistivite a basse temperature l'influence des conditions de trempe sur le comportement des lacunes dans l'or. Nous avons trempe dans differents liquides des fils d'or de 0,3 mm et 0,5 mm de diametre, de purete 99,999 pour cent, portes a haute temperature. Pour des vitesses de refroidissement superieures ou egales a 25000 deg C/seconde, on retient par trempe la totalite des lacunes en equilibre a haute temperature. Le recuit des lacunes ainsi retenues se fait en deux stades, le premier au-dessous de 150 deg C, le second entre 450 et 650 deg C. L'energie de mobilite des lacunes qui se recuisent au cours du premier stade est de 0,70 {+-} 0,06 eV. La cinetique du recuit depend de la concentration initiale en lacunes et du diametre de l'echantillon. Le deuxieme stade correspond a la disparition de tetraedres de fautes d'empilement qui se forment au cours du recuit a partir d'amas de lacunes. L'energie de formation des lacunes determinee sur les echantillons de 0,5 mm de diametre est de 0,94 eV. Les valeurs obtenues avec les echantillons de 0,3 mm de diametre, tres inferieures a 0,94 eV, peuvent s'interpreter en supposant que des amas de lacunes existent en fin de trempe dans ces echantillons. Des observations au microscope electronique ont ete effectuees sur des rubans d'or trempes. (auteurs)}
place = {France}
year = {1964}
month = {Jul}
}