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Scanning electron microscopy

Technical Report:

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Abstract

The JSM-11 scanning electron microscope at CRNL has been used extensively for topographical studies of oxidized metals, fracture surfaces, entomological and biological specimens. A non-dispersive X-ray attachment permits the microanalysis of the surface features. Techniques for the production of electron channeling patterns have been developed. (author)
Authors:
Cox, B. [1] 
  1. Atomic Energy of Canada Limited, Chalk River, Ontario (Canada)
Publication Date:
May 15, 1970
Product Type:
Technical Report
Report Number:
AECL-3604
Resource Relation:
Other Information: 9 refs., 4 figs; Related Information: In: Materials research in AECL, Spring 1970, 22 pages.
Subject:
36 MATERIALS SCIENCE; CHALK RIVER NUCLEAR LABS; FRACTURES; METALS; OXIDATION; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; TOPOGRAPHY
OSTI ID:
20775390
Research Organizations:
Atomic Energy of Canada Limited, Chalk River, Ontario (Canada)
Country of Origin:
Canada
Language:
English
Other Identifying Numbers:
TRN: CA0600584078962
Availability:
Available from INIS in electronic form
Submitting Site:
CANN
Size:
page(s) 12-14
Announcement Date:
Oct 16, 2006

Technical Report:

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Citation Formats

Cox, B. Scanning electron microscopy. Canada: N. p., 1970. Web.
Cox, B. Scanning electron microscopy. Canada.
Cox, B. 1970. "Scanning electron microscopy." Canada.
@misc{etde_20775390,
title = {Scanning electron microscopy}
 author = {Cox, B.}
 abstractNote = {The JSM-11 scanning electron microscope at CRNL has been used extensively for topographical studies of oxidized metals, fracture surfaces, entomological and biological specimens. A non-dispersive X-ray attachment permits the microanalysis of the surface features. Techniques for the production of electron channeling patterns have been developed. (author)}
 place = {Canada}
 year = {1970}
 month = {May}
 }