Abstract
The saturation characteristics of the free-air ionization chamber (FAIC) and Si PIN photodiode were measured for intense synchrotron radiation (SR) beam at KEK-PF and SPring-8. The saturation phenomenon of FAIC increased rapidly with the SR intensity above 1x10{sup 11} [photon/sec]. For the Si PIN photodiodes (SPPD) it could not be observed, but SPPD showed an upper limit due to photon induced current (photocurrent) limitation of 2 mA. This results revealed that the conventional FAIC and SPPD can not be used as the intense SR fluence monitor beyond 10{sup 11} [photon/sec] in the photon energy region of 15 to 20 keV. (author)
Taniguchi, Shingo;
Nariyama, Nobuteru;
[1]
Kishi, Noriyuki;
Moriya, Takahiro;
[2]
Namito, Yoshihito;
Ban, Syuichi
[3]
- Japan Synchrotron Radiation Research Inst., Mikazuki, Hyogo (Japan)
- Kyoto Univ., Dept. of Nuclear Engineering, Kyoto (Japan)
- High Energy Accelerator Research Organization, Tsukuba, Ibaraki (Japan)
Citation Formats
Taniguchi, Shingo, Nariyama, Nobuteru, Kishi, Noriyuki, Moriya, Takahiro, Namito, Yoshihito, and Ban, Syuichi.
Saturation characteristics of the free-air ionization chamber and Si PIN photodiode for intense synchrotron radiation measurements.
Japan: N. p.,
2004.
Web.
Taniguchi, Shingo, Nariyama, Nobuteru, Kishi, Noriyuki, Moriya, Takahiro, Namito, Yoshihito, & Ban, Syuichi.
Saturation characteristics of the free-air ionization chamber and Si PIN photodiode for intense synchrotron radiation measurements.
Japan.
Taniguchi, Shingo, Nariyama, Nobuteru, Kishi, Noriyuki, Moriya, Takahiro, Namito, Yoshihito, and Ban, Syuichi.
2004.
"Saturation characteristics of the free-air ionization chamber and Si PIN photodiode for intense synchrotron radiation measurements."
Japan.
@misc{etde_20620332,
title = {Saturation characteristics of the free-air ionization chamber and Si PIN photodiode for intense synchrotron radiation measurements}
author = {Taniguchi, Shingo, Nariyama, Nobuteru, Kishi, Noriyuki, Moriya, Takahiro, Namito, Yoshihito, and Ban, Syuichi}
abstractNote = {The saturation characteristics of the free-air ionization chamber (FAIC) and Si PIN photodiode were measured for intense synchrotron radiation (SR) beam at KEK-PF and SPring-8. The saturation phenomenon of FAIC increased rapidly with the SR intensity above 1x10{sup 11} [photon/sec]. For the Si PIN photodiodes (SPPD) it could not be observed, but SPPD showed an upper limit due to photon induced current (photocurrent) limitation of 2 mA. This results revealed that the conventional FAIC and SPPD can not be used as the intense SR fluence monitor beyond 10{sup 11} [photon/sec] in the photon energy region of 15 to 20 keV. (author)}
place = {Japan}
year = {2004}
month = {Mar}
}
title = {Saturation characteristics of the free-air ionization chamber and Si PIN photodiode for intense synchrotron radiation measurements}
author = {Taniguchi, Shingo, Nariyama, Nobuteru, Kishi, Noriyuki, Moriya, Takahiro, Namito, Yoshihito, and Ban, Syuichi}
abstractNote = {The saturation characteristics of the free-air ionization chamber (FAIC) and Si PIN photodiode were measured for intense synchrotron radiation (SR) beam at KEK-PF and SPring-8. The saturation phenomenon of FAIC increased rapidly with the SR intensity above 1x10{sup 11} [photon/sec]. For the Si PIN photodiodes (SPPD) it could not be observed, but SPPD showed an upper limit due to photon induced current (photocurrent) limitation of 2 mA. This results revealed that the conventional FAIC and SPPD can not be used as the intense SR fluence monitor beyond 10{sup 11} [photon/sec] in the photon energy region of 15 to 20 keV. (author)}
place = {Japan}
year = {2004}
month = {Mar}
}