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D{sup {sup -}}, O{sup {sup -}} and OD{sup {sup -}} desorption induced by low-energy (0-20 eV) electron impact on amorphous D{sub 2}O films

Abstract

We report measurements of low-energy electron stimulated desorption of D{sup -}, O{sup -} and OD{sup -} anions from multilayer amorphous D{sub 2}O films physisorbed on a Pt substrate. The 0-20 eV incident energy dependence (i.e., the yield function) of the desorbed D{sup -} yield reveals the presence of a strong peak located at 7.2 eV with a shoulder near 9 eV, which are due to dissociation of the transient states {sup 2}B{sub 1} and {sup 2}A{sub 1} of D{sub 2}O, respectively. The O{sup -} and OD{sup -} yield functions each exhibit a single broad structure between 5 and 12 eV which also result from dissociative electron attachment (DEA). Due to the weakness of the O{sup -} and OD{sup -} signals, three possible processes involving DEA must be considered to explain their yield functions, i.e., direct DEA, reactive scattering and DEA to a new product in the film synthesized by the electron beam. It is concluded that at large electron doses (>7.5x10{sup 14} electrons/cm{sup 2}), these broad peaks arise from DEA to a new product, whereas at lower dose the possibility of direct DEA (i.e., e{sup -}+D{sub 2}O{yields}D{sub 2}O{sup -}{yields}O{sup -}+D{sub 2} and OD{sup -}+D) cannot be entirely discounted. Above 15  More>>
Authors:
Xiaoning, Pan; [1]  Abdoul-Carime, Hassan; [1]  Cloutier, Pierre; [1]  Bass, Andrew D; [1]  Sanche, Leon [1] 
  1. Group of the Canadian Institutes of Health Research in the Radiation Sciences, Faculte de Medecine, Universite de Sherbrooke, Sherbrooke, Quebec, J1H 5N4 (Canada)
Publication Date:
Feb 01, 2005
Product Type:
Journal Article
Resource Relation:
Journal Name: Radiation Physics and Chemistry (1993); Journal Volume: 72; Journal Issue: 2-3; Other Information: DOI: 10.1016/j.radphyschem.2004.04.138; PII: S0969-806X(04)00496-7; Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); PBD: Feb 2005
Subject:
38 RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY; ANIONS; CHEMICAL RADIATION EFFECTS; DESORPTION; DEUTERIUM IONS; DISSOCIATION; ELECTRON ATTACHMENT; ELECTRON BEAMS; ELECTRONS; ENERGY DEPENDENCE; EV RANGE 01-10; EV RANGE 10-100; FILMS; HEAVY WATER; IRRADIATION; OXYGEN IONS; RADIATION DOSES; RESONANCE; SCATTERING
OSTI ID:
20620240
Country of Origin:
United Kingdom
Language:
English
Other Identifying Numbers:
Journal ID: ISSN 0969-806X; RPCHDM; TRN: GB05R3062063890
Submitting Site:
GBN
Size:
page(s) 193-199
Announcement Date:
Aug 28, 2005

Citation Formats

Xiaoning, Pan, Abdoul-Carime, Hassan, Cloutier, Pierre, Bass, Andrew D, and Sanche, Leon. D{sup {sup -}}, O{sup {sup -}} and OD{sup {sup -}} desorption induced by low-energy (0-20 eV) electron impact on amorphous D{sub 2}O films. United Kingdom: N. p., 2005. Web. doi:10.1016/j.radphyschem.2004.04.138.
Xiaoning, Pan, Abdoul-Carime, Hassan, Cloutier, Pierre, Bass, Andrew D, & Sanche, Leon. D{sup {sup -}}, O{sup {sup -}} and OD{sup {sup -}} desorption induced by low-energy (0-20 eV) electron impact on amorphous D{sub 2}O films. United Kingdom. https://doi.org/10.1016/j.radphyschem.2004.04.138
Xiaoning, Pan, Abdoul-Carime, Hassan, Cloutier, Pierre, Bass, Andrew D, and Sanche, Leon. 2005. "D{sup {sup -}}, O{sup {sup -}} and OD{sup {sup -}} desorption induced by low-energy (0-20 eV) electron impact on amorphous D{sub 2}O films." United Kingdom. https://doi.org/10.1016/j.radphyschem.2004.04.138.
@misc{etde_20620240,
title = {D{sup {sup -}}, O{sup {sup -}} and OD{sup {sup -}} desorption induced by low-energy (0-20 eV) electron impact on amorphous D{sub 2}O films}
author = {Xiaoning, Pan, Abdoul-Carime, Hassan, Cloutier, Pierre, Bass, Andrew D, and Sanche, Leon}
abstractNote = {We report measurements of low-energy electron stimulated desorption of D{sup -}, O{sup -} and OD{sup -} anions from multilayer amorphous D{sub 2}O films physisorbed on a Pt substrate. The 0-20 eV incident energy dependence (i.e., the yield function) of the desorbed D{sup -} yield reveals the presence of a strong peak located at 7.2 eV with a shoulder near 9 eV, which are due to dissociation of the transient states {sup 2}B{sub 1} and {sup 2}A{sub 1} of D{sub 2}O, respectively. The O{sup -} and OD{sup -} yield functions each exhibit a single broad structure between 5 and 12 eV which also result from dissociative electron attachment (DEA). Due to the weakness of the O{sup -} and OD{sup -} signals, three possible processes involving DEA must be considered to explain their yield functions, i.e., direct DEA, reactive scattering and DEA to a new product in the film synthesized by the electron beam. It is concluded that at large electron doses (>7.5x10{sup 14} electrons/cm{sup 2}), these broad peaks arise from DEA to a new product, whereas at lower dose the possibility of direct DEA (i.e., e{sup -}+D{sub 2}O{yields}D{sub 2}O{sup -}{yields}O{sup -}+D{sub 2} and OD{sup -}+D) cannot be entirely discounted. Above 15 eV, all anion yield functions exhibit a monotonic rise due to direct dipolar dissociation.}
doi = {10.1016/j.radphyschem.2004.04.138}
journal = []
issue = {2-3}
volume = {72}
journal type = {AC}
place = {United Kingdom}
year = {2005}
month = {Feb}
}