Abstract
Interface-engineered junctions of a vertically stacked trilayer type were fabricated and their atom composition of the barrier layer was characterized. From the EDX analysis with TEM cross sectional observation, we have found that the composition of barrier layer was Y:Ba:Cu=22:30:48. Namely composition was Y-excess and Ba-deficient compared to the composition ratio of the nominal YBCO (Y:Ba:Cu=16.5:33:50). XPS measurement results also showed that, before the deposition of the counter YBCO film, the modified layer with several-nm thickness from the surface had similar Y-rich and Ba-poor compositions. This means that the modified layer can work as the junction barrier layer even after a high temperature process for the counter YBCO deposition.
Citation Formats
Sugimata, E, Fujino, H, Kume, E, and Sakai, S.
Composition analysis of modified layer in YBCO trilayer interface-engineered Josephson junctions.
Netherlands: N. p.,
2004.
Web.
doi:10.1016/j.physc.2004.01.166.
Sugimata, E, Fujino, H, Kume, E, & Sakai, S.
Composition analysis of modified layer in YBCO trilayer interface-engineered Josephson junctions.
Netherlands.
https://doi.org/10.1016/j.physc.2004.01.166
Sugimata, E, Fujino, H, Kume, E, and Sakai, S.
2004.
"Composition analysis of modified layer in YBCO trilayer interface-engineered Josephson junctions."
Netherlands.
https://doi.org/10.1016/j.physc.2004.01.166.
@misc{etde_20618576,
title = {Composition analysis of modified layer in YBCO trilayer interface-engineered Josephson junctions}
author = {Sugimata, E, Fujino, H, Kume, E, and Sakai, S}
abstractNote = {Interface-engineered junctions of a vertically stacked trilayer type were fabricated and their atom composition of the barrier layer was characterized. From the EDX analysis with TEM cross sectional observation, we have found that the composition of barrier layer was Y:Ba:Cu=22:30:48. Namely composition was Y-excess and Ba-deficient compared to the composition ratio of the nominal YBCO (Y:Ba:Cu=16.5:33:50). XPS measurement results also showed that, before the deposition of the counter YBCO film, the modified layer with several-nm thickness from the surface had similar Y-rich and Ba-poor compositions. This means that the modified layer can work as the junction barrier layer even after a high temperature process for the counter YBCO deposition.}
doi = {10.1016/j.physc.2004.01.166}
journal = []
issue = {1-2}
volume = {412-414}
journal type = {AC}
place = {Netherlands}
year = {2004}
month = {Oct}
}
title = {Composition analysis of modified layer in YBCO trilayer interface-engineered Josephson junctions}
author = {Sugimata, E, Fujino, H, Kume, E, and Sakai, S}
abstractNote = {Interface-engineered junctions of a vertically stacked trilayer type were fabricated and their atom composition of the barrier layer was characterized. From the EDX analysis with TEM cross sectional observation, we have found that the composition of barrier layer was Y:Ba:Cu=22:30:48. Namely composition was Y-excess and Ba-deficient compared to the composition ratio of the nominal YBCO (Y:Ba:Cu=16.5:33:50). XPS measurement results also showed that, before the deposition of the counter YBCO film, the modified layer with several-nm thickness from the surface had similar Y-rich and Ba-poor compositions. This means that the modified layer can work as the junction barrier layer even after a high temperature process for the counter YBCO deposition.}
doi = {10.1016/j.physc.2004.01.166}
journal = []
issue = {1-2}
volume = {412-414}
journal type = {AC}
place = {Netherlands}
year = {2004}
month = {Oct}
}