Abstract
ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} thin films are grown by pulsed laser deposition (PLD). Using a SrTiO{sub 3} as a lattice matched substrate. In the film growth, the substrate temperature is varied from 720 to 780 deg. C. From X-ray diffraction (XRD) patterns, only the 0 0 l reflections from the ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films are observed. The average of the c-axis length of the other films is 11.6875 Angst. ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} film grown at 735 deg. C is excellent in the crystallinity, while the intensity of 0 0 l peaks of the film grown at more than 780 deg. C obviously weakened. The zero resistance T{sub c} is 90.5 K. Superconducting transition width is 1.5 K. Large and flat grains are observed by atomic force microscopy (AFM) at the surface of the film. From the scanning electron microscope (SEM) image, we confirmed some grains with the size of approximately 200 nm in diameter on the ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} thin film. We observe the interface of ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} and substrate clearly by transmission electron microscopy (TEM) measurements.
Citation Formats
Ohazama, T, Mukaida, M, Ichinose, A, Matsumoto, K, Yoshida, Y, Horii, S, Saito, A, and Ohshima, S.
Growth of high-quality ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} thin films.
Netherlands: N. p.,
2004.
Web.
doi:10.1016/j.physc.2004.02.226.
Ohazama, T, Mukaida, M, Ichinose, A, Matsumoto, K, Yoshida, Y, Horii, S, Saito, A, & Ohshima, S.
Growth of high-quality ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} thin films.
Netherlands.
https://doi.org/10.1016/j.physc.2004.02.226
Ohazama, T, Mukaida, M, Ichinose, A, Matsumoto, K, Yoshida, Y, Horii, S, Saito, A, and Ohshima, S.
2004.
"Growth of high-quality ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} thin films."
Netherlands.
https://doi.org/10.1016/j.physc.2004.02.226.
@misc{etde_20618552,
title = {Growth of high-quality ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} thin films}
author = {Ohazama, T, Mukaida, M, Ichinose, A, Matsumoto, K, Yoshida, Y, Horii, S, Saito, A, and Ohshima, S}
abstractNote = {ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} thin films are grown by pulsed laser deposition (PLD). Using a SrTiO{sub 3} as a lattice matched substrate. In the film growth, the substrate temperature is varied from 720 to 780 deg. C. From X-ray diffraction (XRD) patterns, only the 0 0 l reflections from the ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films are observed. The average of the c-axis length of the other films is 11.6875 Angst. ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} film grown at 735 deg. C is excellent in the crystallinity, while the intensity of 0 0 l peaks of the film grown at more than 780 deg. C obviously weakened. The zero resistance T{sub c} is 90.5 K. Superconducting transition width is 1.5 K. Large and flat grains are observed by atomic force microscopy (AFM) at the surface of the film. From the scanning electron microscope (SEM) image, we confirmed some grains with the size of approximately 200 nm in diameter on the ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} thin film. We observe the interface of ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} and substrate clearly by transmission electron microscopy (TEM) measurements.}
doi = {10.1016/j.physc.2004.02.226}
journal = []
issue = {1-2}
volume = {412-414}
journal type = {AC}
place = {Netherlands}
year = {2004}
month = {Oct}
}
title = {Growth of high-quality ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} thin films}
author = {Ohazama, T, Mukaida, M, Ichinose, A, Matsumoto, K, Yoshida, Y, Horii, S, Saito, A, and Ohshima, S}
abstractNote = {ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} thin films are grown by pulsed laser deposition (PLD). Using a SrTiO{sub 3} as a lattice matched substrate. In the film growth, the substrate temperature is varied from 720 to 780 deg. C. From X-ray diffraction (XRD) patterns, only the 0 0 l reflections from the ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films are observed. The average of the c-axis length of the other films is 11.6875 Angst. ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} film grown at 735 deg. C is excellent in the crystallinity, while the intensity of 0 0 l peaks of the film grown at more than 780 deg. C obviously weakened. The zero resistance T{sub c} is 90.5 K. Superconducting transition width is 1.5 K. Large and flat grains are observed by atomic force microscopy (AFM) at the surface of the film. From the scanning electron microscope (SEM) image, we confirmed some grains with the size of approximately 200 nm in diameter on the ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} thin film. We observe the interface of ErBa{sub 2}Cu{sub 3}O{sub 7-{delta}} and substrate clearly by transmission electron microscopy (TEM) measurements.}
doi = {10.1016/j.physc.2004.02.226}
journal = []
issue = {1-2}
volume = {412-414}
journal type = {AC}
place = {Netherlands}
year = {2004}
month = {Oct}
}