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Fast heavy-ion-induced fragmentation and ionization of fullerenes

Journal Article:

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Abstract

We have measured fragment ions from C{sub 60} induced by 2 MeV Si{sup 2+} impacts in coincidence with the number of secondary electrons under single-electron loss collisions. We measured true C{sub 60} ionization degree and correlation between number of secondary electrons and fragment ion mass distribution. (author)
Authors:
Mizuno, T; Okamoto, D; Tsuchida, H; Itoh, A; [1]  Majima, T; [2]  Nakai, Y [3] 
  1. Kyoto Univ., Dept. of Nuclear Engineering, Kyoto (Japan)
  2. Genesis Research Inst., Inc., Nagoya, Aichi (Japan)
  3. Inst. of Physical and Chemical Research, Wako, Saitama (Japan)
Publication Date:
Jul 01, 2004
Product Type:
Journal Article
Resource Relation:
Journal Name: Annual Report of Quantum Science and Engineering Center; Journal Volume: 6; Other Information: 3 refs., 2 figs; PBD: Jul 2004
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; COINCIDENCE METHODS; FRAGMENTATION; FULLERENES; HEAVY IONS; ION-MOLECULE COLLISIONS; IONIZATION; MASS DISTRIBUTION; MEV RANGE 01-10; MOLECULAR CLUSTERS; SILICON; TANDEM ELECTROSTATIC ACCELERATORS; TIME-OF-FLIGHT METHOD
OSTI ID:
20618087
Country of Origin:
Japan
Language:
English
Other Identifying Numbers:
Journal ID: ISSN 1345-0700; TRN: JP0502396061585
Submitting Site:
INIS
Size:
page(s) 34-36
Announcement Date:
Aug 21, 2005

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Citation Formats

Mizuno, T, Okamoto, D, Tsuchida, H, Itoh, A, Majima, T, and Nakai, Y. Fast heavy-ion-induced fragmentation and ionization of fullerenes. Japan: N. p., 2004. Web.
Mizuno, T, Okamoto, D, Tsuchida, H, Itoh, A, Majima, T, & Nakai, Y. Fast heavy-ion-induced fragmentation and ionization of fullerenes. Japan.
Mizuno, T, Okamoto, D, Tsuchida, H, Itoh, A, Majima, T, and Nakai, Y. 2004. "Fast heavy-ion-induced fragmentation and ionization of fullerenes." Japan.
@misc{etde_20618087,
title = {Fast heavy-ion-induced fragmentation and ionization of fullerenes}
 author = {Mizuno, T, Okamoto, D, Tsuchida, H, Itoh, A, Majima, T, and Nakai, Y}
 abstractNote = {We have measured fragment ions from C{sub 60} induced by 2 MeV Si{sup 2+} impacts in coincidence with the number of secondary electrons under single-electron loss collisions. We measured true C{sub 60} ionization degree and correlation between number of secondary electrons and fragment ion mass distribution. (author)}
 journal = []
 volume = {6}
 journal type = {AC}
 place = {Japan}
 year = {2004}
 month = {Jul}
 }