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Determination of the states of oxidation of metals in thin oxide films by x-ray photoelectron spectroscopy; Opredelenie stepeni okisleniya metallov v tonkie oksidnykh plenkakh metodom rentgenovskoj fotoehlektronnoj spektroskopii

Abstract

The states of oxidation of molybdenum, tungsten, niobium, and tantalum in thin oxide films of variable composition were determined by X-ray photoelectron spectroscopy. It was found that the metals occurred in different states of oxidation in thin oxide films prepared by the irradiation of metal surfaces with low-energy oxygen ions under high-vacuum conditions. The concentrations of metals in different states of oxidation essentially depend on the radiation dose and the reactivity of metals.
Authors:
Alov, N V [1] 
  1. Moskovskij Gosudarstvennyj Univ. im. M.V. Lomonosova, Khimicheskij Fakul'tet, Moscow (Russian Federation)
Publication Date:
May 01, 2005
Product Type:
Journal Article
Resource Relation:
Journal Name: Zhurnal Analiticheskoj Khimii; Journal Volume: 60; Journal Issue: 5; Other Information: 14 refs., 2 figs., 2 tabs; PBD: May 2005
Subject:
38 RADIATION CHEMISTRY, RADIOCHEMISTRY, AND NUCLEAR CHEMISTRY; CHEMICAL RADIATION EFFECTS; ELECTRON SPECTRA; FILMS; KEV RANGE 01-10; MOLYBDENUM OXIDES; NIOBIUM OXIDES; OXYGEN IONS; PHOTOELECTRON SPECTROSCOPY; RADIATION DOSES; TANTALUM OXIDES; TUNGSTEN OXIDES; VALENCE
OSTI ID:
20617484
Country of Origin:
Russian Federation
Language:
Russian
Other Identifying Numbers:
Journal ID: ISSN 0044-4502; ZAKHA8; TRN: RU0501798060713
Submitting Site:
INIS
Size:
page(s) 490-494
Announcement Date:
Aug 21, 2005

Citation Formats

Alov, N V. Determination of the states of oxidation of metals in thin oxide films by x-ray photoelectron spectroscopy; Opredelenie stepeni okisleniya metallov v tonkie oksidnykh plenkakh metodom rentgenovskoj fotoehlektronnoj spektroskopii. Russian Federation: N. p., 2005. Web.
Alov, N V. Determination of the states of oxidation of metals in thin oxide films by x-ray photoelectron spectroscopy; Opredelenie stepeni okisleniya metallov v tonkie oksidnykh plenkakh metodom rentgenovskoj fotoehlektronnoj spektroskopii. Russian Federation.
Alov, N V. 2005. "Determination of the states of oxidation of metals in thin oxide films by x-ray photoelectron spectroscopy; Opredelenie stepeni okisleniya metallov v tonkie oksidnykh plenkakh metodom rentgenovskoj fotoehlektronnoj spektroskopii." Russian Federation.
@misc{etde_20617484,
title = {Determination of the states of oxidation of metals in thin oxide films by x-ray photoelectron spectroscopy; Opredelenie stepeni okisleniya metallov v tonkie oksidnykh plenkakh metodom rentgenovskoj fotoehlektronnoj spektroskopii}
author = {Alov, N V}
abstractNote = {The states of oxidation of molybdenum, tungsten, niobium, and tantalum in thin oxide films of variable composition were determined by X-ray photoelectron spectroscopy. It was found that the metals occurred in different states of oxidation in thin oxide films prepared by the irradiation of metal surfaces with low-energy oxygen ions under high-vacuum conditions. The concentrations of metals in different states of oxidation essentially depend on the radiation dose and the reactivity of metals.}
journal = []
issue = {5}
volume = {60}
journal type = {AC}
place = {Russian Federation}
year = {2005}
month = {May}
}