Abstract
No abstract prepared.
Tarasenkov, A N;
[1]
Gerasimenko, N N
[2]
- SNC 'TECHNOLOGICAL CENTRE', MIET (TU), Moscow (Russian Federation)
- Moscow Institute of Electronic Technology (TU), Moscow (Russian Federation)
Citation Formats
Tarasenkov, A N, and Gerasimenko, N N.
Properties of gate oxide using BF{sub 2}{sup +} ions for creation of drain/source areas of p-channel transistors on silicon.
Poland: N. p.,
2004.
Web.
Tarasenkov, A N, & Gerasimenko, N N.
Properties of gate oxide using BF{sub 2}{sup +} ions for creation of drain/source areas of p-channel transistors on silicon.
Poland.
Tarasenkov, A N, and Gerasimenko, N N.
2004.
"Properties of gate oxide using BF{sub 2}{sup +} ions for creation of drain/source areas of p-channel transistors on silicon."
Poland.
@misc{etde_20616897,
title = {Properties of gate oxide using BF{sub 2}{sup +} ions for creation of drain/source areas of p-channel transistors on silicon}
author = {Tarasenkov, A N, and Gerasimenko, N N}
abstractNote = {No abstract prepared.}
place = {Poland}
year = {2004}
month = {Jul}
}
title = {Properties of gate oxide using BF{sub 2}{sup +} ions for creation of drain/source areas of p-channel transistors on silicon}
author = {Tarasenkov, A N, and Gerasimenko, N N}
abstractNote = {No abstract prepared.}
place = {Poland}
year = {2004}
month = {Jul}
}