Abstract
Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, infrared SNOM performed in the spectroscopic mode started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. In this paper we will present some practical examples that show the great potential of this new technique both in materials science and in the life sciences. (author)
Cricenti, A;
[1]
Department of Physics and Astronomy and FEL Center, Vanderbilt University, Nashville (United States)]
- Istituto di Struttura della Materia, Roma (Italy)
Citation Formats
Cricenti, A, and Department of Physics and Astronomy and FEL Center, Vanderbilt University, Nashville (United States)].
Infrared Free Electron Laser Nanospectroscopy in Material Science and Biology[Full text article has been submitted to the ''Journal of Alloys and Compounds'' (Elsevier)].
Poland: N. p.,
2004.
Web.
Cricenti, A, & Department of Physics and Astronomy and FEL Center, Vanderbilt University, Nashville (United States)].
Infrared Free Electron Laser Nanospectroscopy in Material Science and Biology[Full text article has been submitted to the ''Journal of Alloys and Compounds'' (Elsevier)].
Poland.
Cricenti, A, and Department of Physics and Astronomy and FEL Center, Vanderbilt University, Nashville (United States)].
2004.
"Infrared Free Electron Laser Nanospectroscopy in Material Science and Biology[Full text article has been submitted to the ''Journal of Alloys and Compounds'' (Elsevier)]."
Poland.
@misc{etde_20616765,
title = {Infrared Free Electron Laser Nanospectroscopy in Material Science and Biology[Full text article has been submitted to the ''Journal of Alloys and Compounds'' (Elsevier)]}
author = {Cricenti, A, and Department of Physics and Astronomy and FEL Center, Vanderbilt University, Nashville (United States)]}
abstractNote = {Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, infrared SNOM performed in the spectroscopic mode started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. In this paper we will present some practical examples that show the great potential of this new technique both in materials science and in the life sciences. (author)}
place = {Poland}
year = {2004}
month = {Jul}
}
title = {Infrared Free Electron Laser Nanospectroscopy in Material Science and Biology[Full text article has been submitted to the ''Journal of Alloys and Compounds'' (Elsevier)]}
author = {Cricenti, A, and Department of Physics and Astronomy and FEL Center, Vanderbilt University, Nashville (United States)]}
abstractNote = {Scanning near-field optical microscopy (SNOM) makes it routinely possible to overcome the fundamental diffraction limit of standard (far-field) microscopy. Recently, infrared SNOM performed in the spectroscopic mode started delivering spatially-resolved information on the distribution of chemical species and on other laterally-fluctuating properties. In this paper we will present some practical examples that show the great potential of this new technique both in materials science and in the life sciences. (author)}
place = {Poland}
year = {2004}
month = {Jul}
}