Abstract
The introduction of the third generation of synchrotron radiation sources in the early nineties facilitated greatly tunability of the excitation of soft X-ray emission. This led to strong development of resonant soft X-ray emission spectroscopy or resonant inelastic scattering spectroscopy, which has emerged as a new and valuable tool to study the electronic structure of matter. Tunability of the excitation allows elemental as well as chemical selectivity in a compound system, i.e. even the same atomic species in slightly different chemical surroundings can be separately studied. The emission process subsequent to the primary X-ray absorption (excitation) yields information about the electronic structure at the selected chemical site. It means that the contrast mechanisms present for the X-ray absorption process are used to attain selectivity with respect to e.g. site, orientation, magnetic moment, etc., and the emission process probes the electronic structure relevant for the selected species. Resonant excitation enhances the inelastic scattering process, which adds further to the information content, e.g. by allowing higher resolution to be attained, and by offering femto-second dynamical information. The penetration of soft X-rays, typically a few hundred nanometers, permits bulk properties to be probed, and the use of very thin windows facilitates liquid and
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Nordgren, E J
[1]
- Physics Department, Uppsala University, Uppsala (Sweden)
Citation Formats
Nordgren, E J.
Soft X-ray resonant inelastic scattering for materials science[Full text article has been submitted to the ''Journal of Alloys and Compounds'' (Elsevier)].
Poland: N. p.,
2004.
Web.
Nordgren, E J.
Soft X-ray resonant inelastic scattering for materials science[Full text article has been submitted to the ''Journal of Alloys and Compounds'' (Elsevier)].
Poland.
Nordgren, E J.
2004.
"Soft X-ray resonant inelastic scattering for materials science[Full text article has been submitted to the ''Journal of Alloys and Compounds'' (Elsevier)]."
Poland.
@misc{etde_20616759,
title = {Soft X-ray resonant inelastic scattering for materials science[Full text article has been submitted to the ''Journal of Alloys and Compounds'' (Elsevier)]}
author = {Nordgren, E J}
abstractNote = {The introduction of the third generation of synchrotron radiation sources in the early nineties facilitated greatly tunability of the excitation of soft X-ray emission. This led to strong development of resonant soft X-ray emission spectroscopy or resonant inelastic scattering spectroscopy, which has emerged as a new and valuable tool to study the electronic structure of matter. Tunability of the excitation allows elemental as well as chemical selectivity in a compound system, i.e. even the same atomic species in slightly different chemical surroundings can be separately studied. The emission process subsequent to the primary X-ray absorption (excitation) yields information about the electronic structure at the selected chemical site. It means that the contrast mechanisms present for the X-ray absorption process are used to attain selectivity with respect to e.g. site, orientation, magnetic moment, etc., and the emission process probes the electronic structure relevant for the selected species. Resonant excitation enhances the inelastic scattering process, which adds further to the information content, e.g. by allowing higher resolution to be attained, and by offering femto-second dynamical information. The penetration of soft X-rays, typically a few hundred nanometers, permits bulk properties to be probed, and the use of very thin windows facilitates liquid and gas phase samples to be studied. Examples of studies are site-selective probing of doping induced states in high T{sub c} superconductors, molecular structure of liquid water and water-alcohol mix, and in situ studies of actinide chemistry in nuclear waste storage. (author)}
place = {Poland}
year = {2004}
month = {Jul}
}
title = {Soft X-ray resonant inelastic scattering for materials science[Full text article has been submitted to the ''Journal of Alloys and Compounds'' (Elsevier)]}
author = {Nordgren, E J}
abstractNote = {The introduction of the third generation of synchrotron radiation sources in the early nineties facilitated greatly tunability of the excitation of soft X-ray emission. This led to strong development of resonant soft X-ray emission spectroscopy or resonant inelastic scattering spectroscopy, which has emerged as a new and valuable tool to study the electronic structure of matter. Tunability of the excitation allows elemental as well as chemical selectivity in a compound system, i.e. even the same atomic species in slightly different chemical surroundings can be separately studied. The emission process subsequent to the primary X-ray absorption (excitation) yields information about the electronic structure at the selected chemical site. It means that the contrast mechanisms present for the X-ray absorption process are used to attain selectivity with respect to e.g. site, orientation, magnetic moment, etc., and the emission process probes the electronic structure relevant for the selected species. Resonant excitation enhances the inelastic scattering process, which adds further to the information content, e.g. by allowing higher resolution to be attained, and by offering femto-second dynamical information. The penetration of soft X-rays, typically a few hundred nanometers, permits bulk properties to be probed, and the use of very thin windows facilitates liquid and gas phase samples to be studied. Examples of studies are site-selective probing of doping induced states in high T{sub c} superconductors, molecular structure of liquid water and water-alcohol mix, and in situ studies of actinide chemistry in nuclear waste storage. (author)}
place = {Poland}
year = {2004}
month = {Jul}
}