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Theoretical and experimental study of ions focusing systems in order to improve the ions beam brightness by suppressing aberration causes; Etude theorique et experimentale de la focalisation des ions afin d'ameliorer la brillance du faisceau ionique par la suppression des causes d'aberration

Abstract

It is shown that a beam brightness can be improved by an order of magnitude when the sources of aberrations are suppressed in the anode region source, as well as in the extraction region and in the electrostatic focusing system. A calculation was first set up to determine a simple focusing system. The aberration ratio due to this focusing system is smaller than 10 to 15 per cent. The experimental study was developed by using an ion source and its extraction system capable of producing an aberration free beam at an energy of 20 keV and an accelerating unit up to 190 keV that confirms that the qualities of a 35 mA beam produced by the said ion source are not spoiled when the beam goes through the focusing and accelerating system that was designed to be aberration free. (author) [French] Dans ce travail, on s'attache a demontrer que la brillance d'un faisceau peut etre amelioree d'un ordre de grandeur lorsque l'on supprime les causes d'aberration aussi bien a la sortie de la source, dans la zone d'extraction, que dans le systeme de focalisation electrostatique. Un calcul est, tout d'abord, mis au point pour determiner un systeme de focalisation simple.  More>>
Authors:
Publication Date:
Jul 01, 1966
Product Type:
Technical Report
Report Number:
CEA-R-3002
Resource Relation:
Other Information: 15 refs; PBD: 1966
Subject:
43 PARTICLE ACCELERATORS; BEAM LUMINOSITY; BEAM SHAPING; DUOPLASMATRONS; FOCUSING; ION SOURCES; LIOUVILLE THEOREM; MAGNETIC SHIELDING; POISSON EQUATION
OSTI ID:
20468548
Research Organizations:
Commissariat a l'Energie Atomique, Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France)
Country of Origin:
France
Language:
French
Other Identifying Numbers:
TRN: FR04R3002044258
Availability:
Available from INIS in electronic form
Submitting Site:
FRN
Size:
[73] pages
Announcement Date:

Citation Formats

Faure, J. Theoretical and experimental study of ions focusing systems in order to improve the ions beam brightness by suppressing aberration causes; Etude theorique et experimentale de la focalisation des ions afin d'ameliorer la brillance du faisceau ionique par la suppression des causes d'aberration. France: N. p., 1966. Web.
Faure, J. Theoretical and experimental study of ions focusing systems in order to improve the ions beam brightness by suppressing aberration causes; Etude theorique et experimentale de la focalisation des ions afin d'ameliorer la brillance du faisceau ionique par la suppression des causes d'aberration. France.
Faure, J. 1966. "Theoretical and experimental study of ions focusing systems in order to improve the ions beam brightness by suppressing aberration causes; Etude theorique et experimentale de la focalisation des ions afin d'ameliorer la brillance du faisceau ionique par la suppression des causes d'aberration." France.
@misc{etde_20468548,
title = {Theoretical and experimental study of ions focusing systems in order to improve the ions beam brightness by suppressing aberration causes; Etude theorique et experimentale de la focalisation des ions afin d'ameliorer la brillance du faisceau ionique par la suppression des causes d'aberration}
author = {Faure, J}
abstractNote = {It is shown that a beam brightness can be improved by an order of magnitude when the sources of aberrations are suppressed in the anode region source, as well as in the extraction region and in the electrostatic focusing system. A calculation was first set up to determine a simple focusing system. The aberration ratio due to this focusing system is smaller than 10 to 15 per cent. The experimental study was developed by using an ion source and its extraction system capable of producing an aberration free beam at an energy of 20 keV and an accelerating unit up to 190 keV that confirms that the qualities of a 35 mA beam produced by the said ion source are not spoiled when the beam goes through the focusing and accelerating system that was designed to be aberration free. (author) [French] Dans ce travail, on s'attache a demontrer que la brillance d'un faisceau peut etre amelioree d'un ordre de grandeur lorsque l'on supprime les causes d'aberration aussi bien a la sortie de la source, dans la zone d'extraction, que dans le systeme de focalisation electrostatique. Un calcul est, tout d'abord, mis au point pour determiner un systeme de focalisation simple. Cette focalisation n'entraine pas un taux d'aberrations superieur a 10 ou 15 pour cent. Puis l'etude experimentale conduit: a) a la realisation d'une source et de son systeme d'extraction fournissant un faisceau sans aberration a une energie de 20 keV. b) et a l'elaboration d'un petit accelerateur a 190 keV qui verifie que les proprietes d'un faisceau de 35 mA issu de la source ne sont pas affectees par la traversee des systemes focalisateur et accelerateur lorsque ceux-ci n'apportent pas d'aberration. (auteur)}
place = {France}
year = {1966}
month = {Jul}
}