You need JavaScript to view this

Statistical data and results obtained on irradiated transistors 2N.2221 Sesco and 2N.2907 SGS; Donnees de fiabilite et resultats statistiques obtenus sur des transistors 2n.2221 Sesco et 2n.2907 SGS irradies

Abstract

This document provides results obtained on many samples of transistors irradiated in the laboratories of the Institut of Nuclear Physic of Lyon. The physical aspects of the irradiation,the statistical aspects of the study and the reliability under irradiation have been studied, but the accent is done on the statistical analysis. (A.L.B.)
Authors:
Publication Date:
Jul 01, 1966
Product Type:
Technical Report
Report Number:
CEA-N-810
Resource Relation:
Other Information: 4 refs; PBD: 1966
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CONTAMINATION; CORRELATIONS; PHYSICAL RADIATION EFFECTS; STATISTICAL DATA; STATISTICAL MODELS; TRANSISTORS
OSTI ID:
20468455
Research Organizations:
Commissariat a l'Energie Atomique, Centre d'Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France)
Country of Origin:
France
Language:
French
Other Identifying Numbers:
TRN: FR04N0810044165
Availability:
Available from INIS in electronic form
Submitting Site:
FRN
Size:
91 pages
Announcement Date:

Citation Formats

Blin, A, and Le Ber, J. Statistical data and results obtained on irradiated transistors 2N.2221 Sesco and 2N.2907 SGS; Donnees de fiabilite et resultats statistiques obtenus sur des transistors 2n.2221 Sesco et 2n.2907 SGS irradies. France: N. p., 1966. Web.
Blin, A, & Le Ber, J. Statistical data and results obtained on irradiated transistors 2N.2221 Sesco and 2N.2907 SGS; Donnees de fiabilite et resultats statistiques obtenus sur des transistors 2n.2221 Sesco et 2n.2907 SGS irradies. France.
Blin, A, and Le Ber, J. 1966. "Statistical data and results obtained on irradiated transistors 2N.2221 Sesco and 2N.2907 SGS; Donnees de fiabilite et resultats statistiques obtenus sur des transistors 2n.2221 Sesco et 2n.2907 SGS irradies." France.
@misc{etde_20468455,
title = {Statistical data and results obtained on irradiated transistors 2N.2221 Sesco and 2N.2907 SGS; Donnees de fiabilite et resultats statistiques obtenus sur des transistors 2n.2221 Sesco et 2n.2907 SGS irradies}
author = {Blin, A, and Le Ber, J}
abstractNote = {This document provides results obtained on many samples of transistors irradiated in the laboratories of the Institut of Nuclear Physic of Lyon. The physical aspects of the irradiation,the statistical aspects of the study and the reliability under irradiation have been studied, but the accent is done on the statistical analysis. (A.L.B.)}
place = {France}
year = {1966}
month = {Jul}
}