You need JavaScript to view this

Sulfur-doping of rutile-titanium dioxide by ion implantation: Photocurrent spectroscopy and first-principles band calculation studies

Abstract

Sulfur (S)-doped titanium dioxide (TiO{sub 2}) was synthesized by ion implantation and subsequent thermal annealing. The S ions were implanted into the single crystals of rutile TiO{sub 2} at a fluence of 8x10{sup 15} ions/cm{sup 2}. According to the results of Rutherford backscattering spectroscopy and ion channeling analysis, the irradiation damage recovered by annealing at 600 deg. C in air. In the annealed crystal, the S atoms occupied oxygen sites for form Ti-S bonds, as confirmed by x-ray photoelectron spectroscopy. Compared to the pure TiO{sub 2}, a photocurrent was observed in the lower-energy regions for the S-doped TiO{sub 2}. Based on the theoretical analyses by the first-principles band calculations using the full potential linearized augmented plane-wave methods within the generalized gradient approximation, the mixing of the S 3p states with the valence band (VB) was found to contribute to the increasing width of the VB. This leads to the band gap narrowing in the S-doped TiO{sub 2}. Therefore, the photon-to-carrier conversion was induced during irradiation by visible light above 420 nm (<2.9 eV)
Publication Date:
May 01, 2003
Product Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 93; Journal Issue: 9; Other Information: DOI: 10.1063/1.1565693; (c) 2003 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); PBD: 1 May 2003
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CRYSTAL DOPING; DOPED MATERIALS; ION IMPLANTATION; MONOCRYSTALS; PHOTOCURRENTS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SULFUR IONS; TITANIUM OXIDES; VALENCE; VISIBLE RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY
OSTI ID:
20417275
Country of Origin:
United States
Language:
English
Other Identifying Numbers:
Journal ID: ISSN 0021-8979; JAPIAU; TRN: US03C4618002004
Submitting Site:
INIS
Size:
page(s) 5156-5160
Announcement Date:
Jan 29, 2004

Citation Formats

Umebayashi, T, Yamaki, T, Yamamoto, S, Miyashita, A, Tanaka, S, Sumita, T, Asai, K, Department of Materials Development, Takasaki Radiation Chemistry Research Establishment, Japan and Atomic Energy Research Institute (JAERI), 1233 Watanuki, Takasaki, Gunma 370-1292 (Japan), Technology Research Department, National Space Development Agency of Japan (NASDA), 2-1-1 Sengen, Tsukuba, Ibaraki 305-8505 (Japan), and Department of Quantum Engineering and Systems Science, Graduate School of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan)]. Sulfur-doping of rutile-titanium dioxide by ion implantation: Photocurrent spectroscopy and first-principles band calculation studies. United States: N. p., 2003. Web. doi:10.1063/1.1565693.
Umebayashi, T, Yamaki, T, Yamamoto, S, Miyashita, A, Tanaka, S, Sumita, T, Asai, K, Department of Materials Development, Takasaki Radiation Chemistry Research Establishment, Japan and Atomic Energy Research Institute (JAERI), 1233 Watanuki, Takasaki, Gunma 370-1292 (Japan), Technology Research Department, National Space Development Agency of Japan (NASDA), 2-1-1 Sengen, Tsukuba, Ibaraki 305-8505 (Japan), &amp; Department of Quantum Engineering and Systems Science, Graduate School of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan)]. Sulfur-doping of rutile-titanium dioxide by ion implantation: Photocurrent spectroscopy and first-principles band calculation studies. United States. https://doi.org/10.1063/1.1565693
Umebayashi, T, Yamaki, T, Yamamoto, S, Miyashita, A, Tanaka, S, Sumita, T, Asai, K, Department of Materials Development, Takasaki Radiation Chemistry Research Establishment, Japan and Atomic Energy Research Institute (JAERI), 1233 Watanuki, Takasaki, Gunma 370-1292 (Japan), Technology Research Department, National Space Development Agency of Japan (NASDA), 2-1-1 Sengen, Tsukuba, Ibaraki 305-8505 (Japan), and Department of Quantum Engineering and Systems Science, Graduate School of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan)]. 2003. "Sulfur-doping of rutile-titanium dioxide by ion implantation: Photocurrent spectroscopy and first-principles band calculation studies." United States. https://doi.org/10.1063/1.1565693.
@misc{etde_20417275,
title = {Sulfur-doping of rutile-titanium dioxide by ion implantation: Photocurrent spectroscopy and first-principles band calculation studies}
author = {Umebayashi, T, Yamaki, T, Yamamoto, S, Miyashita, A, Tanaka, S, Sumita, T, Asai, K, Department of Materials Development, Takasaki Radiation Chemistry Research Establishment, Japan and Atomic Energy Research Institute (JAERI), 1233 Watanuki, Takasaki, Gunma 370-1292 (Japan), Technology Research Department, National Space Development Agency of Japan (NASDA), 2-1-1 Sengen, Tsukuba, Ibaraki 305-8505 (Japan), and Department of Quantum Engineering and Systems Science, Graduate School of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656 (Japan)]}
abstractNote = {Sulfur (S)-doped titanium dioxide (TiO{sub 2}) was synthesized by ion implantation and subsequent thermal annealing. The S ions were implanted into the single crystals of rutile TiO{sub 2} at a fluence of 8x10{sup 15} ions/cm{sup 2}. According to the results of Rutherford backscattering spectroscopy and ion channeling analysis, the irradiation damage recovered by annealing at 600 deg. C in air. In the annealed crystal, the S atoms occupied oxygen sites for form Ti-S bonds, as confirmed by x-ray photoelectron spectroscopy. Compared to the pure TiO{sub 2}, a photocurrent was observed in the lower-energy regions for the S-doped TiO{sub 2}. Based on the theoretical analyses by the first-principles band calculations using the full potential linearized augmented plane-wave methods within the generalized gradient approximation, the mixing of the S 3p states with the valence band (VB) was found to contribute to the increasing width of the VB. This leads to the band gap narrowing in the S-doped TiO{sub 2}. Therefore, the photon-to-carrier conversion was induced during irradiation by visible light above 420 nm (<2.9 eV)}
doi = {10.1063/1.1565693}
journal = []
issue = {9}
volume = {93}
journal type = {AC}
place = {United States}
year = {2003}
month = {May}
}