Abstract
Soft error induced by cosmic ray was becoming a problem also on the earth surface together with more integration/minuteness of memory device, and therefore, survey of the research trend and extraction of R and D subjects were carried out as to the difference in the state of occurrence of single event upset (SEU) and the evaluation method using neutron beam. Concerning the state of SEU occurrence, survey was made paying attention to the field test, accelerator test and airplane test. There were few reports on the field test, and it was found that it was difficult to arrange environmental parameters. Relating to the mechanism of SEU occurrence, confirmed was a possibility that there was a difference in SEU between proton beam and neutron beam. Further, as to the measurement and simulation of neutron spectra, it was found that there was no enough accuracy. About the evaluation method for neutron beam resistance, it was found that the high energy neutron beam emission device was becoming usable. The paper also outlined the SEU evaluation method. (NEDO)
Citation Formats
None.
FY 2000 report on the investigational study of neutron resistance of high functional semiconductor parts. Summary; Chosa hokokusho. Kokino handotai buhin no chuseisisen taisei no chosa kenkyu(Yoyaku ban).
Japan: N. p.,
2001.
Web.
None.
FY 2000 report on the investigational study of neutron resistance of high functional semiconductor parts. Summary; Chosa hokokusho. Kokino handotai buhin no chuseisisen taisei no chosa kenkyu(Yoyaku ban).
Japan.
None.
2001.
"FY 2000 report on the investigational study of neutron resistance of high functional semiconductor parts. Summary; Chosa hokokusho. Kokino handotai buhin no chuseisisen taisei no chosa kenkyu(Yoyaku ban)."
Japan.
@misc{etde_20242026,
title = {FY 2000 report on the investigational study of neutron resistance of high functional semiconductor parts. Summary; Chosa hokokusho. Kokino handotai buhin no chuseisisen taisei no chosa kenkyu(Yoyaku ban)}
author = {None}
abstractNote = {Soft error induced by cosmic ray was becoming a problem also on the earth surface together with more integration/minuteness of memory device, and therefore, survey of the research trend and extraction of R and D subjects were carried out as to the difference in the state of occurrence of single event upset (SEU) and the evaluation method using neutron beam. Concerning the state of SEU occurrence, survey was made paying attention to the field test, accelerator test and airplane test. There were few reports on the field test, and it was found that it was difficult to arrange environmental parameters. Relating to the mechanism of SEU occurrence, confirmed was a possibility that there was a difference in SEU between proton beam and neutron beam. Further, as to the measurement and simulation of neutron spectra, it was found that there was no enough accuracy. About the evaluation method for neutron beam resistance, it was found that the high energy neutron beam emission device was becoming usable. The paper also outlined the SEU evaluation method. (NEDO)}
place = {Japan}
year = {2001}
month = {Mar}
}
title = {FY 2000 report on the investigational study of neutron resistance of high functional semiconductor parts. Summary; Chosa hokokusho. Kokino handotai buhin no chuseisisen taisei no chosa kenkyu(Yoyaku ban)}
author = {None}
abstractNote = {Soft error induced by cosmic ray was becoming a problem also on the earth surface together with more integration/minuteness of memory device, and therefore, survey of the research trend and extraction of R and D subjects were carried out as to the difference in the state of occurrence of single event upset (SEU) and the evaluation method using neutron beam. Concerning the state of SEU occurrence, survey was made paying attention to the field test, accelerator test and airplane test. There were few reports on the field test, and it was found that it was difficult to arrange environmental parameters. Relating to the mechanism of SEU occurrence, confirmed was a possibility that there was a difference in SEU between proton beam and neutron beam. Further, as to the measurement and simulation of neutron spectra, it was found that there was no enough accuracy. About the evaluation method for neutron beam resistance, it was found that the high energy neutron beam emission device was becoming usable. The paper also outlined the SEU evaluation method. (NEDO)}
place = {Japan}
year = {2001}
month = {Mar}
}