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Percolation modelling for highly aligned polycrystalline superconducting tapes

Abstract

Surface and bulk texture measurements have been carried out on highly aligned NiFe tapes, suitable for use as coated conductor substrates. Data from small-area electron backscatter diffraction measurements are compared with those from bulk x-ray analysis in the development of a two-dimensional percolation model, and the two are shown to give very similar results. No evidence of grain-to-grain correlation is found. The model is then developed to assess how the properties of a superconducting layer grown epitaxially on buffered tapes will depend on parameters such as sample size, grain size and the extent of grain alignment. (author)
Authors:
Rutter, N A; Glowacki, B A; Evetts, J E; [1]  IRC in Superconductivity, Madingley Road, Cambridge CB3 0HE (United Kingdom)]
  1. Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ (United Kingdom)
Publication Date:
Nov 01, 2000
Product Type:
Journal Article
Reference Number:
EDB-00:098943
Resource Relation:
Journal Name: Superconductor Science and Technology (Online); Journal Volume: 13; Journal Issue: 11; Other Information: Country of input: IAEA; 14 refs; PBD: Nov 2000
Subject:
36 MATERIALS SCIENCE; EPITAXY; GRAIN ORIENTATION; GRAIN SIZE; POLYCRYSTALS; SUPERCONDUCTING FILMS; SUPERCONDUCTING WIRES; SUPERCONDUCTIVITY
OSTI ID:
20107042
Country of Origin:
United Kingdom
Language:
English
Other Identifying Numbers:
Journal ID: ISSN 1361-6668; TRN: GB00$5786053766
Submitting Site:
GBN
Size:
page(s) L25-L30
Announcement Date:

Citation Formats

Rutter, N A, Glowacki, B A, Evetts, J E, and IRC in Superconductivity, Madingley Road, Cambridge CB3 0HE (United Kingdom)]. Percolation modelling for highly aligned polycrystalline superconducting tapes. United Kingdom: N. p., 2000. Web. doi:10.1088/0953-2048/13/11/101.
Rutter, N A, Glowacki, B A, Evetts, J E, & IRC in Superconductivity, Madingley Road, Cambridge CB3 0HE (United Kingdom)]. Percolation modelling for highly aligned polycrystalline superconducting tapes. United Kingdom. doi:10.1088/0953-2048/13/11/101.
Rutter, N A, Glowacki, B A, Evetts, J E, and IRC in Superconductivity, Madingley Road, Cambridge CB3 0HE (United Kingdom)]. 2000. "Percolation modelling for highly aligned polycrystalline superconducting tapes." United Kingdom. doi:10.1088/0953-2048/13/11/101. https://www.osti.gov/servlets/purl/10.1088/0953-2048/13/11/101.
@misc{etde_20107042,
title = {Percolation modelling for highly aligned polycrystalline superconducting tapes}
author = {Rutter, N A, Glowacki, B A, Evetts, J E, and IRC in Superconductivity, Madingley Road, Cambridge CB3 0HE (United Kingdom)]}
abstractNote = {Surface and bulk texture measurements have been carried out on highly aligned NiFe tapes, suitable for use as coated conductor substrates. Data from small-area electron backscatter diffraction measurements are compared with those from bulk x-ray analysis in the development of a two-dimensional percolation model, and the two are shown to give very similar results. No evidence of grain-to-grain correlation is found. The model is then developed to assess how the properties of a superconducting layer grown epitaxially on buffered tapes will depend on parameters such as sample size, grain size and the extent of grain alignment. (author)}
doi = {10.1088/0953-2048/13/11/101}
journal = {Superconductor Science and Technology (Online)}
issue = {11}
volume = {13}
journal type = {AC}
place = {United Kingdom}
year = {2000}
month = {Nov}
}