You need JavaScript to view this

Report on results 1998. Standardization of test measuring method of fine ceramics for communication equipment; 1998 nendo seika hokokusho. Tsushin kikiyo fine ceramics no shiken hyoka hoho no hyojunka

Abstract

Technological development is in progress at present for the intelligent transport system for example that uses a microwave frequency range of 60GHz or 90GHz toward the practical use, with a demand increasing for measuring the electrical properties of fine ceramics (FC) to be used in the communication equipment of the system. The measuring method in the microwave frequency range of 30GHz or less is about to be standardized in IEC TC49/WG10; however, the method above 30GHz has not yet been examined for the standardization internationally. The subject research is intended to establish the method of measuring electrical properties such as the dielectric constant of FC for a high-frequency/ultra high-frequency wave range, dielectric loss and surface resistivity, to standardize the principle of their measuring methods, measuring tools, adjusting method of samples, procedures of measurement, etc., and to aim at the international standardization. This year, investigation and examination were carried out on various measuring methods including overseas examinations in the U.S., extracting the Fabry-Perot resonator method and a conductive cylindrical dielectric cavity resonator perturbation method for example, and evaluating the specifications of standard reference materials. In addition, a morphological technique was established for measuring sample surfaces affecting measurements, by means of an  More>>
Publication Date:
Mar 01, 1999
Product Type:
Technical Report
Report Number:
JP-NEDO-010013420
Resource Relation:
Other Information: PBD: Mar 1999
Subject:
36 MATERIALS SCIENCE; FINE STRUCTURE; CERAMICS; ELECTRICAL PROPERTIES; COMMUNICATIONS; INTERNATIONAL REGULATIONS; DIELECTRIC PROPERTIES; GHZ RANGE; MEASURING INSTRUMENTS
OSTI ID:
20029274
Research Organizations:
New Energy and Industrial Technology Development Organization, Tokyo (Japan)
Country of Origin:
Japan
Language:
Japanese
Other Identifying Numbers:
TRN: JN9940488
Availability:
Available to ETDE participating countries only(see www.etde.org); commercial reproduction prohibited; OSTI as DE20029274
Submitting Site:
NEDO
Size:
112 pages
Announcement Date:
Apr 08, 2002

Citation Formats

None. Report on results 1998. Standardization of test measuring method of fine ceramics for communication equipment; 1998 nendo seika hokokusho. Tsushin kikiyo fine ceramics no shiken hyoka hoho no hyojunka. Japan: N. p., 1999. Web.
None. Report on results 1998. Standardization of test measuring method of fine ceramics for communication equipment; 1998 nendo seika hokokusho. Tsushin kikiyo fine ceramics no shiken hyoka hoho no hyojunka. Japan.
None. 1999. "Report on results 1998. Standardization of test measuring method of fine ceramics for communication equipment; 1998 nendo seika hokokusho. Tsushin kikiyo fine ceramics no shiken hyoka hoho no hyojunka." Japan.
@misc{etde_20029274,
title = {Report on results 1998. Standardization of test measuring method of fine ceramics for communication equipment; 1998 nendo seika hokokusho. Tsushin kikiyo fine ceramics no shiken hyoka hoho no hyojunka}
author = {None}
abstractNote = {Technological development is in progress at present for the intelligent transport system for example that uses a microwave frequency range of 60GHz or 90GHz toward the practical use, with a demand increasing for measuring the electrical properties of fine ceramics (FC) to be used in the communication equipment of the system. The measuring method in the microwave frequency range of 30GHz or less is about to be standardized in IEC TC49/WG10; however, the method above 30GHz has not yet been examined for the standardization internationally. The subject research is intended to establish the method of measuring electrical properties such as the dielectric constant of FC for a high-frequency/ultra high-frequency wave range, dielectric loss and surface resistivity, to standardize the principle of their measuring methods, measuring tools, adjusting method of samples, procedures of measurement, etc., and to aim at the international standardization. This year, investigation and examination were carried out on various measuring methods including overseas examinations in the U.S., extracting the Fabry-Perot resonator method and a conductive cylindrical dielectric cavity resonator perturbation method for example, and evaluating the specifications of standard reference materials. In addition, a morphological technique was established for measuring sample surfaces affecting measurements, by means of an accurate measuring instrument for thin film surfaces. (NEDO)}
place = {Japan}
year = {1999}
month = {Mar}
}