Abstract
The synthesis of very small samples has raised the need for a drastic miniaturization of the classical four-probe technique in order to realize electrical resistance measurements. Two methods to realize electrical contacts on very small fibers are described here. Using classical photolithography the electrical resistivity of a submicronic catalytic chemical vapour deposited filament is estimated. Scanning tunneling microscopy (STM) lithography allowed to attach small gold contacts to a small bundle (diameter 50 nm) of carbon nanotubes. This bundle is found to exhibit a semimetallic behavior at higher temperature and an unexpected drop of the electrical resistivity at lower temperature. (orig.)
Langer, L;
[1]
Stockman, L;
[2]
Heremans, J P;
[3]
Bayot, V;
[1]
Olk, C H;
[3]
Haesendonck, C van;
[2]
Bruynseraede, Y;
[2]
Issi, J P
[1]
- Unite de Physico-Chimie et de Physique des Materiaux, Univ. Catholique de Louvain, Louvain-la-Neuve (Belgium)
- Lab. voor Vaste Stof-Fysika en Magnetisme, Katholieke Univ. Leuven (Belgium)
- Physics Dept., General Motors Research, Warren, MI (United States)
Citation Formats
Langer, L, Stockman, L, Heremans, J P, Bayot, V, Olk, C H, Haesendonck, C van, Bruynseraede, Y, and Issi, J P.
Electrical measurements on submicronic synthetic conductors : carbon nanotubes.
Switzerland: N. p.,
1995.
Web.
doi:10.1016/0379-6779(94)02893-4.
Langer, L, Stockman, L, Heremans, J P, Bayot, V, Olk, C H, Haesendonck, C van, Bruynseraede, Y, & Issi, J P.
Electrical measurements on submicronic synthetic conductors : carbon nanotubes.
Switzerland.
https://doi.org/10.1016/0379-6779(94)02893-4
Langer, L, Stockman, L, Heremans, J P, Bayot, V, Olk, C H, Haesendonck, C van, Bruynseraede, Y, and Issi, J P.
1995.
"Electrical measurements on submicronic synthetic conductors : carbon nanotubes."
Switzerland.
https://doi.org/10.1016/0379-6779(94)02893-4.
@misc{etde_196120,
title = {Electrical measurements on submicronic synthetic conductors : carbon nanotubes}
author = {Langer, L, Stockman, L, Heremans, J P, Bayot, V, Olk, C H, Haesendonck, C van, Bruynseraede, Y, and Issi, J P}
abstractNote = {The synthesis of very small samples has raised the need for a drastic miniaturization of the classical four-probe technique in order to realize electrical resistance measurements. Two methods to realize electrical contacts on very small fibers are described here. Using classical photolithography the electrical resistivity of a submicronic catalytic chemical vapour deposited filament is estimated. Scanning tunneling microscopy (STM) lithography allowed to attach small gold contacts to a small bundle (diameter 50 nm) of carbon nanotubes. This bundle is found to exhibit a semimetallic behavior at higher temperature and an unexpected drop of the electrical resistivity at lower temperature. (orig.)}
doi = {10.1016/0379-6779(94)02893-4}
journal = []
issue = {1-3}
volume = {70}
journal type = {AC}
place = {Switzerland}
year = {1995}
month = {Mar}
}
title = {Electrical measurements on submicronic synthetic conductors : carbon nanotubes}
author = {Langer, L, Stockman, L, Heremans, J P, Bayot, V, Olk, C H, Haesendonck, C van, Bruynseraede, Y, and Issi, J P}
abstractNote = {The synthesis of very small samples has raised the need for a drastic miniaturization of the classical four-probe technique in order to realize electrical resistance measurements. Two methods to realize electrical contacts on very small fibers are described here. Using classical photolithography the electrical resistivity of a submicronic catalytic chemical vapour deposited filament is estimated. Scanning tunneling microscopy (STM) lithography allowed to attach small gold contacts to a small bundle (diameter 50 nm) of carbon nanotubes. This bundle is found to exhibit a semimetallic behavior at higher temperature and an unexpected drop of the electrical resistivity at lower temperature. (orig.)}
doi = {10.1016/0379-6779(94)02893-4}
journal = []
issue = {1-3}
volume = {70}
journal type = {AC}
place = {Switzerland}
year = {1995}
month = {Mar}
}