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Protons and heavy ions induced stuck bits on large capacity RAMs

Abstract

A semi-permanent imprint effect has been observed, on large capacity memories (static and dynamic), during heavy ion and proton irradiations. The experimental circumstances of stuck bits occurrence are described and the influence of irradiation conditions discussed. A total dose testing complete the investigation. (author). 10 refs., 5 figs., 3 tabs.
Authors:
Duzellier, S; Falguere, D; Ecoffet, R [1] 
  1. Centre National d`Etudes Spatiales (CNES), 31 - Toulouse (France)
Publication Date:
Dec 31, 1994
Product Type:
Book
Report Number:
CONF-9309349-
Reference Number:
SCA: 440200; PA: AIX-27:008818; EDB-96:039455; SN: 96001535773
Resource Relation:
Conference: Symposium on radiations and their effects on components and systems, Saint-Malo (France), 13 Sep 1993; Other Information: PBD: 1994; Related Information: Is Part Of Radiation and its effects on components and systems; PB: 596 p.
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; INTEGRATED CIRCUITS; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR STORAGE DEVICES; ANNEALING; BROMINE; BURNOUT; CARBON; CARRIER LIFETIME; CHLORINE; COBALT 60; DIFFERENTIAL CROSS SECTIONS; ERRORS; EXPERIMENTAL DATA; FAILURES; FLUORINE; GAMMA RADIATION; HEAVY IONS; IODINE; KRYPTON; LET; LITHIUM; MAGNESIUM; NICKEL; ORSAY TANDEM ACCELERATOR; OXYGEN; PROBABILITY; PROTON BEAMS; PROTONS; PULSED IRRADIATION; SATURNE; SPACE DEPENDENCE
OSTI ID:
182359
Research Organizations:
CEA Centre d`Etudes de Bruyeres-le-Chatel, 91 (France)
Country of Origin:
France
Language:
English
Other Identifying Numbers:
TRN: FR9502556008818
Submitting Site:
FRN
Size:
pp. 468-472
Announcement Date:
Jan 17, 2004

Citation Formats

Duzellier, S, Falguere, D, and Ecoffet, R. Protons and heavy ions induced stuck bits on large capacity RAMs. France: N. p., 1994. Web.
Duzellier, S, Falguere, D, & Ecoffet, R. Protons and heavy ions induced stuck bits on large capacity RAMs. France.
Duzellier, S, Falguere, D, and Ecoffet, R. 1994. "Protons and heavy ions induced stuck bits on large capacity RAMs." France.
@misc{etde_182359,
title = {Protons and heavy ions induced stuck bits on large capacity RAMs}
author = {Duzellier, S, Falguere, D, and Ecoffet, R}
abstractNote = {A semi-permanent imprint effect has been observed, on large capacity memories (static and dynamic), during heavy ion and proton irradiations. The experimental circumstances of stuck bits occurrence are described and the influence of irradiation conditions discussed. A total dose testing complete the investigation. (author). 10 refs., 5 figs., 3 tabs.}
place = {France}
year = {1994}
month = {Dec}
}