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Ion optics of a high resolution multipassage mass spectrometer with electrostatic ion mirrors

Abstract

Ion trajectories in an electrostatic ion mirror are calculated. The interferences of the extended fringing fields of the mirror with finite aperture are studied. The results of the calculations are represented by three transfer matrices, which describe ion trajectories under the effects of a fringing field at the entrances, of an idealized mirror region, and of a fringing field at the exit. The focusing effects and ion-optical properties of mass spectrometers with electrostatic ion mirrors can be evaluated by using these transfer matrices. A high performance multipassage mass spectrometer is designed. The system has one magnet and four electrostatic sector analyzers and two ion mirrors. The double focusing condition and stigmatic focusing condition are achieved in any passage of the system. The mass resolution increases linearly with the number of passages in a magnet. (orig.).
Authors:
Sakurai, T; [1]  Baril, M [2] 
  1. Osaka Univ. (Japan). Dept. of Physics
  2. Departement de Physique, Faculte des Sciences et de Genie, Universite Laval, Ste-Foy, Quebec G1K 7P4 (Canada)
Publication Date:
Sep 01, 1995
Product Type:
Journal Article
Report Number:
CONF-9410229-
Reference Number:
SCA: 440101; PA: AIX-26:077642; EDB-96:019838; SN: 96001513014
Resource Relation:
Journal Name: Nuclear Instruments and Methods in Physics Research, Section A; Journal Volume: 363; Journal Issue: 1-2; Conference: 4. international conference on charged particle optics, Tsukuba (Japan), 3-6 Oct 1994; Other Information: PBD: 1 Sep 1995
Subject:
44 INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS; MASS SPECTROMETERS; BEAM OPTICS; APERTURES; BEAM PROFILES; ELECTRIC FIELDS; ELECTROSTATIC ANALYZERS; ELECTROSTATICS; FLAT MAGNETIC SPECTROMETERS; FOCUSING; GEOMETRICAL ABERRATIONS; INHOMOGENEOUS FIELDS; INTERFERENCE; ION BEAMS; MAGNETIC FIELDS; MAGNETS; MASS RESOLUTION; MATRICES; MIRRORS; TRAJECTORIES; TRANSFER MATRIX METHOD
OSTI ID:
156427
Country of Origin:
Netherlands
Language:
English
Other Identifying Numbers:
Journal ID: NIMAER; ISSN 0168-9002; TRN: NL95FI869077642
Submitting Site:
NLN
Size:
pp. 473-476
Announcement Date:
Jan 17, 1996

Citation Formats

Sakurai, T, and Baril, M. Ion optics of a high resolution multipassage mass spectrometer with electrostatic ion mirrors. Netherlands: N. p., 1995. Web. doi:10.1016/0168-9002(95)00063-1.
Sakurai, T, & Baril, M. Ion optics of a high resolution multipassage mass spectrometer with electrostatic ion mirrors. Netherlands. https://doi.org/10.1016/0168-9002(95)00063-1
Sakurai, T, and Baril, M. 1995. "Ion optics of a high resolution multipassage mass spectrometer with electrostatic ion mirrors." Netherlands. https://doi.org/10.1016/0168-9002(95)00063-1.
@misc{etde_156427,
title = {Ion optics of a high resolution multipassage mass spectrometer with electrostatic ion mirrors}
author = {Sakurai, T, and Baril, M}
abstractNote = {Ion trajectories in an electrostatic ion mirror are calculated. The interferences of the extended fringing fields of the mirror with finite aperture are studied. The results of the calculations are represented by three transfer matrices, which describe ion trajectories under the effects of a fringing field at the entrances, of an idealized mirror region, and of a fringing field at the exit. The focusing effects and ion-optical properties of mass spectrometers with electrostatic ion mirrors can be evaluated by using these transfer matrices. A high performance multipassage mass spectrometer is designed. The system has one magnet and four electrostatic sector analyzers and two ion mirrors. The double focusing condition and stigmatic focusing condition are achieved in any passage of the system. The mass resolution increases linearly with the number of passages in a magnet. (orig.).}
doi = {10.1016/0168-9002(95)00063-1}
journal = []
issue = {1-2}
volume = {363}
journal type = {AC}
place = {Netherlands}
year = {1995}
month = {Sep}
}