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Positron annihilation in electron irradiated GaAs: atomic structure and charge state of the defects

Abstract

Positron lifetime measurements show that electron irradiation produces negative vacancies and negative ions at 20 K in semi-insulating GaAs. The vacancies anneal between 77-500 K with a sharp stage in the range 270-370 K. The ions anneal at high temperature above 450 K. The negative ions are identified to isolated gallium antisites. The negative vacancies are identified to gallium vacancies either isolated or involved in negatively-charged complexes. The introduction rate of the gallium antisites is estimated to be 1.8{+-}0.4 cm{sup -1} after 1.5 MeV electron irradiation at 20 K.
Authors:
Corbel, C; Pierre, F; [1]  Moser, P; [2]  Hautojarvi, P; Saarinen, K [3] 
  1. Institut National des Sciences et Techniques Nucleaires (INSTN), Centre d`Etudes de Saclay, 91 - Gif-sur-Yvette (France)
  2. CEA Centre d`Etudes de Grenoble, 38 (France). Dept. de Recherche Fondamentale sur la Matiere Condensee
  3. Helsinki Univ. of Technology, Espoo (Finland). Lab. of Physics
Publication Date:
Dec 31, 1991
Product Type:
Conference
Report Number:
CEA-CONF-11233; CONF-9107146-
Reference Number:
SCA: 665100; PA: AIX-24:044097; SN: 93000991987
Resource Relation:
Conference: 16. international conference on defects in semiconductors,Bethlehem, PA (United States),22-26 Jul 1991; Other Information: PBD: 1991
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; GALLIUM ARSENIDES; VACANCIES; ANNEALING; ANNIHILATION; ELECTRONS; LIFETIME; PHYSICAL RADIATION EFFECTS; POSITRONS; TEMPERATURE DEPENDENCE; TRAPPING; 665100; NUCLEAR TECHNIQUES IN CONDENSED MATTER PHYSICS
OSTI ID:
10154138
Research Organizations:
Institut National des Sciences et Techniques Nucleaires (INSTN), Centre d`Etudes de Saclay, 91 - Gif-sur-Yvette (France)
Country of Origin:
France
Language:
English
Other Identifying Numbers:
Other: ON: DE93627276; TRN: FR9302181044097
Availability:
OSTI; NTIS (US Sales Only); INIS
Submitting Site:
FRN
Size:
[6] p.
Announcement Date:
Jun 17, 1993

Citation Formats

Corbel, C, Pierre, F, Moser, P, Hautojarvi, P, and Saarinen, K. Positron annihilation in electron irradiated GaAs: atomic structure and charge state of the defects. France: N. p., 1991. Web.
Corbel, C, Pierre, F, Moser, P, Hautojarvi, P, & Saarinen, K. Positron annihilation in electron irradiated GaAs: atomic structure and charge state of the defects. France.
Corbel, C, Pierre, F, Moser, P, Hautojarvi, P, and Saarinen, K. 1991. "Positron annihilation in electron irradiated GaAs: atomic structure and charge state of the defects." France.
@misc{etde_10154138,
title = {Positron annihilation in electron irradiated GaAs: atomic structure and charge state of the defects}
author = {Corbel, C, Pierre, F, Moser, P, Hautojarvi, P, and Saarinen, K}
abstractNote = {Positron lifetime measurements show that electron irradiation produces negative vacancies and negative ions at 20 K in semi-insulating GaAs. The vacancies anneal between 77-500 K with a sharp stage in the range 270-370 K. The ions anneal at high temperature above 450 K. The negative ions are identified to isolated gallium antisites. The negative vacancies are identified to gallium vacancies either isolated or involved in negatively-charged complexes. The introduction rate of the gallium antisites is estimated to be 1.8{+-}0.4 cm{sup -1} after 1.5 MeV electron irradiation at 20 K.}
place = {France}
year = {1991}
month = {Dec}
}