Abstract
Doppler broadening measurements on C{sup 4+}, C{sup 2+}, O{sup 4+}, O{sup 3+} and O{sup 2+} spectral lines in the quartz-UV region are performed on the Extrap-T1 reversed field pinch using a 1-m Czerny-Turner spectrometer and a gated, intensified 1024 pixel OMA. This paper describes the equipment, and the numerical methods used to extract the ion temperature from spectral lines via spectral lineshape fitting. Extensive simulations have been made in order to estimate the error introduced in T{sub i} due to the lineshape fitting process and photon statistics. A lowest measurable limit of line broadenings has also been estimated. 13 refs, 7 figs, 2 tabs.
Hoerling, P;
Rachlew-Kaellne, E;
Zastrow, K D;
[1]
Brzozowski, J H
[2]
- Royal Inst. of Tech., Stockholm (Sweden). Dept. of Physics 1
- Royal Inst. of Tech., Stockholm (Sweden). Dept. of Fusion Plasma Physics
Citation Formats
Hoerling, P, Rachlew-Kaellne, E, Zastrow, K D, and Brzozowski, J H.
A method for ion temperature measurements at the Extrap-T1 reversed field pinch.
Sweden: N. p.,
1993.
Web.
Hoerling, P, Rachlew-Kaellne, E, Zastrow, K D, & Brzozowski, J H.
A method for ion temperature measurements at the Extrap-T1 reversed field pinch.
Sweden.
Hoerling, P, Rachlew-Kaellne, E, Zastrow, K D, and Brzozowski, J H.
1993.
"A method for ion temperature measurements at the Extrap-T1 reversed field pinch."
Sweden.
@misc{etde_10152872,
title = {A method for ion temperature measurements at the Extrap-T1 reversed field pinch}
author = {Hoerling, P, Rachlew-Kaellne, E, Zastrow, K D, and Brzozowski, J H}
abstractNote = {Doppler broadening measurements on C{sup 4+}, C{sup 2+}, O{sup 4+}, O{sup 3+} and O{sup 2+} spectral lines in the quartz-UV region are performed on the Extrap-T1 reversed field pinch using a 1-m Czerny-Turner spectrometer and a gated, intensified 1024 pixel OMA. This paper describes the equipment, and the numerical methods used to extract the ion temperature from spectral lines via spectral lineshape fitting. Extensive simulations have been made in order to estimate the error introduced in T{sub i} due to the lineshape fitting process and photon statistics. A lowest measurable limit of line broadenings has also been estimated. 13 refs, 7 figs, 2 tabs.}
place = {Sweden}
year = {1993}
month = {Dec}
}
title = {A method for ion temperature measurements at the Extrap-T1 reversed field pinch}
author = {Hoerling, P, Rachlew-Kaellne, E, Zastrow, K D, and Brzozowski, J H}
abstractNote = {Doppler broadening measurements on C{sup 4+}, C{sup 2+}, O{sup 4+}, O{sup 3+} and O{sup 2+} spectral lines in the quartz-UV region are performed on the Extrap-T1 reversed field pinch using a 1-m Czerny-Turner spectrometer and a gated, intensified 1024 pixel OMA. This paper describes the equipment, and the numerical methods used to extract the ion temperature from spectral lines via spectral lineshape fitting. Extensive simulations have been made in order to estimate the error introduced in T{sub i} due to the lineshape fitting process and photon statistics. A lowest measurable limit of line broadenings has also been estimated. 13 refs, 7 figs, 2 tabs.}
place = {Sweden}
year = {1993}
month = {Dec}
}