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Surface analysis of Borkron glass for neutron optics applications

Abstract

Grazing Angle Neutron Reflectometry, Optical and Mechanical Roughness Profilometry techniques have been used to study the effects of the polishing operations on the surface of Borkron Schott glass (special borosilicate glass for neutron optics applications) as the polishing tool pressure P and the mean grain size of the polishing powder {Phi}. The neutron reflectivity investigations have shown that there is formation of a layer at the surface glass substrate. This layer is less dense than the bulk substrate and its thickness is around 60A. The optical and mechanical profilometry measurements have shown that both roughness and waviness decrease with P and {Phi}. All the experimental results show a good correlation between the neutron refractive index, the thickness and the roughness of the surface layer and the waviness of the glass surface with the two mechanical polishing parameters. The previous techniques have been completed by Secondary Ion Mass Spectroscopy and Atomic Force Microscopy measurements.
Authors:
Farnoux, B; Maaza, M; [1]  Maaza, M; Samuel, F; [2]  Sella, C; [3]  Trocellier, P [4] 
  1. Laboratoire Leon Brillouin, Centre d`Etudes de Saclay, 91 - Gif-sur-Yvette (FR)
  2. Compagnie Industrielle des Lasers, 91 -Marcoussis (FR)
  3. Centre National de la Recherche Scientifique, 92 -Meudon (FR). Lab. de Physique des Materiaux
  4. Laboratoire d`Analyse par Activation Pierre Sue, Centre d`Etudes Nucleaires de Saclay, 91 -Gif-sur-Yvette (FR)
Publication Date:
Dec 31, 1991
Product Type:
Conference
Report Number:
CEA-CONF-10770; CONF-9106241-
Reference Number:
SCA: 360602; PA: FRD-92:001372; SN: 92000757264
Resource Relation:
Conference: 2. international conference on surface x-ray and neutron scattering,Bad Honnef (Germany),25-28 Jun 1991; Other Information: PBD: 1991
Subject:
36 MATERIALS SCIENCE; BOROSILICATE GLASS; MECHANICAL POLISHING; ROUGHNESS; NEUTRON BEAMS; OPTICAL SYSTEMS; NEUTRON REFLECTORS; REFRACTIVITY; SURFACES; 360602; STRUCTURE AND PHASE STUDIES
OSTI ID:
10149556
Research Organizations:
Laboratoire Leon Brillouin (LLB) - Centre d`Etudes Nucleaires de Saclay, 91 - Gif-sur-Yvette (France)
Country of Origin:
France
Language:
English
Other Identifying Numbers:
Other: ON: DE92526968; TRN: FR9201372
Availability:
OSTI; NTIS (US Sales Only); INIS
Submitting Site:
FRN
Size:
9 p.
Announcement Date:
Jul 08, 1992

Citation Formats

Farnoux, B, Maaza, M, Maaza, M, Samuel, F, Sella, C, and Trocellier, P. Surface analysis of Borkron glass for neutron optics applications. France: N. p., 1991. Web.
Farnoux, B, Maaza, M, Maaza, M, Samuel, F, Sella, C, & Trocellier, P. Surface analysis of Borkron glass for neutron optics applications. France.
Farnoux, B, Maaza, M, Maaza, M, Samuel, F, Sella, C, and Trocellier, P. 1991. "Surface analysis of Borkron glass for neutron optics applications." France.
@misc{etde_10149556,
title = {Surface analysis of Borkron glass for neutron optics applications}
author = {Farnoux, B, Maaza, M, Maaza, M, Samuel, F, Sella, C, and Trocellier, P}
abstractNote = {Grazing Angle Neutron Reflectometry, Optical and Mechanical Roughness Profilometry techniques have been used to study the effects of the polishing operations on the surface of Borkron Schott glass (special borosilicate glass for neutron optics applications) as the polishing tool pressure P and the mean grain size of the polishing powder {Phi}. The neutron reflectivity investigations have shown that there is formation of a layer at the surface glass substrate. This layer is less dense than the bulk substrate and its thickness is around 60A. The optical and mechanical profilometry measurements have shown that both roughness and waviness decrease with P and {Phi}. All the experimental results show a good correlation between the neutron refractive index, the thickness and the roughness of the surface layer and the waviness of the glass surface with the two mechanical polishing parameters. The previous techniques have been completed by Secondary Ion Mass Spectroscopy and Atomic Force Microscopy measurements.}
place = {France}
year = {1991}
month = {Dec}
}