Abstract
As a radiation protection measure in tritium-handling facilities, ionization chambers are commonly used as area monitors to measure low-level tritium (elemental or tritiated water vapor) in air. With the recent increase in research and development activities in tritium-processing systems for fusion facilities, this traditional role of the ionization chamber is changing. Process ionization chambers are currently being developed to measure from very low to pure tritium in various tritium processing systems, where the carrier gas of tritium is either hydrogen isotopes or noble gases. Ionization chambers are widely selected for process applications, because they are simple to construct, easy to operate and maintain and, most importantly, the provide real-time data. A tacit assumption in the choice of ionization chambers for monitoring tritium in process gas streams is that the carrier gas effects are due mainly to the differences in the ionization efficiencies of tritium beta particles in different gases. However, in noble carrier gases such as helium, neon and argon, the ionization efficiency has been found to be extremely sensitive to the presence of impurities in trace quantities in the carrier gas [1, 2]. Therefore, impurities may have a significant effect on the ionization chamber measurement of tritium in process
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Rodrigo, L;
Yin, D
[1]
- Atomic Energy of Canada Ltd., Chalk River, ON (Canada). Chalk River Nuclear Labs.
Citation Formats
Rodrigo, L, and Yin, D.
Effect of impurities on the measurement of tritium with ionization chambers.
Canada: N. p.,
1993.
Web.
Rodrigo, L, & Yin, D.
Effect of impurities on the measurement of tritium with ionization chambers.
Canada.
Rodrigo, L, and Yin, D.
1993.
"Effect of impurities on the measurement of tritium with ionization chambers."
Canada.
@misc{etde_10138459,
title = {Effect of impurities on the measurement of tritium with ionization chambers}
author = {Rodrigo, L, and Yin, D}
abstractNote = {As a radiation protection measure in tritium-handling facilities, ionization chambers are commonly used as area monitors to measure low-level tritium (elemental or tritiated water vapor) in air. With the recent increase in research and development activities in tritium-processing systems for fusion facilities, this traditional role of the ionization chamber is changing. Process ionization chambers are currently being developed to measure from very low to pure tritium in various tritium processing systems, where the carrier gas of tritium is either hydrogen isotopes or noble gases. Ionization chambers are widely selected for process applications, because they are simple to construct, easy to operate and maintain and, most importantly, the provide real-time data. A tacit assumption in the choice of ionization chambers for monitoring tritium in process gas streams is that the carrier gas effects are due mainly to the differences in the ionization efficiencies of tritium beta particles in different gases. However, in noble carrier gases such as helium, neon and argon, the ionization efficiency has been found to be extremely sensitive to the presence of impurities in trace quantities in the carrier gas [1, 2]. Therefore, impurities may have a significant effect on the ionization chamber measurement of tritium in process gases if gases other than the main carrier are present even at trace levels. Impurity effects on the ionization chamber measurement of tritium have not been addressed to any significant extent, and the importance of this effect has been recognized only recently [3]. This report hopes to fill this void and presents the results from an experimental program that was carried out to determine the effect of trace impurities on the ionization chamber measurement of tritium in helium and argon.}
place = {Canada}
year = {1993}
month = {May}
}
title = {Effect of impurities on the measurement of tritium with ionization chambers}
author = {Rodrigo, L, and Yin, D}
abstractNote = {As a radiation protection measure in tritium-handling facilities, ionization chambers are commonly used as area monitors to measure low-level tritium (elemental or tritiated water vapor) in air. With the recent increase in research and development activities in tritium-processing systems for fusion facilities, this traditional role of the ionization chamber is changing. Process ionization chambers are currently being developed to measure from very low to pure tritium in various tritium processing systems, where the carrier gas of tritium is either hydrogen isotopes or noble gases. Ionization chambers are widely selected for process applications, because they are simple to construct, easy to operate and maintain and, most importantly, the provide real-time data. A tacit assumption in the choice of ionization chambers for monitoring tritium in process gas streams is that the carrier gas effects are due mainly to the differences in the ionization efficiencies of tritium beta particles in different gases. However, in noble carrier gases such as helium, neon and argon, the ionization efficiency has been found to be extremely sensitive to the presence of impurities in trace quantities in the carrier gas [1, 2]. Therefore, impurities may have a significant effect on the ionization chamber measurement of tritium in process gases if gases other than the main carrier are present even at trace levels. Impurity effects on the ionization chamber measurement of tritium have not been addressed to any significant extent, and the importance of this effect has been recognized only recently [3]. This report hopes to fill this void and presents the results from an experimental program that was carried out to determine the effect of trace impurities on the ionization chamber measurement of tritium in helium and argon.}
place = {Canada}
year = {1993}
month = {May}
}