Abstract
When swift heavy ions penetrate through the matter, they release their energy by interaction with the target electron gas (electronic stopping power). The released energy reaches values as high than several ten keV per nanometer of path, so there is production of a high density of electronic excitations and ionizations. We shall present a general description of the track morphologies deduced from Moessbauer spectroscopy, channeling Rutherford backscattering experiment, high resolution electron microscopy and atomic force microscopy. The efficiency of the damage production has been also determined by macroscopic measurements such as electrical conductivity. Phenomenological models, developed to interpret the damage efficiency, will be discussed. (author). 15 figs., 2 figs.
Citation Formats
Bouffard, S, and Toulemonde, M.
Damage induced by the electronic stopping power of swift heavy ions in insulators.
France: N. p.,
1992.
Web.
Bouffard, S, & Toulemonde, M.
Damage induced by the electronic stopping power of swift heavy ions in insulators.
France.
Bouffard, S, and Toulemonde, M.
1992.
"Damage induced by the electronic stopping power of swift heavy ions in insulators."
France.
@misc{etde_10127354,
title = {Damage induced by the electronic stopping power of swift heavy ions in insulators}
author = {Bouffard, S, and Toulemonde, M}
abstractNote = {When swift heavy ions penetrate through the matter, they release their energy by interaction with the target electron gas (electronic stopping power). The released energy reaches values as high than several ten keV per nanometer of path, so there is production of a high density of electronic excitations and ionizations. We shall present a general description of the track morphologies deduced from Moessbauer spectroscopy, channeling Rutherford backscattering experiment, high resolution electron microscopy and atomic force microscopy. The efficiency of the damage production has been also determined by macroscopic measurements such as electrical conductivity. Phenomenological models, developed to interpret the damage efficiency, will be discussed. (author). 15 figs., 2 figs.}
place = {France}
year = {1992}
month = {Dec}
}
title = {Damage induced by the electronic stopping power of swift heavy ions in insulators}
author = {Bouffard, S, and Toulemonde, M}
abstractNote = {When swift heavy ions penetrate through the matter, they release their energy by interaction with the target electron gas (electronic stopping power). The released energy reaches values as high than several ten keV per nanometer of path, so there is production of a high density of electronic excitations and ionizations. We shall present a general description of the track morphologies deduced from Moessbauer spectroscopy, channeling Rutherford backscattering experiment, high resolution electron microscopy and atomic force microscopy. The efficiency of the damage production has been also determined by macroscopic measurements such as electrical conductivity. Phenomenological models, developed to interpret the damage efficiency, will be discussed. (author). 15 figs., 2 figs.}
place = {France}
year = {1992}
month = {Dec}
}