Abstract
A spectroscopic technique for IR ellipsometry has been developed. The method is based on Mueller analysis of the optical system and the systematic application of correction routines for experimentally measured Fourier coefficients. The extinction ratio of the polarizers is not crucial for the measurements. Optical properties of micro-twinned [100] and [001] oriented YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films have been studied. The two samples has a thickness of 33 nm and both were deposited on SrTiO{sub 3} substrates. The components of the out-of-plane and in-plane permittivity have been calculated through inversion and effective-medium theories for anisotropic grains. 16 refs., 5 figs.
Citation Formats
Wold, E, Bremer, J, and Hunderi, O.
Spectroscopic IR ellipsometry of [100] and [0001] oriented YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films.
Norway: N. p.,
1993.
Web.
Wold, E, Bremer, J, & Hunderi, O.
Spectroscopic IR ellipsometry of [100] and [0001] oriented YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films.
Norway.
Wold, E, Bremer, J, and Hunderi, O.
1993.
"Spectroscopic IR ellipsometry of [100] and [0001] oriented YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films."
Norway.
@misc{etde_10126913,
title = {Spectroscopic IR ellipsometry of [100] and [0001] oriented YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films}
author = {Wold, E, Bremer, J, and Hunderi, O}
abstractNote = {A spectroscopic technique for IR ellipsometry has been developed. The method is based on Mueller analysis of the optical system and the systematic application of correction routines for experimentally measured Fourier coefficients. The extinction ratio of the polarizers is not crucial for the measurements. Optical properties of micro-twinned [100] and [001] oriented YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films have been studied. The two samples has a thickness of 33 nm and both were deposited on SrTiO{sub 3} substrates. The components of the out-of-plane and in-plane permittivity have been calculated through inversion and effective-medium theories for anisotropic grains. 16 refs., 5 figs.}
place = {Norway}
year = {1993}
month = {Dec}
}
title = {Spectroscopic IR ellipsometry of [100] and [0001] oriented YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films}
author = {Wold, E, Bremer, J, and Hunderi, O}
abstractNote = {A spectroscopic technique for IR ellipsometry has been developed. The method is based on Mueller analysis of the optical system and the systematic application of correction routines for experimentally measured Fourier coefficients. The extinction ratio of the polarizers is not crucial for the measurements. Optical properties of micro-twinned [100] and [001] oriented YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films have been studied. The two samples has a thickness of 33 nm and both were deposited on SrTiO{sub 3} substrates. The components of the out-of-plane and in-plane permittivity have been calculated through inversion and effective-medium theories for anisotropic grains. 16 refs., 5 figs.}
place = {Norway}
year = {1993}
month = {Dec}
}