Abstract
The thermal desorption technique has been used to study the effects of the presence of deuterium atoms on the retention of implanted helium in polycrystalline nickel. For samples pre-implanted with 40 keV helium to a dose of 1 x 10{sup 21} ions/m{sup 2} the ratio of trapped deuterium atoms to the implanted helium was found to be about 0.4 D/He and an effective trapping energy {approx} 0.5 eV. For samples pre-implanted with 10 keV He to doses from 1.5 x 10{sup 21} to 4 x 10{sup 21} ions/m{sup 2}, low temperature helium release stages were observed, and resulted in a decrease of deuterium trapping efficiency to as low as 0.0075 D/He. Deuterium charging was found to enhance the helium release and decrease the release temperature.
Abramov, E;
Shi, S Q;
Thompson, D A;
[1]
Smeltzer, W W
[2]
- McMaster Univ., Hamilton, ON (Canada). Dept. of Engineering Physics
- McMaster Univ., Hamilton, ON (Canada)
Citation Formats
Abramov, E, Shi, S Q, Thompson, D A, and Smeltzer, W W.
Synergistic effects between helium and deuterium on gas detrapping in polycrystalline nickel.
Canada: N. p.,
1990.
Web.
Abramov, E, Shi, S Q, Thompson, D A, & Smeltzer, W W.
Synergistic effects between helium and deuterium on gas detrapping in polycrystalline nickel.
Canada.
Abramov, E, Shi, S Q, Thompson, D A, and Smeltzer, W W.
1990.
"Synergistic effects between helium and deuterium on gas detrapping in polycrystalline nickel."
Canada.
@misc{etde_10124942,
title = {Synergistic effects between helium and deuterium on gas detrapping in polycrystalline nickel}
author = {Abramov, E, Shi, S Q, Thompson, D A, and Smeltzer, W W}
abstractNote = {The thermal desorption technique has been used to study the effects of the presence of deuterium atoms on the retention of implanted helium in polycrystalline nickel. For samples pre-implanted with 40 keV helium to a dose of 1 x 10{sup 21} ions/m{sup 2} the ratio of trapped deuterium atoms to the implanted helium was found to be about 0.4 D/He and an effective trapping energy {approx} 0.5 eV. For samples pre-implanted with 10 keV He to doses from 1.5 x 10{sup 21} to 4 x 10{sup 21} ions/m{sup 2}, low temperature helium release stages were observed, and resulted in a decrease of deuterium trapping efficiency to as low as 0.0075 D/He. Deuterium charging was found to enhance the helium release and decrease the release temperature.}
place = {Canada}
year = {1990}
month = {Sep}
}
title = {Synergistic effects between helium and deuterium on gas detrapping in polycrystalline nickel}
author = {Abramov, E, Shi, S Q, Thompson, D A, and Smeltzer, W W}
abstractNote = {The thermal desorption technique has been used to study the effects of the presence of deuterium atoms on the retention of implanted helium in polycrystalline nickel. For samples pre-implanted with 40 keV helium to a dose of 1 x 10{sup 21} ions/m{sup 2} the ratio of trapped deuterium atoms to the implanted helium was found to be about 0.4 D/He and an effective trapping energy {approx} 0.5 eV. For samples pre-implanted with 10 keV He to doses from 1.5 x 10{sup 21} to 4 x 10{sup 21} ions/m{sup 2}, low temperature helium release stages were observed, and resulted in a decrease of deuterium trapping efficiency to as low as 0.0075 D/He. Deuterium charging was found to enhance the helium release and decrease the release temperature.}
place = {Canada}
year = {1990}
month = {Sep}
}