Abstract
This study is about the use of secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS) as analytical techniques with depth resolution in determining organic components in environmental solid microparticles. The first application of plasma SNMS to organic compounds revealed the spectra to be composed mainly of signals from the atoms of all participating elements, such as C, H, O, N, S, P, and Cl. In addition, signals produced by multi-atomic clusters can be detected, such as CH, C{sub 2}, CH{sub 2}, C{sub 2}H, and C{sub 3}, as well as signals indicating the presence of organic compounds with hetero elements, such as OH, NH, and CN. Their intensity decreases very markedly with increasing numbers of atoms. Among the signals from bi-atomic clusters, those coming from elements with large mass differences are most intense. The use of plasma SNMS with organic compounds has shown that, except for spurious chemical reactions induced by ion bombardment and photodesorption by the photons of the plasma, it is possible to analyze with resolution in depth, elements of organic solids. A more detailed molecular characterization of organic compounds is possible by means of SIMS on the basis of multi-atomic fragments and by comparison with
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Citation Formats
Ewinger, H P.
Analysis of organic compounds by secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS); Analyse organischer Verbindungen mit Sekundaer-Neutralteilchen-Massen-Spektrometrie (SNMS) und Sekundaer-Ionen-Massen-Spektrometrie (SIMS).
Germany: N. p.,
1993.
Web.
Ewinger, H P.
Analysis of organic compounds by secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS); Analyse organischer Verbindungen mit Sekundaer-Neutralteilchen-Massen-Spektrometrie (SNMS) und Sekundaer-Ionen-Massen-Spektrometrie (SIMS).
Germany.
Ewinger, H P.
1993.
"Analysis of organic compounds by secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS); Analyse organischer Verbindungen mit Sekundaer-Neutralteilchen-Massen-Spektrometrie (SNMS) und Sekundaer-Ionen-Massen-Spektrometrie (SIMS)."
Germany.
@misc{etde_10121742,
title = {Analysis of organic compounds by secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS); Analyse organischer Verbindungen mit Sekundaer-Neutralteilchen-Massen-Spektrometrie (SNMS) und Sekundaer-Ionen-Massen-Spektrometrie (SIMS)}
author = {Ewinger, H P}
abstractNote = {This study is about the use of secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS) as analytical techniques with depth resolution in determining organic components in environmental solid microparticles. The first application of plasma SNMS to organic compounds revealed the spectra to be composed mainly of signals from the atoms of all participating elements, such as C, H, O, N, S, P, and Cl. In addition, signals produced by multi-atomic clusters can be detected, such as CH, C{sub 2}, CH{sub 2}, C{sub 2}H, and C{sub 3}, as well as signals indicating the presence of organic compounds with hetero elements, such as OH, NH, and CN. Their intensity decreases very markedly with increasing numbers of atoms. Among the signals from bi-atomic clusters, those coming from elements with large mass differences are most intense. The use of plasma SNMS with organic compounds has shown that, except for spurious chemical reactions induced by ion bombardment and photodesorption by the photons of the plasma, it is possible to analyze with resolution in depth, elements of organic solids. A more detailed molecular characterization of organic compounds is possible by means of SIMS on the basis of multi-atomic fragments and by comparison with suitable signal patterns. (orig./BBR) [Deutsch] Sekundaer-Neutralteilchen-Massen-Spektrometrie (SNMS) und Sekundaer-Ionen-Massen-Spektrometrie (SIMS) als tiefenaufloesende analytische Methoden wurden fuer die Bestimmung organischer Bestandteile in festen Mikropartikeln aus der Umwelt untersucht. Die erstmalige Anwendung von Plasma-SNMS auf organische Verbindungen ergab, dass die Spektren ueberwiegend aus Signalen der Atome aller beteiligten Elemente wie C, H, O, N, S, P und Cl zusammengesetzt sind. Daneben findet man Signale mehratomiger Cluster wie CH, C{sub 2}, CH{sub 2}, C{sub 2}H und C{sub 3} sowie fuer organische Verbindungen mit Heteroelementen zusaetzlich Signale wie OH, NH und CN. Deren Intensitaet nimmt mit steigender Anzahl von Atomen sehr stark ab. Unter den Signalen biatomarer Cluster sind diejenigen aus Elementen mit grosser Massendifferenz am intensivsten. Die Anwendung von Plasma-SNMS auf organische Verbindungen zeigte, dass mit Ausnahme stoerender ionenbeschussinduzierter chemischer Reaktionen und Photodesorption durch die Photonen des Plasmas, Elemente organischer Feststoffe tiefenaufgeloest analysiert werden koennen. Eine weitergehende molekulare Charakterisierung organischer Verbindungen kann mit SIMS an Hand mehratomiger Fragmente und durch Vergleich geeigneter Signalmuster erfolgen. (orig./BBR)}
place = {Germany}
year = {1993}
month = {May}
}
title = {Analysis of organic compounds by secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS); Analyse organischer Verbindungen mit Sekundaer-Neutralteilchen-Massen-Spektrometrie (SNMS) und Sekundaer-Ionen-Massen-Spektrometrie (SIMS)}
author = {Ewinger, H P}
abstractNote = {This study is about the use of secondary neutral mass spectrometry (SNMS) and secondary ion mass spectrometry (SIMS) as analytical techniques with depth resolution in determining organic components in environmental solid microparticles. The first application of plasma SNMS to organic compounds revealed the spectra to be composed mainly of signals from the atoms of all participating elements, such as C, H, O, N, S, P, and Cl. In addition, signals produced by multi-atomic clusters can be detected, such as CH, C{sub 2}, CH{sub 2}, C{sub 2}H, and C{sub 3}, as well as signals indicating the presence of organic compounds with hetero elements, such as OH, NH, and CN. Their intensity decreases very markedly with increasing numbers of atoms. Among the signals from bi-atomic clusters, those coming from elements with large mass differences are most intense. The use of plasma SNMS with organic compounds has shown that, except for spurious chemical reactions induced by ion bombardment and photodesorption by the photons of the plasma, it is possible to analyze with resolution in depth, elements of organic solids. A more detailed molecular characterization of organic compounds is possible by means of SIMS on the basis of multi-atomic fragments and by comparison with suitable signal patterns. (orig./BBR) [Deutsch] Sekundaer-Neutralteilchen-Massen-Spektrometrie (SNMS) und Sekundaer-Ionen-Massen-Spektrometrie (SIMS) als tiefenaufloesende analytische Methoden wurden fuer die Bestimmung organischer Bestandteile in festen Mikropartikeln aus der Umwelt untersucht. Die erstmalige Anwendung von Plasma-SNMS auf organische Verbindungen ergab, dass die Spektren ueberwiegend aus Signalen der Atome aller beteiligten Elemente wie C, H, O, N, S, P und Cl zusammengesetzt sind. Daneben findet man Signale mehratomiger Cluster wie CH, C{sub 2}, CH{sub 2}, C{sub 2}H und C{sub 3} sowie fuer organische Verbindungen mit Heteroelementen zusaetzlich Signale wie OH, NH und CN. Deren Intensitaet nimmt mit steigender Anzahl von Atomen sehr stark ab. Unter den Signalen biatomarer Cluster sind diejenigen aus Elementen mit grosser Massendifferenz am intensivsten. Die Anwendung von Plasma-SNMS auf organische Verbindungen zeigte, dass mit Ausnahme stoerender ionenbeschussinduzierter chemischer Reaktionen und Photodesorption durch die Photonen des Plasmas, Elemente organischer Feststoffe tiefenaufgeloest analysiert werden koennen. Eine weitergehende molekulare Charakterisierung organischer Verbindungen kann mit SIMS an Hand mehratomiger Fragmente und durch Vergleich geeigneter Signalmuster erfolgen. (orig./BBR)}
place = {Germany}
year = {1993}
month = {May}
}