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Limitation and suppression of hot electron fluctuations in submicron semiconductor structures

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Abstract

We present theoretical investigations of fluctuations of hot electrons in submicron active regions, where the dimensions 2 d of the region is comparable to the electron energy relaxation length L{sub {epsilon}}. The new physical phenomenon is reported; the fluctuations depend on the sample thickness, with 2d
Authors:
Kochelap, V A; Zahleniuk, N A; [1]  Sokolov, V N [2] 
  1. International Centre for Theoretical Physics, Trieste (Italy)
  2. Academy of Sciences of Ukraine, Kiev (Ukraine). Inst. of Semiconductors
Publication Date:
Sep 01, 1992
Product Type:
Technical Report
Report Number:
IC-92/283
Reference Number:
SCA: 665200; PA: AIX-24:009550; SN: 93000933934
Resource Relation:
Other Information: PBD: Sep 1992
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ELECTRON GAS; FLUCTUATIONS; SEMICONDUCTOR MATERIALS; BOLTZMANN EQUATION; RELAXATION LOSSES; THEORETICAL DATA; 665200; SOLID-STATE PLASMA
OSTI ID:
10120042
Research Organizations:
International Centre for Theoretical Physics (ICTP), Trieste (Italy)
Country of Origin:
IAEA
Language:
English
Other Identifying Numbers:
Other: ON: DE93613911; TRN: XA9233081009550
Availability:
OSTI; NTIS (US Sales Only); INIS
Submitting Site:
INIS
Size:
[33] p.
Announcement Date:
Jun 30, 2005

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Citation Formats

Kochelap, V A, Zahleniuk, N A, and Sokolov, V N. Limitation and suppression of hot electron fluctuations in submicron semiconductor structures. IAEA: N. p., 1992. Web.
Kochelap, V A, Zahleniuk, N A, & Sokolov, V N. Limitation and suppression of hot electron fluctuations in submicron semiconductor structures. IAEA.
Kochelap, V A, Zahleniuk, N A, and Sokolov, V N. 1992. "Limitation and suppression of hot electron fluctuations in submicron semiconductor structures." IAEA.
@misc{etde_10120042,
title = {Limitation and suppression of hot electron fluctuations in submicron semiconductor structures}
 author = {Kochelap, V A, Zahleniuk, N A, and Sokolov, V N}
 abstractNote = {We present theoretical investigations of fluctuations of hot electrons in submicron active regions, where the dimensions 2 d of the region is comparable to the electron energy relaxation length L{sub {epsilon}}. The new physical phenomenon is reported; the fluctuations depend on the sample thickness, with 2d
 place = {IAEA}
 year = {1992}
 month = {Sep}
 }